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Systems and methods for testing electronic devices using master-slave test architectures

  • US 10,284,456 B2
  • Filed: 11/10/2016
  • Issued: 05/07/2019
  • Est. Priority Date: 11/10/2016
  • Status: Active Grant
First Claim
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1. A method comprising:

  • gathering first identifiers of a first plurality of devices under test coupled to a master test system;

    gathering second identifiers of a second plurality of devices under test coupled to a first slave test system coupled to the master test system;

    identifying shared test protocols, the shared test protocols providing a basis to test compliance of one or more shared functional parameters shared by the first plurality of devices under test and the second plurality of devices under test;

    identifying first resource test protocols, the first resource test protocols providing a basis to test compliance of one or more resource parameters of the first plurality of devices under test;

    identifying second resource test protocols, the second resource test protocols providing a basis to test compliance of one or more resource parameters of the second plurality of devices under test;

    configuring a group of shared probes at the master test system to implement the shared test protocols on the first plurality of devices under test and the second plurality of devices under test;

    configuring a first group of resource probes at the master test system to implement the first resource test protocols on the first plurality of devices under test; and

    providing to the first slave test system instructions to configure a second group of resource probes at the first slave test system to implement the second resource test protocols on the second plurality of devices under test.

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