Light emitting diode failure detection system for a vehicle with pre-trip inspection

• US 10,271,411 B2
• Filed: 02/25/2017
• Issued: 04/23/2019
• Est. Priority Date: 09/16/2015
• Status: Active Grant

• Current Assignee: Truck-Lite Company LLC (Truck-Lite Holdings 2 Corp.)
• Original Assignee: Truck-Lite Company LLC (Truck-Lite Holdings 2 Corp.)
• Inventors: Troutman, Scott
• Primary Examiner(s): Shah, Neel D
• Application Number:
  US15/442,642
• Publication Number:
  US 20170171952A1
• Time in Patent Office: 787 Days
• CPC Class Codes: B60Q 11/005 for lighting devices, e.g. indicating if lamps are burning or not
• CPC Class Codes: H04B 7/24 for communication between two or more posts wireless communication networks H04W
• CPC Class Codes: H05B 45/56 involving measures to prevent abnormal temperature of the LEDs
• CPC Class Codes: H05B 47/25 Circuit arrangements for protecting against overcurrent

Abstract

A light failure detection system with pre-trip inspection for use in a vehicle having a plurality of light emitting diode lighting devices includes a plurality of voltage level monitoring circuits and plurality of current monitoring circuits for measuring the voltage and current draw of a plurality of lighting circuits. The system includes a pre-trip inspection mode for sequentially activating a plurality of lighting circuits and allowing inspection of the plurality of light emitting diode lighting devices.

Claims

1. A light failure detection system with pre-trip inspection for use in a vehicle having a plurality of light emitting diode lighting devices, said light failure detection system comprising:

a circuit board;

a plurality of lighting circuits, each lighting circuit being coupled to the circuit board by an input wire;

a plurality of voltage level monitoring circuits on said circuit board, each one of said plurality of voltage level monitoring circuits connected to one of said lighting circuits and adapted to measure the voltage of the one of said light circuits;

a plurality of current monitoring circuits on said circuit board, each one of said plurality of current monitoring circuits connected to one of said lighting circuits and adapted to measure a current draw of the one of said light circuits;

a voltage drop circuit for enabling the plurality of voltage level monitoring circuits and the plurality of current monitoring circuits to measure current and voltage at an adjusted input voltage;

a temperature sensor for sensing a temperature;

a switch for placing the light failure detection system into a learn mode wherein said lighting circuits are monitored with the plurality of voltage level monitoring circuits and the plurality of current monitoring circuits to determine threshold voltage and current levels for the lighting circuits, the switch also adapted to activate a pre-trip inspection mode wherein said lighting circuits are sequentially activated to allow a user to inspect corresponding lighting units;

a microcontroller coupled to the circuit board for storing the threshold voltage and current levels and the temperature sensed by the temperature sensor, said microcontroller being adapted to calculate an adjusted threshold current based on a voltage sensitivity and the sensed temperature; and

a fault indicator for indicating a status of the light failure detection system is a measured current is above or below the adjusted threshold current by a predetermined value.

2. The light failure detection system with pre-trip inspection of claim 1, further comprising a transceiver coupled to the circuit board for sending information to a master control unit.

3. The light failure detection system with pre-trip inspection of claim 2, further comprising a mechanical enclosure for housing the circuit board, learn mode switch, and fault indicator.

4. The light failure detection system with pre-trip inspection of claim 3, wherein the mechanical enclosure is filled with potting compound.

5. The light failure detection system with pre-trip inspection of claim 1, further including a plurality of wire outputs fed from the plurality of lighting circuits.

6. The light failure detection system with pre-trip inspection of claim 1, further including a voltage regulator for converting an input supply voltage to supply levels required by the light failure detection system.

