Voltage based thermal control of processing device

• US 10,310,572 B2
• Filed: 06/10/2016
• Issued: 06/04/2019
• Est. Priority Date: 06/10/2016
• Status: Active Grant

• Current Assignee: Microsoft Technology Licensing LLC (Microsoft Corporation)
• Original Assignee: Microsoft Technology Licensing LLC (Microsoft Corporation)
• Inventors: Hovis, William Paul, Blankenburg, Garrett Douglas, Atkinson, Peter Anthony, Ray, Robert James, Hernandez Mojica, Andres Felipe, Boshra-Riad, Samy, Wee, Erng-Sing, Langendorf, Brian Keith
• Primary Examiner(s): Abbaszadeh, Jaweed A
• Assistant Examiner(s): Sampath, Gayathri
• Application Number:
  US15/178,912
• Publication Number:
  US 20170357298A1
• Time in Patent Office: 1,089 Days
• CPC Class Codes: G01R 31/3004 Current or voltage test
• CPC Class Codes: G06F 1/206 comprising thermal management
• CPC Class Codes: G06F 1/3206 Monitoring of events, devices or parameters that trigger a change in power modality
• CPC Class Codes: G06F 1/324 by lowering clock frequency
• CPC Class Codes: G06F 1/3296 by lowering the supply or operating voltage
• CPC Class Codes: Y02D 10/00 Energy efficient computing, e.g. low power processors, power management or thermal management

Abstract

Thermal reduction and voltage adjustment techniques for computing systems and processing devices are presented herein. In a first example, a method of operating a voltage control system for a processing device includes operating the processing device in a computing assembly at a selected performance level, the processing device supplied with at least one input voltage at a first voltage level. The method includes monitoring thermal information associated with the computing assembly, and when the thermal information indicates a temperature associated with the computing assembly exceeds a threshold temperature, adjusting the at least one input voltage level supplied to the processing device to a second voltage level lower than the first voltage level and continuing to operate the processing device at the selected performance level.

Claims

1. A method of operating a voltage control system for a processing device, the method comprising:

performing a voltage adjustment process comprising applying incrementally adjusted input voltages to the processing device, operating the processing device according to a functional test comprising an application or script executed in at least an operating system booted on the processing device that exercises power consumption above a threshold level for the processing device for at least a selected voltage domain along with elements of the computing assembly external to the processing device that share at least the selected voltage domain, and monitoring for operational failures of at least the processing device during application of each of the incrementally adjusted input voltages to determine at least one minimum operating voltage lower than a minimum voltage level specified by a manufacturer of the processing device;

operating the processing device in a computing assembly at a selected performance level, the processing device supplied with at least one input voltage at a first voltage level;

monitoring thermal information associated with the computing assembly;

when the thermal information indicates a temperature associated with the computing assembly exceeds a threshold temperature, adjusting the at least one input voltage level supplied to the processing device to the at least one minimum operating voltage and continuing to operate the processing device at the selected performance level.

2. The method of claim 1, wherein the first voltage level comprises a manufacturer specified operating voltage for the processing device.

3. The method of claim 2, wherein the voltage below the manufacturer specified operating voltage is determined using the voltage adjustment process that identifies the at least one minimum operating voltage for the processing device while operating at the selected performance level in the computing assembly.

4. The method of claim 1, wherein the computing assembly includes one or more of an enclosure, thermal management elements, memory elements, data storage elements, and power electronics elements that accompany the processing device.

5. The method of claim 1, wherein the selected performance level comprises a selected operating frequency for logical portions of the processing device associated with the at least one input voltage level.

6. The method of claim 1, further comprising:

when the thermal information indicates the temperature associated with the computing assembly exceeds a second threshold temperature, adjusting thermal management elements of the computing assembly to reduce the temperature and continuing to operate the processing device at the selected performance level.

7. The method of claim 1, further comprising:

when the thermal information indicates the temperature associated with the computing assembly exceeds the threshold temperature and the at least one input voltage level has been reduced to a predetermined minimum operating voltage for the processor device, reducing performance of the processing device to a lower performance level than the selected performance level.

