Microelectronic workpiece processing systems and associated methods of color correction
First Claim
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1. A system for processing a semiconductor substrate, comprising:
- a substrate support configured to individually carry a microelectronic workpiece containing a plurality of light emitting diodes (LEDs);
a container holding a phosphor;
an injector operatively coupled to the container, the injector being configured to introduce a volume of the phosphor onto the plurality of LEDs of the microelectronic workpiece; and
a controller operatively coupled to the injector, the controller having a computer-readable storage medium containing instructions which, when executed, cause the controller to perform a method comprising;
receiving a base emission characteristic of the plurality of LEDs of the microelectronic workpiece;
adjusting a characteristic of the phosphor based on a previously-performed measurement that generates a plurality of points in a chromaticity plot of the received base emission characteristic of the plurality of LEDs, and wherein each of the plurality of points is indicative of a set of parameters associated with the phosphor and the plurality of LEDs, and wherein the plurality of points together define a rectangular distribution area; and
introducing the phosphor with the adjusted characteristic onto the plurality of LEDs.
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Abstract
Several embodiments of semiconductor systems and associated methods of color corrections are disclosed herein. In one embodiment, a method for producing a light emitting diode (LED) includes forming an (LED) on a substrate, measuring a base emission characteristic of the formed LED, and selecting a phosphor based on the measured base emission characteristic of the formed LED such that a combined emission from the LED and the phosphor at least approximates white light. The method further includes introducing the selected phosphor onto the LED via, for example, inkjet printing.
12 Citations
15 Claims
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1. A system for processing a semiconductor substrate, comprising:
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a substrate support configured to individually carry a microelectronic workpiece containing a plurality of light emitting diodes (LEDs); a container holding a phosphor; an injector operatively coupled to the container, the injector being configured to introduce a volume of the phosphor onto the plurality of LEDs of the microelectronic workpiece; and a controller operatively coupled to the injector, the controller having a computer-readable storage medium containing instructions which, when executed, cause the controller to perform a method comprising; receiving a base emission characteristic of the plurality of LEDs of the microelectronic workpiece; adjusting a characteristic of the phosphor based on a previously-performed measurement that generates a plurality of points in a chromaticity plot of the received base emission characteristic of the plurality of LEDs, and wherein each of the plurality of points is indicative of a set of parameters associated with the phosphor and the plurality of LEDs, and wherein the plurality of points together define a rectangular distribution area; and introducing the phosphor with the adjusted characteristic onto the plurality of LEDs. - View Dependent Claims (2, 3, 4, 5, 6, 7, 8, 9, 10)
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11. A system for processing a semiconductor substrate, comprising:
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a substrate support configured to individually carry a microelectronic workpiece containing a plurality of light emitting diodes (LEDs); a container holding a phosphor; an injector operatively coupled to the container, the injector being configured to introduce a volume of the phosphor onto the plurality of LEDs of the microelectronic workpiece; and a controller operatively coupled to the injector, the controller having a computer-readable storage medium containing instructions which, when executed, cause the controller to perform a method comprising; receiving a base emission characteristic of the plurality of LEDs of the microelectronic workpiece; developing a compensation scheme by selecting a group of candidate phosphors based on the base emission characteristic of the plurality of LEDs, wherein the group of the candidate phosphors is selected based on a previously-performed measurement that generates a plurality of points in a chromaticity plot of the received base emission characteristic of the plurality of LEDs, and wherein each of the plurality of points is indicative of a set of parameters associated with the phosphor and the plurality of LEDs, and wherein the plurality of points together define a rectangular distribution area; adjusting a characteristic of the phosphor based on the compensation scheme; and introducing the phosphor with the adjusted characteristic onto the plurality of LEDs. - View Dependent Claims (12, 13, 14, 15)
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Specification