Object analyzing method and object analyzing system
First Claim
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1. An object analyzing method, applied to an object analyzing system, comprising:
- (a) applying at least one analyzing parameter extracting process according to an object type for a target object, to extract at least one analyzing parameter for the target object;
(b) selecting at least one analyzing model according to the object type;
(c) applying the analyzing model selected in the step (b), to analyze the analyzing parameter and accordingly generate an analyzing result;
(d) generating inside state information for the target object according to the analyzing result in a detect-inside mode; and
(e) drawing an inside image of the target object according to the analyzing result in a see-through mode.
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Abstract
An object analyzing method applied to an object analyzing system. The object analyzing method comprises: (a) applying at least one analyzing parameter extracting process according to an object type for an target object, to extract at least one analyzing parameter for the target object; (b) selecting least one analyzing model according to the object type; and (c) applying the analyzing model selected in the step (b), to analyze the analyzing parameter and accordingly generate an analyzing result.
5 Citations
16 Claims
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1. An object analyzing method, applied to an object analyzing system, comprising:
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(a) applying at least one analyzing parameter extracting process according to an object type for a target object, to extract at least one analyzing parameter for the target object; (b) selecting at least one analyzing model according to the object type; (c) applying the analyzing model selected in the step (b), to analyze the analyzing parameter and accordingly generate an analyzing result; (d) generating inside state information for the target object according to the analyzing result in a detect-inside mode; and (e) drawing an inside image of the target object according to the analyzing result in a see-through mode. - View Dependent Claims (2, 3, 4, 5, 6, 7, 8)
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9. An object analyzing system, comprising:
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an analyzing circuit, configured to perform following steps; (a) apply at least one analyzing parameter extracting process according to an object type for a target object, to extract at least one analyzing parameter for the target object; (b) select at least one analyzing model according to the object type; and (c) apply the analyzing model selected in the step (b), to analyze the analyzing parameter and accordingly generate an analyzing result; wherein the object analyzing system further comprises an image generating module and a state information generating module, wherein the image generating module generates inside state information for the target object according to the analyzing result in a detect-inside mode, wherein the state information generating module draws an inside image of the target object according to the analyzing result in a see-through mode. - View Dependent Claims (10, 11, 12, 13, 14, 15, 16)
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Specification