Recipe selection based on inter-recipe consistency
First Claim
1. A method for a measurement procedure, the method comprising:
- determining recipe consistency within each of a plurality of subsets of substrate measurement recipes selected from a plurality of substrate measurement recipes based on values of a characteristic at a plurality of areas on a substrate obtained using the plurality of substrate measurement recipes;
selecting a substrate measurement recipe from the plurality of substrate measurement recipes based on the recipe consistency; and
setting or modifying a physical configuration of a physical measurement process according to at least the selected substrate measurement recipe and/or communicating data to a physical system in order to set or modify a physical configuration of a measurement or inspection apparatus according to at least the selected substrate measurement recipe.
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Abstract
A method including: determining recipe consistencies between one substrate measurement recipe of a plurality of substrate measurement recipes and each other substrate measurement recipe of the plurality of substrate measurement recipes; calculating a function of the recipe consistencies; eliminating the one substrate measurement recipe from the plurality of substrate measurement recipes if the function meets a criterion; and reiterating the determining, calculating and eliminating until a termination condition is met. Also disclosed herein is a substrate measurement apparatus, including a storage configured to store a plurality of substrate measurement recipes, and a processor configured to select one or more substrate measurement recipes from the plurality of substrate measurement recipes based on recipe consistencies among the plurality of substrate measurement recipes.
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Citations
29 Claims
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1. A method for a measurement procedure, the method comprising:
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determining recipe consistency within each of a plurality of subsets of substrate measurement recipes selected from a plurality of substrate measurement recipes based on values of a characteristic at a plurality of areas on a substrate obtained using the plurality of substrate measurement recipes; selecting a substrate measurement recipe from the plurality of substrate measurement recipes based on the recipe consistency; and setting or modifying a physical configuration of a physical measurement process according to at least the selected substrate measurement recipe and/or communicating data to a physical system in order to set or modify a physical configuration of a measurement or inspection apparatus according to at least the selected substrate measurement recipe. - View Dependent Claims (2, 3, 4, 5, 6, 7, 8, 9, 10, 11, 12, 13, 14, 15, 16)
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17. A computer program product comprising a non-transitory computer readable medium having instructions recorded thereon, the instructions when executed by a computer configured to cause at least:
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determination of recipe consistency within each of a plurality of subsets of substrate measurement recipes selected from a plurality of substrate measurement recipes based on values of a characteristic at a plurality of areas on a substrate obtained using the plurality of substrate measurement recipes; selection of a substrate measurement recipe from the plurality of substrate measurement recipes based on the recipe consistency; and setting or modifying of a physical configuration of a physical measurement process according to at least the selected substrate measurement recipe and/or communication of data to a physical system in order to set or modify a physical configuration of a measurement or inspection apparatus according to at least the selected substrate measurement recipe. - View Dependent Claims (18, 19, 20, 21, 22, 23, 24, 25)
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26. A substrate measurement apparatus configured to measure a substrate, the substrate measurement apparatus comprising:
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a storage configured to store a plurality of substrate measurement recipes, and a processor configured to at least; determine recipe consistency within each of a plurality of subsets of substrate measurement recipes selected from the plurality of substrate measurement recipes based on values of a characteristic at a plurality of areas on a substrate obtained using the plurality of substrate measurement recipes; select a substrate measurement recipe from the plurality of substrate measurement recipes based on the recipe consistency; and set or modify a physical configuration of a physical measurement process using the substrate measurement apparatus according to at least the selected substrate measurement recipe and/or communicate data to a physical system in order to set or modify a physical configuration of the substrate measurement apparatus according to at least the selected substrate measurement recipe. - View Dependent Claims (27, 28, 29)
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Specification