Test element analysis system for the analytical examination of a sample
First Claim
1. A test element analysis system for the analytical examination of a sample, comprising a measurement device, the measurement device comprising a test element receptacle for receiving at least one test element at least partially, wherein the test element receptacle comprises at least one first part and at least one second part, wherein the first part comprises at least one support surface for placement of the test element, wherein the second part comprises at least one alignment pin for engagement with at least one alignment hole of the test element, wherein the second part is movable relative to the first part in a direction essentially perpendicular to the support surface, wherein the test element receptacle is configured to position the second part in at least three distinct positions relative to the first part, the at least three distinct positions comprising an intermediate position for inserting the test element into the test element receptacle, a closed position for performing a measurement and an open position for removing the test element from the test element receptacle,wherein in the closed position the alignment pin protrudes through the alignment hole,wherein in the open position the first part and the second part are spaced apart such that the test element may freely be removed from the test element receptacle, andwherein in the intermediate position the first part and the second part are spaced apart such that the test element may be inserted into the test element receptacle, whereas the alignment pin is positioned such that the test element is resiliently deformed by the alignment pin during the insertion, until the alignment pin snaps into the alignment hole.
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Abstract
A test element analysis system for the analytical examination of a sample, a method for positioning a test element in a measuring device and a method for an analytical examination of a sample are disclosed. The test element analysis system comprises: a measurement device comprising a test element receptacle for receiving a test element at least partially, wherein the receptacle comprises a first part and a second part, the first part comprises a support surface for placement of the test element, the second part comprises an alignment pin for engagement with an alignment hole of the test element, the second part is movable relative to the first part in a direction essentially perpendicular to the support surface, the receptacle is configured to position the second part in at least three distinct positions relative to the first part comprising an intermediate position, a closed position, and an open position.
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Citations
16 Claims
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1. A test element analysis system for the analytical examination of a sample, comprising a measurement device, the measurement device comprising a test element receptacle for receiving at least one test element at least partially, wherein the test element receptacle comprises at least one first part and at least one second part, wherein the first part comprises at least one support surface for placement of the test element, wherein the second part comprises at least one alignment pin for engagement with at least one alignment hole of the test element, wherein the second part is movable relative to the first part in a direction essentially perpendicular to the support surface, wherein the test element receptacle is configured to position the second part in at least three distinct positions relative to the first part, the at least three distinct positions comprising an intermediate position for inserting the test element into the test element receptacle, a closed position for performing a measurement and an open position for removing the test element from the test element receptacle,
wherein in the closed position the alignment pin protrudes through the alignment hole, wherein in the open position the first part and the second part are spaced apart such that the test element may freely be removed from the test element receptacle, and wherein in the intermediate position the first part and the second part are spaced apart such that the test element may be inserted into the test element receptacle, whereas the alignment pin is positioned such that the test element is resiliently deformed by the alignment pin during the insertion, until the alignment pin snaps into the alignment hole.
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14. A method for positioning a test element in a measuring device for performing an analytical examination of a sample, the method comprising:
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a) providing a measurement device having a test element receptacle for receiving at least one test element at least partially, wherein the test element receptacle comprises at least one first part and at least one second part, wherein the first part comprises at least one support surface for placement of the test element, wherein the second part comprises at least one alignment pin for engagement with at least one alignment hole of the test element, and wherein the second part is movable relative to the first part in a direction essentially perpendicular to the support surface, b) positioning the second part in an intermediate position, wherein in the intermediate position the first part and the second part are spaced apart such that the test element may freely be inserted into the test element receptacle, c) inserting at least one test element having at least one alignment hole into the test element receptacle, wherein the test element is temporarily and resiliently deformed by the alignment pin during the insertion, until the alignment pin snaps into the alignment hole, d) positioning the second part in a closed position, wherein in the closed position the alignment pin protrudes through the alignment hole, e) positioning the second part in an open position, wherein in the open position the first part and the second part are spaced apart, and f) removing the test element from the test element receptacle. - View Dependent Claims (15, 16)
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Specification