7. A method of detecting a failure of a light emitting diode lighting device in a vehicle having a failure detection system, said method comprising:

activating a pre-trip inspection mode;

sequentially activating a plurality of lighting circuits to allow a user to inspect corresponding lighting units;

activating a learn mode;

measuring a current (C_ref) and a voltage (V_ref) of a plurality of lighting circuits at an input voltage;

measuring a system temperature (T_ref);

deactivating said learn mode;

measuring at least one light drive input current (C_now) and voltage (V_now) in a normal mode;

measuring the system temperature in a normal mode;

calculating an adjusted threshold current value based on a voltage sensitivity and system temperature;

determining if the measured light drive input current is below or above the adjusted threshold current value by a predetermined value; and

displaying an indication of light failure if the measured current is below or above the adjusted threshold current value by said predetermined value.

8. The method of detecting a failure of a light emitting diode lighting device of claim 7, said method further comprising wirelessly transmitting information from the failure detection system to a master control unit.

9. The method of detecting a failure of a light emitting diode lighting device in a vehicle having a failure detection system of claim 8, further comprising:

measuring a reduced input current (C_low) and voltage (V_low) of the plurality of lighting circuits at a reduced input voltage.

10. The method of detecting a failure of a light emitting diode lighting device in a vehicle having a failure detection system of claim 9, wherein the voltage sensitivity is measured using the formula:

Sensitivity=(C_ref−

C_low)/(V_ref−

V_low).

11. The method of detecting a failure of a light emitting diode lighting device in a vehicle having a failure detection system of claim 10, wherein the step of calculating an adjusted threshold current value includes determining a voltage adjusted threshold using the formula:

V-adjusted threshold=C_ref+((V_now−

V_ref)*Sensitivity).

12. The method of detecting a failure of a light emitting diode lighting device in a vehicle having a failure detection system of claim 9, wherein the step of calculating an adjusted threshold current value further includes adjusting the voltage adjusted threshold using the formula:

T-adjusted threshold=V-adjusted threshold*(1+(T_const*(T_now−

T_ref))); and

wherein T_const is 0.002.

13. The method of detecting a failure of a light emitting diode lighting device in a vehicle having a failure detection system of claim 12, further comprising:

detecting if any of the lighting circuits share current by measuring the current of single active circuit configurations and then measuring the current for each two-circuit configuration, wherein a shared circuit is detected if the current for a two-circuit configuration is less than the single circuit current by at least 15 mA for both circuits.

14. The method of detecting a failure of a light emitting diode lighting device in a vehicle having a failure detection system of claim 13, wherein the step of determining if the measured light drive input current is below or above the adjusted threshold current value by a predetermined current delta value includes determining if C_now is less than (T-adjusted threshold−

lower limit) or if C_now is greater than (T-adjusted threshold+upper limit).

15. The method of detecting a failure of a light emitting diode lighting device in a vehicle having a failure detection system of claim 14, wherein if the lighting circuit is determined to be a single circuit, the upper and lower limit are a predetermined allowed current delta of the lighting circuit, and if the lighting circuit is determined to be a shared circuit, the lower limit is determined by calculating a sum of the active currents (C_now) and the sum of the adjusted C_ref currents for the shared circuits, comparing the C_now and the C_ref, and setting the lower limit to a largest allowed predetermined current delta among the active circuits and setting the upper limit to a predetermined value if the allowed predetermined current deltas among the active circuits are different and set to the allowed predetermined current delta among the active circuits if the allowed predetermined current deltas among the active circuits are the same.

16. A method of detecting a failure of a light emitting diode lighting device in a vehicle having a failure detection system, said method comprising:

activating a pre-trip inspection mode by sequentially activating a plurality of lighting circuits to allow a user to inspect corresponding lighting units, said lighting circuits coupled to a circuit board by one or more input wires;

activating a switch to thereby place said light failure detection system into a learn mode;

measuring a current (C_ref) via a one or more current monitoring circuits and a voltage (V_ref) via one or more voltage monitoring circuits of the plurality of lighting circuits at an input voltage;

measuring a system temperature (T_ref) via a temperature sensor;

deactivating said learn mode by use of the;

measuring at least one light drive input current (C_now) and voltage (V_now) in a normal mode;

measuring the system temperature in a normal mode;

a microcontroller calculating an adjusted threshold current value based on a voltage sensitivity and system temperature, wherein said microcontroller stores threshold voltage and current levels and the temperature sensed by the temperature sensor;

determining if the measured light drive input current is below or above the adjusted threshold current value by a predetermined value; and

displaying an indication of light failure if the measured current is below or above the adjusted threshold current value by said predetermined value.

