Radiated emission measuring device

• US 10,317,446 B2
• Filed: 03/01/2017
• Issued: 06/11/2019
• Est. Priority Date: 03/28/2016
• Status: Active Grant

• Current Assignee: TDK Corporation
• Original Assignee: TDK Corporation
• Inventors: Midori, Masataka, Kurihara, Hiroshi
• Primary Examiner(s): Hollington, Jermele M
• Assistant Examiner(s): Rajaputra, Suresh K
• Application Number:
  US15/446,747
• Publication Number:
  US 20170276712A1
• Time in Patent Office: 832 Days
• CPC Class Codes: G01R 29/0878 Sensors; antennas; probes; detectors wave guide measuring sections G01R1/24
• CPC Class Codes: G01R 29/0892 Details related to signal analysis or treatment; presenting results, e.g. displays; measuring specific signal features other than field strength, e.g. polarisation, field modes, phase, envelope, maximum value

Abstract

A radiated emission measuring device includes: an electric field measuring device and an arithmetic processing unit. The arithmetic processing unit performs: a first arithmetic process of creating at least one of an electric field distribution and an electric field strength distribution of the plurality of measurement points measured by the electric field measuring device and inputting zero to at least one of an electric field and electric field strengths at a certain point between two neighboring measurement points; a second arithmetic process of applying a digital low pass filter to at least one of the electric field distribution and the electric field strength distribution obtained in the first arithmetic process; and a third arithmetic process of specifying a position at a maximum electric field strength from at least one of an electric field distribution and an electric field strength distribution obtained in the second arithmetic process.

Claims

1. A radiated emission measuring device configured to measure an electric field distribution of measurement points formed on a virtual surface surrounding a radiation source of electromagnetic waves, the radiated emission measuring device comprising:

an electric field measuring device and an arithmetic processing unit,

wherein the electric field measuring device comprises;

an antenna configured to detect at least one of electric fields and electric field strengths;

a position adjustment unit configured to change a position of the antenna relative to the radiation source; and

a controller configured to perform a first operation of setting a plurality of measurement points on the virtual surface and a second operation of measuring at least one of the electric fields and the electric field strengths at a frequency to be measured at the plurality of measurement points using the antenna while controlling the position adjustment unit, and

wherein the arithmetic processing unit is configured to perform;

a first arithmetic process of creating at least one of an electric field distribution and an electric field strength distribution of the plurality of measurement points measured in the second operation and inputting zero to at least one of an electric field and electric field strengths between two neighboring measurement points in at least one of the electric field distribution and the electric field strength distribution;

a second arithmetic process of applying a digital low pass filter in which the frequency to be measured is a cutoff frequency to at least one of the electric field distribution and the electric field strength distribution obtained in the first arithmetic process; and

a third arithmetic process of specifying a position at a maximum electric field strength from at least one of an electric field distribution and an electric field strength distribution obtained in the second arithmetic process.

2. The radiated emission measuring device according to claim 1,

wherein the plurality of measurement points are arranged to be disposed in two directions intersecting on the virtual surface, and a distance between two neighboring measurement points in the two directions is ½

or less of a wavelength of the electromagnetic waves.