Systems and methods for determining a self-discharge current characteristic of a storage cell
First Claim
1. A method comprising:
- measuring an open circuit voltage across a pair of terminals of one of a storage cell or a bank of storage cells by using a first voltage measurement circuit that provides a first voltage resolution;
providing to the one of the storage cell or the bank of storage cells, a first potentiostat voltage that is determined at least in part by using the open circuit voltage measured using the first voltage measurement circuit;
measuring a terminal voltage, with reference to ground, at one of the pair of terminals of the one of the storage cell or the bank of storage cells by using a second voltage measurement circuit configured to provide a second voltage resolution that is higher than the first voltage resolution;
providing to the one of the storage cell or the bank of storage cells, a second potentiostat voltage that is based at least in part on the terminal voltage measured using the second voltage measurement circuit;
executing one or more self-discharge leakage current measurements upon the one of the storage cell or the bank of storage cells over a period of time after providing the second potentiostat voltage to the one of the storage cell or the bank of storage cells; and
using the one or more self-discharge leakage current measurements to determine a self-discharge leakage current characteristic of the one of the storage cell or the bank of storage cells.
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Accused Products
Abstract
In accordance with one illustrative embodiment, a system for determining a self-discharge current characteristic of a storage cell (or a bank of storage cells) includes a voltage source, first and second voltage measurement circuits, a current measurement circuit, and a processor. The voltage source provides a potentiostat voltage to the storage cell coupled to the system. The first voltage measurement circuit provides a first voltage resolution for measuring an open circuit voltage across a pair of terminals of the storage cell. The second voltage measurement circuit provides a second voltage resolution that is significantly higher than the first voltage resolution for measuring a terminal voltage at one of the pair of terminals of the storage cell. The processor executes a test procedure by using the voltage source, the first and second voltage measurement circuits, and the current measurement circuit, to determine the self-discharge leakage current characteristic of the storage cell.
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Citations
20 Claims
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1. A method comprising:
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measuring an open circuit voltage across a pair of terminals of one of a storage cell or a bank of storage cells by using a first voltage measurement circuit that provides a first voltage resolution; providing to the one of the storage cell or the bank of storage cells, a first potentiostat voltage that is determined at least in part by using the open circuit voltage measured using the first voltage measurement circuit; measuring a terminal voltage, with reference to ground, at one of the pair of terminals of the one of the storage cell or the bank of storage cells by using a second voltage measurement circuit configured to provide a second voltage resolution that is higher than the first voltage resolution; providing to the one of the storage cell or the bank of storage cells, a second potentiostat voltage that is based at least in part on the terminal voltage measured using the second voltage measurement circuit; executing one or more self-discharge leakage current measurements upon the one of the storage cell or the bank of storage cells over a period of time after providing the second potentiostat voltage to the one of the storage cell or the bank of storage cells; and using the one or more self-discharge leakage current measurements to determine a self-discharge leakage current characteristic of the one of the storage cell or the bank of storage cells. - View Dependent Claims (2, 3, 4, 5, 6, 7)
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8. A method comprising:
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executing a temperature coefficient of voltage (TCV) characterization procedure upon one of a storage cell or a bank of storage cells for determining a TCV characteristic of the one of the storage cell or the bank of storage cells; and using the TCV characteristic to set an initial state-of-charge (SOC) level of the one of the storage cell or the bank of storage cells prior to executing a test procedure for determining a self-discharge leakage current characteristic of the one of the storage cell or the bank of storage cells, the test procedure comprising; providing two or more voltage measurement circuits; using one of the two or more voltage measurement circuits to measure an open circuit voltage across a pair of terminals of the one of the storage cell or the bank of storage cells, the one of the two or more voltage measurement circuits providing a first voltage resolution; providing to the one of the storage cell or the bank of storage cells, a first potentiostat voltage having a voltage amplitude that matches the open circuit voltage measured using the one of the two or more voltage measurement circuits; executing one or more self-discharge leakage current measurements upon the one of the storage cell or the bank of storage cells over a period of time after at least providing the first potentiostat voltage to the one of the storage cell or the bank of storage cells; and using the one or more self-discharge leakage current measurements to determine the self-discharge leakage current characteristic of the one of the storage cell or the bank of storage cells. - View Dependent Claims (9, 10, 11, 12, 13)
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14. A system comprising:
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a first voltage measurement circuit that provides a first voltage resolution for measuring an open circuit voltage across a pair of terminals of one of a storage cell or a bank of storage cells; a second voltage measurement circuit that provides a second voltage resolution for measuring a terminal voltage with reference to ground at one of the pair of terminals of the one of the storage cell or the bank of storage cells; a current measurement circuit for measuring one or more self-discharge leakage currents of the one of the storage cell or the bank of storage cells; and a processor coupled to the first voltage measurement circuit, the second voltage measurement circuit, and the current measurement circuit for executing a test procedure to determine a self-discharge leakage current characteristic of the one of the storage cell or the bank of storage cells. - View Dependent Claims (15, 16, 17, 18, 19, 20)
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Specification