17. The method of detecting a light emitting diode lighting device of claim 16, said method further comprising a transceiver wirelessly transmitting information from the failure detection system to a master control unit.

18. The method of detecting a failure of a light emitting diode lighting device in a vehicle having a failure detection system of claim 17, further comprising:

measuring a reduced input current (C_low) and voltage (V_low) of the plurality of lighting circuits at a reduced input voltage, wherein the current monitoring circuit measures C low and the voltage monitoring circuit measures V low.

19. The method of detecting a failure of a light emitting diode lighting device in a vehicle having a failure detection system of claim 18, wherein the voltage sensitivity is measured by the microcontroller using the formula:

Sensitivity=(C_ref−

C_low)/(V_ref−

V_low).

20. The method of detecting a failure of a light emitting diode lighting device in a vehicle having a failure detection system of claim 19, wherein the microcontroller performs the step of calculating an adjusted threshold current value and includes determining a voltage adjusted threshold using the formula:

V-adjusted threshold=C_ref+((V_now−

V_ref)*Sensitivity).

21. The method of detecting a failure of a light emitting diode lighting device in a vehicle having a failure detection system of claim 18, wherein the microcontroller performs the step of calculating an adjusted threshold current value and further includes adjusting the voltage adjusted threshold using the formula:

T-adjusted threshold=V-adjusted threshold*(1+(T_const*(T_now−

T_ref))); and

wherein T_const is 0.002.

22. The method of detecting a failure of a light emitting diode lighting device in a vehicle having a failure detection system of claim 21, further comprising:

detecting if any of the lighting circuits share current by measuring the current of single active circuit configurations and then measuring the current for each two-circuit configuration, wherein a shared circuit is detected if the current for a two-circuit configuration is less than the single circuit current by at least 15 mA for both circuits.

23. The method of detecting a failure of a light emitting diode lighting device in a vehicle having a failure detection system of claim 22, wherein the microcontroller further performs the step of determining if the measured light drive input current is below or above the adjusted threshold current value by a predetermined current delta value includes determining if C_now is less than (T-adjusted threshold−

lower limit) or if C_now is greater than (T-adjusted threshold+upper limit).

24. The method of detecting a failure of a light emitting diode lighting device in a vehicle having a failure detection system of claim 23, wherein if the lighting circuit is determined to be a single circuit, the upper and lower limit are a predetermined allowed current delta of the lighting circuit, and if the lighting circuit is determined to be a shared circuit, the lower limit is determined by calculating a sum of the active currents (C_now) and the sum of the adjusted C_ref currents for the shared circuits, comparing the C_now and the C_ref, and setting the lower limit to a largest allowed predetermined current delta among the active circuits and setting the upper limit to a predetermined value if the allowed predetermined current deltas among the active circuits are different and set to the allowed predetermined current delta among the active circuits if the allowed predetermined current deltas among the active circuits are the same.

25. The method of detecting a failure of a light emitting diode lighting device in a vehicle having a failure detection system of claim 23, wherein if the lighting circuit is determined to be a single circuit, the upper and lower limit are a predetermined allowed current delta of the lighting circuit, and if the lighting circuit is determined to be a shared circuit, the lower limit is determined by calculating a sum of the active currents (C_now) and the sum of the adjusted C_ref currents for the shared circuits, comparing the C_now and the C_ref, and setting the lower limit to a largest allowed predetermined current delta among the active circuits and setting the upper limit to a predetermined value if the allowed predetermined current deltas among the active circuits are different and set to the allowed predetermined current delta among the active circuits if the allowed predetermined current deltas among the active circuits are the same.