Apparatus and method for generating chemical signatures using differential desorption
First Claim
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1. A method of analyzing a sample, the method comprising the steps:
- contacting a sorbent coated screen with a sample, where the sorbent coated mesh is of sufficient size to permit multiple exposure of the sorbent coated mesh to a plurality of different temperature gasses from a desorption ionization source;
directing a carrier gas with a first temperature from the desorption ionization source at a first target area on the sorbent coated mesh to generate a plurality of first sample ions;
directing the carrier gas with a second temperature from the desorption ionization source at a second target area on the sorbent coated mesh to generate a plurality of second sample ions, where the second target area is not exposed to the carrier gas with the first temperature;
directing one or both the plurality of first sample ions and the plurality of second sample ions into an analysis instrument; and
analyzing one or both the plurality of first sample ions and the plurality of second sample ions, thereby analyzing the sample.
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Abstract
The present invention is directed to a method and device to generate a chemical signature for a mixture of analytes. The present invention involves using a SPME surface to one or both absorb and adsorb the mixture of analytes. In an embodiment of the invention, the surface is then exposed to different temperature ionizing species chosen with appropriate spatial resolution to desorb a chemical signature for the mixture of analytes.
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Citations
20 Claims
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1. A method of analyzing a sample, the method comprising the steps:
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contacting a sorbent coated screen with a sample, where the sorbent coated mesh is of sufficient size to permit multiple exposure of the sorbent coated mesh to a plurality of different temperature gasses from a desorption ionization source; directing a carrier gas with a first temperature from the desorption ionization source at a first target area on the sorbent coated mesh to generate a plurality of first sample ions; directing the carrier gas with a second temperature from the desorption ionization source at a second target area on the sorbent coated mesh to generate a plurality of second sample ions, where the second target area is not exposed to the carrier gas with the first temperature; directing one or both the plurality of first sample ions and the plurality of second sample ions into an analysis instrument; and analyzing one or both the plurality of first sample ions and the plurality of second sample ions, thereby analyzing the sample. - View Dependent Claims (2, 3, 4, 5, 6, 7, 8, 9)
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10. A method of analyzing a sample, the method comprising the steps:
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contacting a sorbent coated fiber with a sample, where the sorbent coated fiber is of sufficient size to permit multiple exposure of the sorbent coated fiber to a plurality of different temperature gasses from a desorption ionization source; directing a carrier gas with a first temperature from the desorption ionization source at a first target area on the sorbent coated fiber to generate a plurality of first sample ions; directing the carrier gas with a second temperature from the desorption ionization source at a second target area on the sorbent coated fiber to generate a plurality of second sample ions, where the second temperature is substantially constant; directing one or both the plurality of first sample ions and the plurality of second sample ions into an analysis instrument; and analyzing one or both the plurality of first sample ions and the plurality of second sample ions, thereby analyzing the sample. - View Dependent Claims (11, 12, 13, 14, 15, 16, 17)
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18. A method of analyzing a sample, the method comprising the steps:
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contacting a sorbent coated filament with a sample, where the sorbent coated filament is of sufficient size to permit multiple exposure of the sorbent coated filament to a plurality of different temperature gasses from a desorption ionization source; directing a carrier gas with a first temperature from the desorption ionization source at a first target area on the sorbent coated filament to generate a plurality of first sample ions; directing the carrier gas with a second temperature from the desorption ionization source at a second target area on the sorbent coated filament to generate a plurality of second sample ions, where the second target area is not exposed to the carrier gas with the first temperature; directing one or both the plurality of first sample ions and the plurality of second sample ions into an analysis instrument; and analyzing one or both the plurality of first sample ions and the plurality of second sample ions, thereby analyzing the sample. - View Dependent Claims (19, 20)
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Specification