Systems and methods for testing electronic devices using master-slave test architectures
First Claim
1. A method comprising:
- gathering first identifiers of a first plurality of devices under test coupled to a master test system;
gathering second identifiers of a second plurality of devices under test coupled to a first slave test system coupled to the master test system;
identifying shared test protocols, the shared test protocols providing a basis to test compliance of one or more shared functional parameters shared by the first plurality of devices under test and the second plurality of devices under test;
identifying first resource test protocols, the first resource test protocols providing a basis to test compliance of one or more resource parameters of the first plurality of devices under test;
identifying second resource test protocols, the second resource test protocols providing a basis to test compliance of one or more resource parameters of the second plurality of devices under test;
configuring a group of shared probes at the master test system to implement the shared test protocols on the first plurality of devices under test and the second plurality of devices under test;
configuring a first group of resource probes at the master test system to implement the first resource test protocols on the first plurality of devices under test; and
providing to the first slave test system instructions to configure a second group of resource probes at the first slave test system to implement the second resource test protocols on the second plurality of devices under test.
1 Assignment
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Accused Products
Abstract
A master test system may comprise cable modem termination systems, resource servers, provisioning/Session Initiation Protocol (SIP) servers, call management system (CMS) servers, Data over Cable Service Interface Specification/Wide Area Network (DOCSIS/WAN) servers, test controller servers, etc. Servers on the master test system may facilitate tests of devices under test (DUTs) coupled to the master test system. Servers on the master test system and/or slave test systems may facilitate tests of DUTs coupled to slave test systems that are coupled to the master test system. The slave test system(s) may comprise resource servers and test controller servers. In various implementations, the servers on the slave test system(s) may facilitate tests of DUTs coupled to the slave test system(s).
103 Citations
18 Claims
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1. A method comprising:
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gathering first identifiers of a first plurality of devices under test coupled to a master test system; gathering second identifiers of a second plurality of devices under test coupled to a first slave test system coupled to the master test system; identifying shared test protocols, the shared test protocols providing a basis to test compliance of one or more shared functional parameters shared by the first plurality of devices under test and the second plurality of devices under test; identifying first resource test protocols, the first resource test protocols providing a basis to test compliance of one or more resource parameters of the first plurality of devices under test; identifying second resource test protocols, the second resource test protocols providing a basis to test compliance of one or more resource parameters of the second plurality of devices under test; configuring a group of shared probes at the master test system to implement the shared test protocols on the first plurality of devices under test and the second plurality of devices under test; configuring a first group of resource probes at the master test system to implement the first resource test protocols on the first plurality of devices under test; and providing to the first slave test system instructions to configure a second group of resource probes at the first slave test system to implement the second resource test protocols on the second plurality of devices under test. - View Dependent Claims (2, 3, 4, 5, 6, 7, 8, 9, 10)
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11. A system comprising:
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a master test management server configured to;
gather first identifiers of a first plurality of devices under test coupled to a master test system, and to gather second identifiers of a second plurality of devices under test coupled to a first slave test system coupled to the master test system;a shared test protocol server configured to identify shared test protocols, the shared test protocols providing a basis to test compliance of one or more shared functional parameters shared by the first plurality of devices under test and the second plurality of devices under test; a resource identification server configured to identify first resource test protocols, the first resource test protocols providing a basis to test compliance of one or more resource parameters of the first plurality of devices under test, and to identify second resource test protocols, the second resource test protocols providing a basis to test compliance of one or more resource parameters of the second plurality of devices under test; a master probe container configured to configure a group of shared probes at the master test system to implement the shared test protocols on the first plurality of devices under test and the second plurality of devices under test, and to configure a first group of resource probes at the master test system to implement the first resource test protocols on the first plurality of devices under test; and
a slave test system control server configured to provide to the first slave test system instructions a second group of resource probes at the first slave test system to implement the second resource test protocols on the second plurality of devices under test. - View Dependent Claims (12, 13, 14, 15, 16, 17, 18)
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Specification