Current sensor, system and method
First Claim
Patent Images
1. A system, comprising:
- a conductor;
a lock-in-amplifier (LIA) configured to generate a test currenta first force contact coupled to the conductor at a first position;
a second force contact coupled to the conductor at a second position, the first position and the second position being arranged at a first distance with respect to each other;
a pair of force terminals coupled to the first force contact and the second force contact, the pair of force terminals configured to inject the test current from the LIA into the conductor across the first distance;
a first sense contact coupled to the conductor at a third position;
a second sense contact coupled to the conductor at a fourth position, the third position and the fourth position being arranged at a second distance with respect to each another and located within the first distance;
a device, comprising;
a microelectronic package;
a memory configured to store a predefined reference resistance associated with the conductor;
a pair of sense terminals coupled to the first sense contact and the second sense contact configured to provide an input signal related to a voltage drop across the conductor between the first sense contact and the second sense contact, wherein the pair of sense terminals is at least partly accessible from outside the microelectronic package; and
at least one processor configured to determine a primary current through the conductor based on the input signal and the predefined reference resistance; and
a first wiring coupling a first one of the pair of sense terminals with the first sense contact, wherein the first wiring includes a first connector to the LIA; and
a second wiring coupling a second one of the pair of sense terminals with the second sense contact, wherein the second wiring comprises a second connector to the LIA, andwherein the LIA is configured to receive the input signal from the pair of sense terminals via the first wiring and the second wiring.
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Accused Products
Abstract
Current sensors, systems and methods are provided. A test current is injected via a pair of force terminals into a conductor and a pair of sense terminals are configured to provide an input signal that corresponds to a voltage drop across the conductor. Based on the test current in the conductor and based on the input signal, a contribution to the voltage drop due to the test current and a contribution to the voltage drop due to a primary current through the conductor may be determined. In addition, at least one of a reference resistance of the conductor and the primary current in the conductor may be further determined.
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Citations
23 Claims
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1. A system, comprising:
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a conductor; a lock-in-amplifier (LIA) configured to generate a test current a first force contact coupled to the conductor at a first position; a second force contact coupled to the conductor at a second position, the first position and the second position being arranged at a first distance with respect to each other; a pair of force terminals coupled to the first force contact and the second force contact, the pair of force terminals configured to inject the test current from the LIA into the conductor across the first distance; a first sense contact coupled to the conductor at a third position; a second sense contact coupled to the conductor at a fourth position, the third position and the fourth position being arranged at a second distance with respect to each another and located within the first distance; a device, comprising; a microelectronic package; a memory configured to store a predefined reference resistance associated with the conductor; a pair of sense terminals coupled to the first sense contact and the second sense contact configured to provide an input signal related to a voltage drop across the conductor between the first sense contact and the second sense contact, wherein the pair of sense terminals is at least partly accessible from outside the microelectronic package; and at least one processor configured to determine a primary current through the conductor based on the input signal and the predefined reference resistance; and a first wiring coupling a first one of the pair of sense terminals with the first sense contact, wherein the first wiring includes a first connector to the LIA; and a second wiring coupling a second one of the pair of sense terminals with the second sense contact, wherein the second wiring comprises a second connector to the LIA, and wherein the LIA is configured to receive the input signal from the pair of sense terminals via the first wiring and the second wiring. - View Dependent Claims (2, 3, 4, 5, 6, 7)
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8. A device, comprising:
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a microelectronic package; a pair of sense terminals coupled to a first sense contact at a first position on a conductor and a second sense contact at a second position on the conductor, the pair of sense terminals configured to provide an input signal related to a voltage drop across the conductor in a first distance between the first sense contact and the second sense contact, wherein the pair of sense terminals is at least partly accessible from outside the microelectronic package; at least one processor configured to determine a contribution to the voltage drop due to a test current in the conductor based on the test current and the input signal, wherein the test current is injected into the conductor across a second distance between a first force contact at a third position on the conductor and a second force contact at a fourth position on the conductor via a pair of force terminals coupled to a lock-in-amplifier (LIA), and wherein the first distance is located within the second distance; a first wiring coupling a first one of the pair of sense terminals with the first sense contact, wherein the first wiring includes a first connector to the LIA; a second wiring coupling a second one of the pair of sense terminals with the second sense contact, wherein the second wiring comprises a second connector to the LIA, and wherein the LIA is configured to receive the input signal from the pair of sense terminals via the first wiring and the second wiring, the at least on processor further configured to determine a contribution to the voltage drop due to a primary current through the conductor; and the at least on processor further configured to determine the primary current. - View Dependent Claims (9, 10, 11, 12, 13, 14, 15)
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16. A method, comprising:
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injecting, via a pair of force terminals, a test current from a lock-in-amplifier (LIA) into a conductor across a first distance between a first force contact and a second force contact; receiving, by at least one processor via a pair of sense terminals, an input signal related to a first voltage drop in the conductor across a second distance between a first sense contact and a second sense contact, wherein the second distance is located within the first distance, wherein the pair of sense terminals are coupled to the first sense contact and the second sense contact; receiving, by the LIA via the pair of sense terminals, the input signal further related to a second voltage drop in the conductor across the second distance between the first sense contact and the second sense contact, wherein a first wiring couples a first one of the pair of sense terminals with the first sense contact and the first wiring includes a first connector to the LIA, a second wiring couples a second one of the pair of sense terminals with the second sense contact and the second wiring comprises a second connector to the LIA, and the LIA is configured to receive the input signal from the pair of sense terminals via the first wiring and the second wiring, determining, via the LIA, based on the test current and the input signal, a contribution to the second voltage drop due to the test current; determining, via the at least one processor, a contribution to the voltage drop due to a primary current; determining, via the LIA, information corresponding to a reference resistance of the conductor based on the input signal, wherein the information is a ratio of the second voltage drop over a magnitude of the test current; and determining, via the at least one processor, the reference resistance of the conductor based on the information from the LIA, and the primary current based on the contribution to the voltage drop due to the primary current and the reference resistance. - View Dependent Claims (17, 18, 19, 20, 21, 22)
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23. A system, comprising:
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a conductor; a first force contact coupled to the conductor at a first position; a second force contact coupled to the conductor at a second position, the first position and the second position being arranged at a first distance with respect to each other; a pair of force terminals coupled to the first force contact and the second force contact, the pair of force terminals configured to inject a test current into the conductor across the first distance; a first sense contact coupled to the conductor at a third position; a second sense contact coupled to the conductor at a fourth position, the third position and the fourth position being arranged at a second distance with respect to each another and located within the first distance; a device, comprising; a microelectronic package; a memory configured to store a predefined reference resistance associated with the conductor; a pair of sense terminals coupled to the first sense contact and the second sense contact configured to provide an input signal related to a voltage drop across the conductor between the first sense contact and the second sense contact, wherein the pair of sense terminals is at least partly accessible from outside the microelectronic package; and at least one processor configured to determine a primary current through the conductor based on the input signal and the predefined reference resistance; and a substrate having a first conductive layer and a second conductive layer, the second conductive layer contiguously forming the conductor between the first position and the second position, wherein the first conductive layer has a first thickness and the second conductive layer has a second thickness, wherein the first thickness is less than the second thickness, and wherein the first conductive layer comprises trace wiring coupling a first one of the pair of sense terminals with the first sense contact, trace wiring coupling a second one of the pair of sense terminals with the second sense contact, trace wiring coupling a first one of the pair of force terminals with the first force contact, and trace wiring coupling a second one of the pair of force terminals with the second force contact.
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Specification