Multi-frequency excitation schemes for high sensitivity magnetometry measurement with drift error compensation
First Claim
1. A system for magnetic detection, comprising:
- a magneto-optical defect center material comprising a plurality of magneto-optical defect centers;
a radio frequency (RF) excitation source configured to provide RF excitation to the magneto-optical defect center material;
an optical excitation source configured to provide optical excitation to the magneto-optical defect center material;
an optical detector configured to receive an optical signal emitted by the magneto-optical defect center material;
a magnetic field generator configured to generate a magnetic field applied to the magneto-optical defect center material; and
a controller configured to;
control the optical excitation source to apply optical excitation to the magneto-optical defect center material;
control the RF excitation source to apply a first RF excitation to the magneto-optical defect center material, the first RF excitation having a first frequency;
control the RF excitation source to apply a second RF excitation to the magneto-optical defect center material, the second RF excitation having a second frequency,wherein the first frequency is a frequency associated with a first slope point of a fluorescence intensity response of a magneto-optical defect center orientation of a first spin state due to the optical excitation, the first slope point being a positive slope point, andwherein the second frequency is a frequency associated with a second slope point of the fluorescence intensity response of the magneto-optical defect center orientation of the first spin state due to the optical excitation, the second slope point being a negative slope point;
measure a first fluorescence intensity at the positive slope point;
measure a second fluorescence intensity at the negative slope point; and
calculate a compensated fluorescence intensity based on the measured first fluorescence intensity and the measured second fluorescence intensity.
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Accused Products
Abstract
A system for magnetic detection includes a nitrogen vacancy (NV) diamond material, a radio frequency (RF) excitation source that provides RF excitation to the NV diamond material, an optical excitation source that provides optical excitation to the NV diamond material, an optical detector that receives an optical signal emitted by the NV diamond material, a magnetic field generator that generates a magnetic field applied to the NV diamond material, and a controller. The controller controls the RF excitation source to apply a first RF excitation having a first frequency and a second RF excitation having a second frequency. The first frequency is associated with a first slope point of a fluorescence intensity response of an NV center orientation of a first spin state, and the second frequency is associated with a second slope point of the fluorescence intensity response of the NV center orientation of the first spin state.
435 Citations
31 Claims
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1. A system for magnetic detection, comprising:
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a magneto-optical defect center material comprising a plurality of magneto-optical defect centers; a radio frequency (RF) excitation source configured to provide RF excitation to the magneto-optical defect center material; an optical excitation source configured to provide optical excitation to the magneto-optical defect center material; an optical detector configured to receive an optical signal emitted by the magneto-optical defect center material; a magnetic field generator configured to generate a magnetic field applied to the magneto-optical defect center material; and a controller configured to; control the optical excitation source to apply optical excitation to the magneto-optical defect center material; control the RF excitation source to apply a first RF excitation to the magneto-optical defect center material, the first RF excitation having a first frequency; control the RF excitation source to apply a second RF excitation to the magneto-optical defect center material, the second RF excitation having a second frequency, wherein the first frequency is a frequency associated with a first slope point of a fluorescence intensity response of a magneto-optical defect center orientation of a first spin state due to the optical excitation, the first slope point being a positive slope point, and wherein the second frequency is a frequency associated with a second slope point of the fluorescence intensity response of the magneto-optical defect center orientation of the first spin state due to the optical excitation, the second slope point being a negative slope point; measure a first fluorescence intensity at the positive slope point; measure a second fluorescence intensity at the negative slope point; and calculate a compensated fluorescence intensity based on the measured first fluorescence intensity and the measured second fluorescence intensity. - View Dependent Claims (2, 3, 4, 5, 6, 7, 8, 9, 10, 11, 12, 28)
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13. A system for magnetic detection, comprising:
