Selective characterization of material under test (MUT) with electromagnetic impedance tomography and spectroscopy

• US 10,324,052 B2
• Filed: 09/15/2017
• Issued: 06/18/2019
• Est. Priority Date: 11/20/2013
• Status: Active Grant

• Current Assignee: TransTech Systems, Inc.
• Original Assignee: TransTech Systems, Inc.
• Inventors: Pluta, Sarah E., Colosimo, Donald D., Hewitt, John W.
• Primary Examiner(s): Nguyen, Hoai-An D.
• Application Number:
  US15/705,672
• Publication Number:
  US 20180011040A1
• Time in Patent Office: 641 Days
• Field of Search: 324600, 324629, 324637, 324638, 324642, 324646, 324647, 324658-665, 324667, 324669, 324671, 324672, 324684, 324686, 324689, 324500, 324512, 324527, 324532, 324533, 324534, 324323, 324326, 324327, 702 47, 702 52, 600300, 600372
• CPC Class Codes: A61B 5/0536 Impedance imaging, e.g. by tomography
• CPC Class Codes: G01N 22/02 Investigating the presence of flaws
• CPC Class Codes: G01N 22/04 Investigating moisture content
• CPC Class Codes: G01N 27/026 Dielectric impedance spectroscopy electrochemical impedance spectroscopy for measuring corrosion G01N17/02
• CPC Class Codes: G01R 27/02 Measuring real or complex resistance, reactance, impedance, or other two-pole characteristics derived therefrom, e.g. time constant by measuring phase angle only G01R25/00
• CPC Class Codes: G01R 33/323 Detection of MR without the use of RF or microwaves, e.g. force-detected MR, thermally detected MR, MR detection via electrical conductivity, optically detected MR
• CPC Class Codes: G01V 3/08 operating with magnetic or electric fields produced or modified by objects or geological structures or by detecting devices with electromagnetic waves G01V3/12

Abstract

A method of extracting complex impedance from selected volumes of the material under test (MUT) combined with various embodiments of electrode sensor arrays. Configurations of linear and planar electrode arrays provide measured data of complex impedance of selected volumes, or voxels, of the MUT, which then can be used to extract the impedance of selected sub-volumes or sub-voxels of the MUT through application of circuit theory. The complex impedance characteristics of the sub-voxels may be used to identify variations in the properties of the various sub-voxels of the MUT, or be correlated to physical properties of the MUT using electromagnetic impedance tomography and/or spectroscopy.

Claims

1. A method of characterizing select volumes of a material under test (MUT) using electromagnetic impedance tomography and spectroscopy, the method comprising:

positioning an electrode array parallel to a surface of the MUT;

instructing a signal generator operably connected with the electrode array to transmit a set of tomographic signals from the array of electrodes into the MUT;

obtaining a complex impedance of a volume or voxel of the MUT based upon a return signal received at the electrode array while the electrode array remains in communication with the MUT; and

applying at least one of a series circuit approach or a parallel circuit approach to compute a complex impedance of;

segments of the volume, or sub-voxel of the voxel, using the measured values of the volume or voxel of the MUT.

2. The method of claim 1, wherein the complex impedance is obtained for the voxel of the MUT, and wherein the complex impedance of the sub-voxel is correlated with physical properties of the MUT.

3. The method of claim 1, wherein the electrode array includes a linear array of electrodes, and wherein the number of electrodes in the linear array is equal to a number of layers (n) of the MUT to be measured plus one (n+1).

4. The method of claim 1, wherein a spacing (Δ

) between centers of adjacent electrodes in the electrode array is equal and defined by a minimum thickness of the layers of the MUT to be measured.

5. The method of claim 1, wherein electrodes in array are at least one of:

circular in shape, ellipsoid in shape or rectangular with rounded corners, and wherein an area of each of the electrodes in array is substantially uniform across all of the electrodes in the array.

