Electromigration wearout detection circuits
First Claim
1. An electromigration wearout detection circuit comprising:
- an integrated circuit having a detection element subject to normal operation current embedded intrinsically in a hot circuit portion of the integrated circuit, and a reference element not subject to normal operation current, switchable via a switching device and a detection enabling signal; and
an electromigration wearout detection monitoring circuit configured to perform;
measuring, periodically, a resistance of the detection element;
calculating a resistance change of the detection element over a predetermined time period;
comparing the resistance change of the detection element calculated to a predetermined safety threshold; and
taking one or more mitigation actions when the resistance change of the detection element exceeds the predetermined safety threshold.
1 Assignment
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Accused Products
Abstract
Embodiments include methods, and systems of an integrated circuit having electromigration wearout detection circuits. Integrated circuit may include a detection element and a reference element. Detection element is subject to normal operation current. Reference element is not subject to normal operation current. A resistance of detection element is monitored to detect electromigration wearout. The electromigration wearout detection monitoring circuit may be configured to perform: periodically measuring resistance of detection element, calculating resistance change of detection element over a predetermined time period, comparing resistance change of detection element calculated to a predetermined safety threshold, and take mitigation actions when resistance change of detection element exceeds predetermined safety threshold. The mitigation actions may include switching to a redundant circuit of the integrated circuit, shutting down the integrated circuit, and sending a signal to initiate a service call. The predetermined safety threshold may be 1% of resistance change of the detection element.
12 Citations
20 Claims
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1. An electromigration wearout detection circuit comprising:
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an integrated circuit having a detection element subject to normal operation current embedded intrinsically in a hot circuit portion of the integrated circuit, and a reference element not subject to normal operation current, switchable via a switching device and a detection enabling signal; and an electromigration wearout detection monitoring circuit configured to perform; measuring, periodically, a resistance of the detection element; calculating a resistance change of the detection element over a predetermined time period; comparing the resistance change of the detection element calculated to a predetermined safety threshold; and taking one or more mitigation actions when the resistance change of the detection element exceeds the predetermined safety threshold. - View Dependent Claims (2, 3, 4, 5, 6, 7, 8, 9, 10)
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11. A method of electromigration wearout detection comprising:
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embedding a detection element intrinsically in a hot circuit portion of an integrated circuit, and a reference element, wherein the detection element is subject to normal operation current, and the reference element is not subject to normal operation current, switchable via a switching device and a detection enabling signal; measuring, periodically, a resistance of the detection element using an electromigration wearout detection monitoring circuit; calculating a resistance change of the detection element over a predetermined time period; comparing the resistance change of the detection element calculated to a predetermined safety threshold; and taking one or more mitigation actions when the resistance change of the detection element exceeds the predetermined safety threshold. - View Dependent Claims (12, 13, 14, 15)
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16. A method of electromigration wearout detection comprising:
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embedding a detection element extrinsically in close proximity of a hot circuit portion of an integrated circuit, and a reference element, wherein the detection element is subject to normal operation current, and the reference element is not subject to normal operation current, switchable via a switching device and a detection enabling signal; measuring, periodically, a resistance of the detection element using an electromigration wearout detection monitoring circuit; calculating a resistance change of the detection element over a predetermined time period; comparing the resistance change of the detection element calculated to a predetermined safety threshold; and taking one or more mitigation actions when the resistance change of the detection element exceeds the predetermined safety threshold. - View Dependent Claims (17, 18, 19, 20)
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Specification