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a magneto-optical defect center material comprising a plurality of magneto-optical defect centers; a radio frequency (RF) excitation source configured to provide RF excitation to the NV diamond material; an optical excitation source configured to provide optical excitation to the magneto-optical defect center material; an optical detector configured to receive an optical signal emitted by the magneto-optical defect center material; a magnetic field generator configured to generate a magnetic field applied to the magneto-optical defect center material; and a controller configured to; control the optical excitation source to apply optical excitation to the magneto-optical defect center material; control the RF excitation source to apply a first RF excitation to the magneto-optical defect center material, the first RF excitation having a first frequency; control the RF excitation source to apply a second RF excitation to the magneto-optical defect center material, the second RF excitation having a second frequency, wherein the first frequency is a frequency associated with a first slope point of a fluorescence intensity response of a magneto-optical defect center orientation of a first spin state due to the optical excitation, and wherein the second frequency is a frequency associated with a second slope point of the fluorescence intensity response of the magneto-optical defect center orientation of a second spin state due to the optical excitation; measure a first fluorescence intensity at the first slope point; measure a second fluorescence intensity at the second slope point; and calculate a compensated fluorescence intensity based on the measured first fluorescence intensity and the measured second fluorescence intensity. - View Dependent Claims (14, 15, 16, 17, 18, 19, 20, 21, 22, 23, 24, 29)
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25. A method for compensating for drift error in a magnetic detection system, the method comprising:
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applying optical excitation to a magneto-optical defect center material comprising a plurality of magneto-optical defect centers; applying a first RF excitation to the magneto-optical defect center material, the first RF excitation having a first frequency; applying a second RF excitation to the magneto-optical defect center material, the second RF excitation having a second frequency; applying a third RF excitation to the magneto-optical defect center material, the third RF excitation having a third frequency; applying a fourth RF excitation to the magneto-optical defect center material, the fourth RF excitation having a fourth frequency, wherein the first frequency is a frequency associated with a first slope point of a fluorescence intensity response of a magneto-optical defect center orientation of a first spin state due to the optical excitation, the first slope point being a positive slope point, wherein the second frequency is a frequency associated with a second slope point of the fluorescence intensity response of the magneto-optical defect center orientation of the first spin state due to the optical excitation, the second slope point being a negative slope point, wherein the third frequency is a frequency associated with a third slope point of the fluorescence intensity response of the magneto-optical defect center orientation of a second spin state due to the optical excitation, and wherein the fourth frequency is a frequency associated with a fourth slope point of the fluorescence intensity response of the magneto-optical defect center orientation of the second spin state due to the optical excitation; measure a first fluorescence intensity at the first or second slope points; measure a second fluorescence intensity at the third or fourth slope points; and calculate a compensated fluorescence intensity based on the measured first fluorescence intensity and the measured second fluorescence intensity. - View Dependent Claims (26, 30)
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27. A system for magnetic detection, comprising:
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magneto-optical defect center material comprising a plurality of magneto-optical defect centers; a radio frequency (RF) excitation source configured to provide RF excitation to the magneto-optical defect center material; an optical excitation source configured to provide optical excitation to the magneto-optical defect center material; an optical detector configured to receive an optical signal emitted by the magneto-optical defect center material; a magnetic field generator configured to generate a magnetic field applied to the magneto-optical defect center; and a means for; controlling the optical excitation source to apply optical excitation to the magneto-optical defect center material; controlling the RF excitation source to apply a first RF excitation to the magneto-optical defect center material, the first RF excitation having a first frequency; controlling the RF excitation source to apply a second RF excitation to the magneto-optical defect center material, the second RF excitation having a second frequency, wherein the first frequency is a frequency associated with a first slope point of a fluorescence intensity response of a magneto-optical defect center orientation of a first spin state due to the optical excitation, the first slope point being a positive slope point, and wherein the second frequency is a frequency associated with a second slope point of the fluorescence intensity response of the magneto-optical defect center orientation of the first spin state due to the optical excitation, the second slope point being a negative slope point; measure a first fluorescence intensity at the positive slope point; measure a second fluorescence intensity at the negative slope point; and calculate a compensated fluorescence intensity based on the measured first fluorescence intensity and the measured second fluorescence intensity. - View Dependent Claims (31)
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Specification