Zero-heat-flux, deep tissue temperature measurement system

• US 10,274,383 B2
• Filed: 04/28/2016
• Issued: 04/30/2019
• Est. Priority Date: 05/10/2011
• Status: Active Grant

• Current Assignee: Solventum Intellectual Properties Company (Solventum Corp.)
• Original Assignee: 3M Innovative Properties Company (3M Company)
• Inventors: Bieberich, Mark T., Dion, Philip G., Hansen, Gary L., Palchak, David R., Prachar, Timothy J., Staab, Ryan J., Van Duren, Albert P., White, Elecia, Ziaimehr, Allen H.
• Primary Examiner(s): Towa, Rene T
• Application Number:
  US15/140,694
• Publication Number:
  US 20160238463A1
• Time in Patent Office: 1,097 Days
• CPC Class Codes: G01K 1/165 for application in zero heat flux sensors
• CPC Class Codes: G01K 13/20 Clinical contact thermometers for use with humans or animals
• CPC Class Codes: G01K 15/005 Calibration
• CPC Class Codes: G01K 7/22 the element being a non-linear resistance, e.g. thermistor G01K7/26 takes precedence

Abstract

A zero-heat-flux, deep tissue temperature measurement system measures internal body temperature by way of a probe having a heater and thermal sensors arranged in a zero-heat-flux construction. The measurement system includes control mechanization that determines heater and skin temperatures based upon data obtained from the probe and uses those temperatures to calculate a deep tissue temperature. The measurement system includes a signal interface cable having a connector where a probe can be releasably connected to the system. The cable and attached connector are a removable and replaceable part of the system, separate from the probe. The measurement system provides an output signal imitating a standard input signal configuration used by other equipment.

Claims

1. A temperature measurement system for measuring temperature, comprising:

a probe comprising;

a first substrate and a second substrate, the first and second substrates sandwiching a first thermally insulating material,

a first thermal sensor disposed on the first substrate, and

a second thermal sensor disposed on the second substrate;

an information switch,

a control unit configured to;

receive first voltage signal from the first thermal sensor and a second voltage signal from the second thermal sensor;

determine a first magnitude of resistance from the first voltage signal and a second magnitude of resistance from the second voltage signal;

determine, using calibration information from a programmable memory device, a first temperature parameter from the first magnitude of resistance and a second temperature parameter from the second magnitude of resistance;

determine a deep tissue temperature value based on a relationship between the first temperature parameter and the second temperature parameter;

converting the deep tissue temperature value to a resistance signal that would be produced by a thermistor in response to the same temperature; and

providing the resistance signal through an output jack; and

wherein the control unit includes probe control logic, and wherein the information switch has a first state in which the information switch is operative to connect thermal sensor signals from the probe signal interface cable to the probe control logic and a second state in which the information switch is operative to connect programmable memory device information from the probe signal interface cable to the probe control logic.

2. The temperature measurement system of claim 1, wherein the programmable memory device stores calibration information of the first and second thermal sensors.

3. The temperature measurement system of claim 1, wherein the first state of the information switch blocks the transfer of programmable memory device signals from being transferred through the probe signal interface cable and the second state of the information switch enables the transfer of programmable memory device signals through the probe signal interface cable.

4. The temperature measurement system of claim 1, further comprising a layer of a second thermally insulating material attached to one side of the first substrate layer.

5. The temperature measurement system of claim 1, further comprising

a heater switch;

wherein the control unit is configured to;

control the heater switch to bring the probe into a zero-heat flux condition; and

wherein the probe comprises a heater.

6. The temperature measurement system of claim 5, further comprising:

a probe signal interface cable configured to be electrically connected to the probe and the control unit; and

wherein the heater switch is operative to switch a pulse-width-modulated drive signal through the probe signal interface cable to the heater.

7. The temperature measurement system of claim 5, wherein the control unit comprises probe control logic that calculates and reports the first temperature parameter based on analog-to-digital readings of the resistance of the first thermal sensor and the second thermal sensor.

8. The temperature measurement system of claim 6, wherein the probe control logic uses proportional-integral-derivative control to enable the heater to reach and maintain the zero-heat flux condition while in steady state.

9. The temperature measurement system of claim 1, wherein the output jack conforms to a common signal interface for electronic medical equipment.

10. The temperature measurement system of claim 1, wherein the control unit imitates the resistance of a YSI-400 thermistor.

11. A temperature measurement system, comprising:

a measurement probe, a first thermal sensor operative to sense a first temperature, a second thermal sensor operative to sense a second temperature, and a connector;

a processing unit comprising;

a controller,

a thermistor emulator,

an emulator output jack, and

an information switch,

a probe signal interface cable configured to be electrically connected to the measurement probe and the processing unit;

a programmable memory device;

wherein the thermistor emulator operative to provide an emulator output signal at the emulator output jack; and

wherein the information switch has a first state in which the information switch is operative to connect thermal sensor signals from the probe signal interface cable to the controller and a second state in which the information switch is operative to connect programmable memory device information from the probe signal interface cable to the controller and to connect information from the controller to the programmable memory device.

12. The temperature measurement system of claim 11, wherein the programmable memory device stores calibration information of the first and second thermal sensors.

13. The temperature measurement system of claim 11, in which the first state of the information switch blocks the transfer of programmable memory device signals from being transferred through the probe signal interface cable and the second state of the information switch enables the transfer of programmable memory device signals through the signal interface cable.

14. The temperature measurement system of claim 11, further comprising:

an emulation output cable connected to the emulator output jack.

15. The temperature measurement system of claim 11, wherein the thermistor emulator emulates a YSI-400 thermistor.