6. The method of claim 1, wherein the electrode array includes a linear array of electrodes, wherein electrodes in the linear array of electrodes are equally spaced with respect to one another and operate at a single frequency with a fixed orientation, and wherein the linear array of electrodes includes a single fixed transmitting electrode and multiple receiving electrodes, wherein the method further includes:

obtaining the complex impedance of the MUT at time intervals (δ

) after positioning the electrode array parallel to the surface of the MUT;

calculating a characteristic of at least one three dimensional volume or voxel of the MUT from the complex impedance measurements; and

computing the complex impedance of the segment of the volume or the sub-voxel of the MUT from the complex impedance measurement of the MUT and the characteristic of the at least one three dimensional volume or voxel of the MUT; and

determining a physical property of the segment of the volume of the MUT or the sub-voxel of the MUT based upon the computed complex impedance.

7. The method of claim 1, wherein the electrode array includes a plurality of electrode positions, wherein the electrode array is configured to operate at a single frequency, wherein the obtaining of the complex impedance of volume or voxel of the MUT includes:

moving the electrode array parallel to a surface of the MUT while obtaining complex impedance measurements at time intervals (δ

), wherein during the moving of the electrode array, the transmitting electrode is sequenced through the plurality of electrode positions in coordination with a timing of the impedance measurements through all of the electrodes in the electrode array;

calculating a characteristic of at least one three dimensional volume or voxel of the MUT from the complex impedance measurements;

computing the complex impedance of the segment of the volume or the sub-voxel of the MUT from the complex impedance measurement of the MUT and the characteristic of the at least one three dimensional volume or voxel of the MUT; and

determining a physical property of the segment of the volume of the MUT or the sub-voxel of the MUT based upon the computed complex impedance.

8. The method of claim 1, wherein the electrode array includes a plurality of rows of linear electrode arrays, wherein the plurality of rows is equal to a number of electrodes in each row of the linear electrode arrays.

9. The method of claim 8, wherein each of the linear electrode arrays includes equally spaced electrodes.

10. The method of claim 9, wherein a spacing between adjacent rows of the linear electrode arrays is equal to or greater than a spacing between adjacent electrodes in each of the linear electrode arrays.

11. The method of claim 10, wherein a location of a transmitting electrode in each of the linear electrode arrays is fixed.

12. The method of claim 11, wherein the location of the transmitting electrode in the linear electrode arrays is sequenced with respect to each adjacent linear electrode array.

13. The method of claim 12, wherein each electrode linear array operates at a single frequency distinct from a single frequency of the remaining linear electrode arrays in the planar array of electrodes.

14. The method of claim 1, wherein computing the complex impedance of the segments of the volume or sub-voxel of the voxel is based upon the complex impedance measurements of the MUT volume or, the method further comprising correlating the complex impedance of the segments of the volume or sub-voxel of the voxel with the physical property of the MUT for each of the segments of the volume or the sub-voxel.

15. The method of claim 1, wherein the electrode array includes a planar array of electrodes, and wherein, when the planar array of electrodes is in motion parallel to a surface of the MUT, the method further comprises:

obtaining complex impedance measurements about the MUT at time intervals (δ

);

calculating a characteristic of the volume or voxel; and

correlating a complex impedance of the segment of the volume or the sub-voxel to a physical property of the MUT for the segment of the volume or the sub-voxel.

16. The method of claim 15, wherein the planar array of electrodes includes rows of linear electrode arrays, wherein a spacing (Δ

) between centers of adjacent electrodes in each linear electrode array is equal and is based on a minimum thickness of the layer of the MUT to be measured, wherein each linear electrode array is offset from each adjacent linear electrode array by a distance equal to or greater than the spacing (Δ

) between adjacent electrodes within each linear electrode array.

17. The method of claim 14, wherein the planar array of electrodes includes rows of linear electrode arrays each configured to operate sequentially over a range of frequencies, wherein a spacing (Δ

) between centers of adjacent electrodes in each linear electrode array is equal, and based on a minimum thickness of a layer of the MUT to be measured.

18. The method of claim 17, wherein a number of electrodes in each linear electrode array is equal to a number of layers (n) of the MUT to be measured, plus one (n+1).

19. The method of claim 17, wherein a location of the transmitting electrode in the linear electrode arrays is sequenced with respect to each adjacent linear electrode array.