Surface-enhanced raman scattering unit and raman spectroscopic analysis method

• US 10,281,404 B2
• Filed: 03/22/2018
• Issued: 05/07/2019
• Est. Priority Date: 03/29/2013
• Status: Active Grant

• Current Assignee: Hamamatsu Photonics KK
• Original Assignee: Hamamatsu Photonics KK
• Inventors: Ito, Masashi, Shibayama, Katsumi, Ofuji, Kazuto, Oyama, Hiroki, Maruyama, Yoshihiro
• Primary Examiner(s): Stafira, Michael P
• Application Number:
  US15/928,886
• Publication Number:
  US 20180224377A1
• Time in Patent Office: 411 Days
• CPC Class Codes: G01N 21/658 enhancement Raman, e.g. surface plasmons

Abstract

A SERS unit 1A comprises a SERS element 2 having a substrate and an optical function part 20 formed on the substrate, the optical function part 20 for generating surface-enhanced Raman scattering; a measurement board 3 supporting the SERS element 2 upon measurement; and a holding part 4 mechanically holding the SERS element 2 in the measurement board 3.

Claims

1. A surface-enhanced Raman scattering unit comprising:

a surface-enhanced Raman scattering element having a substrate and an optical function part formed on the substrate, the optical function part for generating surface-enhanced Raman scattering;

a measurement board supporting the surface-enhanced Raman scattering element upon measurement; and

a holding part mechanically holding the surface-enhanced Raman scattering element in the measurement board,

wherein the holding part is in contact with the surface-enhanced Raman scattering element, and

wherein the holding part does not overlap with at least part of the optical function part when viewed from the thickness direction of the substrate.

2. A surface-enhanced Raman scattering unit according to claim 1, wherein the holding part has a pinching part pinching the surface-enhanced Raman scattering element in cooperation with the measurement board.

3. A surface-enhanced Raman scattering unit according to claim 2, wherein a plurality of such pinching parts are arranged around the optical function part.

4. A surface-enhanced Raman scattering unit according to claim 1, wherein the measurement board is provided with a depression containing at least a part of the surface-enhanced Raman scattering element on the substrate side and restraining the surface-enhanced Raman scattering element from moving in a direction perpendicular to a thickness direction of the substrate.

5. A surface-enhanced Raman scattering unit according to claim 1, wherein the holding part is formed separately from the measurement board and mechanically secured to the measurement board.

6. A surface-enhanced Raman scattering unit according to claim 1, wherein the holding part is formed integrally with the measurement board.

7. A surface-enhanced Raman scattering unit according to claim 1, wherein the measurement board is formed integrally from a resin.

8. A surface-enhanced Raman scattering unit according to claim 7, wherein the measurement board is provided with a hollowed part so as to form a wall part extending in a direction perpendicular to a thickness direction of the measurement board.

9. A surface-enhanced Raman scattering unit according to claim 1, wherein the holding part pinches a side face of the surface-enhanced Raman scattering element.

10. A Raman spectroscopic analysis method comprising:

a first step of preparing the surface-enhanced Raman scattering unit according to claim 1 and arranging a sample on the optical function part; and

a second step, after the first step, of setting the surface-enhanced Raman scattering unit to a Raman spectroscopic analyzer, irradiating the sample arranged on the optical function part with excitation light, and detecting Raman-scattered light derived from the sample, so as to perform Raman spectroscopic analysis.