8. An apparatus comprising:

one or more non-transitory computer readable storage media;

program instructions stored on the one or more non-transitory computer readable storage media that, when executed by a computing system, direct the computing system to at least;

perform a voltage adjustment process comprising applying incrementally adjusted input voltages to a processing device, operating the processing device according to a functional test comprising an application or script executed in at least an operating system booted on the processing device that exercises power consumption above a threshold level for the processing device for at least a selected voltage domain along with elements of the computing assembly external to the processing device that share at least the selected voltage domain, and monitoring for operational failures of at least the processing device during application of each of the incrementally adjusted input voltages to determine at least one minimum operating voltage lower than a minimum voltage level specified by a manufacturer of the processing device;

operate the processor device of the computing system at a selected performance level, the processor device supplied with at least one input voltage at a first voltage level;

monitor thermal information associated with the computing system;

when the thermal information indicates a temperature associated with the computing system exceeds a threshold temperature, adjust the at least one input voltage level supplied to the processor device to the at least one minimum operating voltage while continuing to operate the processor device at the selected performance level.

9. The apparatus of claim 8, wherein the first voltage level comprises a manufacturer specified operating voltage for the processor device.

10. The apparatus of claim 9, wherein the voltage below the manufacturer specified operating voltage is determined using the voltage adjustment process that identifies the at least one minimum operating voltage for the processor device while operating at the selected performance level in the computing system.

11. The apparatus of claim 8, wherein the computing system includes one or more of an enclosure, thermal management elements, memory elements, data storage elements, and power electronics elements that accompany the processor device.

12. The apparatus of claim 8, wherein the selected performance level comprises a selected operating frequency for logical portions of the processor device associated with the at least one input voltage level.

13. The apparatus of claim 8, comprising further program instructions, when executed by the computing system, direct the computing system to at least:

when the thermal information indicates the temperature associated with the computing system exceeds a second threshold temperature, adjust thermal management elements of the computing system to reduce the temperature while continuing to operate the processor device at the selected performance level.

14. The apparatus of claim 8, comprising further program instructions, when executed by the computing system, direct the computing system to at least:

reduce performance of the processor device to a lower performance level than the selected performance level when the thermal information indicates the temperature associated with the computing system exceeds the threshold temperature and the at least one input voltage level has been reduced to a predetermined minimum operating voltage for the processor device.

15. A thermal control system for a computing assembly, comprising:

a voltage control module configured to perform a voltage adjustment process comprising applying incrementally adjusted input voltages to a processing device, operating the processing device according to a functional test comprising an application or script executed in at least an operating system booted on the processing device that exercises power consumption above a threshold level for the processing device for at least a selected voltage domain along with elements of the computing assembly external to the processing device that share at least the selected voltage domain, and monitoring for operational failures of at least the processing device during application of each of the incrementally adjusted input voltages to determine at least one minimum operating voltage lower than a minimum voltage level specified by a manufacturer of the processing device;

the voltage control module configured to instruct a voltage regulation system of the computing assembly to provide at least one input voltage at a first voltage level to a processor device of the computing assembly while the processor device operates at a first performance level;

a thermal monitoring module configured to monitor at least temperature information associated with the computing assembly;

based at least on the temperature information indicating a temperature associated with the computing assembly exceeds a threshold temperature, the voltage control module configured to adjust the at least one input voltage level supplied to the processor device to the at least one minimum operating voltage while the processor device continues to operate at the first performance level.

16. The system of claim 15, wherein the first performance level comprises a selected operating frequency for logical portions of the processor device associated with the at least one input voltage level.

17. The system of claim 15, comprising:

when the temperature information indicates the temperature associated with the computing assembly exceeds a second threshold temperature, the voltage control module is configured to adjust thermal management elements of the computing assembly to increase an airflow in an enclosure of the computing assembly while the processor device continues to operate at the first performance level.

18. The system of claim 15, comprising:

the voltage control module configured to identify when the temperature information indicates the temperature associated with the computing assembly exceeds the threshold temperature and the at least one input voltage level has been reduced to a predetermined minimum operating voltage for the processor device below the manufacturer specified operating voltage, and responsively instruct the processor device to reduce performance of the processor device to a lower performance level than the first performance level.