Resonant virtual supply booster for synchronous logic circuits and other circuits with use of on-chip integrated magnetic inductor

• US 10,270,443 B2
• Filed: 02/15/2018
• Issued: 04/23/2019
• Est. Priority Date: 05/17/2017
• Status: Active Grant

• Current Assignee: International Business Machines Corporation
• Original Assignee: International Business Machines Corporation
• Inventors: Doris, Bruce B., Joshi, Rajiv V., Wang, Naigang
• Primary Examiner(s): Kim, Seokjin
• Application Number:
  US15/897,924
• Publication Number:
  US 20180337678A1
• Time in Patent Office: 432 Days
• CPC Class Codes: H01L 21/823821 with a particular manufacturing method of transistors with a horizontal current flow in a vertical sidewall of a semiconductor body, e.g. FinFET, MuGFET
• CPC Class Codes: H01L 23/5286 Arrangements of power or ground buses
• CPC Class Codes: H01L 27/0924 including transistors with a horizontal current flow in a vertical sidewall of a semiconductor body, e.g. FinFET, MuGFET
• CPC Class Codes: H01L 28/10 Inductors
• CPC Class Codes: H01L 28/40 Capacitors
• CPC Class Codes: H03K 19/0013 in field effect transistor circuits
• CPC Class Codes: H03K 19/017509 Interface arrangements

Abstract

Circuits and methods are provided. The circuits and methods are for providing a supply voltage to a dynamic internal power supply node of a group of other circuits. A circuit includes a first transistor and a second transistor, of different channel types, coupled in parallel to a static power supply that supplies a constant power supply voltage. The circuit further includes a magnetic inductor having a first terminal connected to a common node between the first transistor and the second transistor and a second terminal connected to the dynamic internal power supply node, to supply the dynamic internal power supply node with a boosted voltage having a magnitude greater than a magnitude of the constant power supply voltage by resonating with at least one capacitance coupled to the dynamic internal power supply node.

Claims

1. A circuit for providing a supply voltage to a dynamic internal power supply node of a group of other circuits, comprising:

a first transistor and a second transistor, of different channel types from among N and P channel types, coupled in parallel, each having non-gate terminal connected to a static power supply that supplies a constant power supply voltage and another non-gate terminal connected to a common node between the first transistor and the second transistor, wherein a gate of the first transistor and two gates of the second transistor are connected to a boost clock; and

a magnetic inductor having a first terminal connected to the common node between the first transistor and the second transistor and a second terminal connected to the dynamic internal power supply node, to supply the dynamic internal power supply node with a boosted voltage having a magnitude greater than a magnitude of the constant power supply voltage by resonating with at least one capacitance coupled to the dynamic internal power supply node responsive to a phase of the boost block.

2. The circuit of claim 1, further comprising a capacitor, different from the at least one capacitance, connected in parallel to the magnetic inductor such that a first terminal of the capacitor is connected to the common node between the first transistor and the second transistor and a second terminal of the capacitor is connected to the dynamic internal power supply node.

3. The circuit of claim 1, wherein the first transistor is disabled in response to a first phase of a boost clock that is synchronized with a functional clock of the group of other circuits that controls an evaluation for dynamic logic circuits and state changes for static logic circuits in the group of other circuits.

4. The circuit of claim 3, wherein the magnetic inductor resonates with the at least one capacitance to supply the dynamic internal power supply node with the boosted voltage, responsive to the first transistor being disabled during a second phase of the boost clock.

5. The circuit of claim 4, wherein the second phase of the boost clock is provided at a timing corresponding to an evaluation time for the dynamic logic circuits and the state changes for the static logic circuits to provide the boost voltage during the evaluation time and the state changes.

6. The circuit of claim 1, wherein the second transistor has two gate terminals coupled to a boost clock, a source terminal as the terminal connected to the dynamic internal power supply node, and a drain terminal as the terminal connected to the static power supply.

7. The circuit of claim 6, wherein the first transistor has a gate terminal coupled to the two gate terminals of the second transistor, a source terminal connected to the source terminal of the second transistor, and a drain terminal connected the drain terminal of the second transistor.

8. The circuit of claim 1, wherein the second transistor has two gate terminals connected to a gate terminal of the first transistor, whereby the second transistor is enabled by a first phase of a boost clock and has a source terminal connected to a source terminal of the first transistor.

9. The circuit of claim 1, wherein the group of other circuits are connected between the dynamic internal power supply node and a return node, and wherein the at least one capacitance includes a shunt capacitance resulting from the group of other circuits.

10. The circuit of claim 1, wherein the other circuits are selected from the group consisting of logic circuits, memory circuits, and circuits having both logic and memory elements.

11. The circuit of claim 1, wherein the second transistor is a Fin Field Effect Transistor device.

12. The circuit of claim 1, wherein the first transistor is a P-type transistor and the second transistor is an N-type Fin Field Effect Transistor device.

13. A method for forming an integrated circuit providing a supply voltage to a dynamic internal power supply node of a group of other circuits, comprising:

forming a first transistor and a second transistor, of different channel types from among N and P channel types, coupled in parallel, each having non-gate terminal connected to a static power supply that supplies a constant power supply voltage and another non-gate terminal connected to a common node between the first transistor and the second transistor, wherein a gate of the first transistor and two gates of the second transistor are connected to a boost clock; and

forming a magnetic inductor having a first terminal connected to the common node between the first transistor and the second transistor and a second terminal connected to the dynamic internal power supply node, to supply the dynamic internal power supply node with a boosted voltage having a magnitude greater than a magnitude of the constant power supply voltage by resonating with at least one capacitance coupled to the dynamic internal power supply node responsive to a phase of the boost block.

14. The method of claim 13, further comprising connecting a capacitor, different from the at least one capacitance, in parallel to the magnetic inductor such that a first terminal of the capacitor is connected to the common node between the first transistor and the second transistor and a second terminal of the capacitor is connected to the dynamic internal power supply node.

15. The method of claim 13, further comprising disabling the first transistor in response to a first phase of a boost clock that is synchronized with a functional clock of the group of other circuits, wherein the functional clock controls an evaluation for dynamic logic circuits and state changes for static logic circuits in the group of other circuits.

16. The method of claim 15, wherein the magnetic inductor is formed to resonate with the at least one capacitance to supply the dynamic internal power supply node with the boosted voltage, responsive to the first transistor being disabled during a second phase of the boost clock.

17. The method of claim 16, further comprising providing the second phase of the boost clock at a timing corresponding to an evaluation time for the dynamic logic circuits and the state changes for the static logic circuits to provide the boost voltage during the evaluation time and the state changes.

18. The method of claim 13, further comprising connecting two gate terminals of the second transistor to a gate terminal of the first transistor, whereby the second transistor is enabled by a first phase of a boost clock and has a source terminal connected to a source terminal of the first transistor.

19. The method of claim 13, further comprising connecting the group of other circuits between the dynamic internal power supply node and a return node, and wherein the at least one capacitance includes a shunt capacitance resulting from the group of other circuits.

20. The method of claim 13, wherein the first transistor is formed as a P-type transistor and the second transistor is formed as an N-type Fin Field Effect Transistor device.