Input voltage reduction for processing devices
First Claim
1. A method of determining operating voltages for a processing device, the method comprising:
- in a computing assembly comprising the processing device, executing a voltage adjustment process to determine at least one supply voltage for the processing device lower than a manufacturer specified operating voltage;
for each incremental application of supply voltages in the voltage adjustment process;
applying an incrementally adjusted voltage level to a selected voltage domain of the processing device while maintaining voltage levels for other voltage domains of the processing device;
booting the computing assembly into an operating system using at least the processing device;
operating the processing device according to a functional test comprising an application or script executed in at least the operating system on the processing device, wherein the functional test exercises power consumption above a threshold level for the processing device for at least the selected voltage domain along with associated system elements of the computing assembly external to the processing device that share at least the selected voltage domain; and
monitoring for operational failures of at least the processing device during application of the incrementally adjusted voltage level; and
responsive to the operational failures during the functional test, determining a value of a corresponding incrementally adjusted voltage level, and establishing the at least one supply voltage for a corresponding selected voltage domain based at least in part on the value of the corresponding incrementally adjusted voltage level.
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Accused Products
Abstract
Voltage adjustment techniques for computing systems and processing devices are presented herein. In one example, a method of determining operating voltages for a processing device includes executing a voltage adjustment process to determine at least one input voltage for the processing device lower than a manufacturer specified operating voltage. During the voltage adjustment process, the method includes applying incrementally adjusted input voltages to the processing device, operating the processing device according to a functional test that exercises the processing device in context with associated system elements of a computing assembly, and monitoring for operational failures of at least the processing device during application of each of the incrementally adjusted input voltages. Responsive to the operational failures, the method includes determining corresponding values of the incrementally adjusted input voltages and establishing an input voltage based at least in part on the corresponding values of the incrementally adjusted input voltages.
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Citations
20 Claims
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1. A method of determining operating voltages for a processing device, the method comprising:
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in a computing assembly comprising the processing device, executing a voltage adjustment process to determine at least one supply voltage for the processing device lower than a manufacturer specified operating voltage; for each incremental application of supply voltages in the voltage adjustment process; applying an incrementally adjusted voltage level to a selected voltage domain of the processing device while maintaining voltage levels for other voltage domains of the processing device; booting the computing assembly into an operating system using at least the processing device; operating the processing device according to a functional test comprising an application or script executed in at least the operating system on the processing device, wherein the functional test exercises power consumption above a threshold level for the processing device for at least the selected voltage domain along with associated system elements of the computing assembly external to the processing device that share at least the selected voltage domain; and monitoring for operational failures of at least the processing device during application of the incrementally adjusted voltage level; and responsive to the operational failures during the functional test, determining a value of a corresponding incrementally adjusted voltage level, and establishing the at least one supply voltage for a corresponding selected voltage domain based at least in part on the value of the corresponding incrementally adjusted voltage level. - View Dependent Claims (2, 3, 4, 5, 6, 7, 8, 9)
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10. An apparatus comprising:
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one or more non-transitory computer readable storage media; program instructions stored on the one or more non-transitory computer readable storage media that, based at least in part on execution by a computing system, direct the computing system to at least; execute a voltage adjustment process for a processing device included in the computing system to determine at least one supply voltage for the processing device lower than a manufacturer specified operating voltage; for each incremental application of supply voltages in the voltage adjustment process, apply an incrementally adjusted voltage level to a selected voltage domain of the processing device while maintaining voltage levels for other voltage domains of the processing device, boot the computing system into an operating system using at least the processing device, operate the processing device according to a functional test comprising an application or script executed in at least the operating system on the processing device, wherein the functional test exercises power consumption above a threshold level for the processing device in context with associated system elements of the computing system external to the processing device that share at least the selected voltage domain, and monitor for operational failures of at least the processing device during application of the incrementally adjusted voltage level; responsive to the operational failures during the functional test, determine a value of a corresponding incrementally adjusted voltage level, and establish the at least one supply voltage for a corresponding selected voltage domain based at least in part on the value of the corresponding incrementally adjusted voltage level. - View Dependent Claims (11, 12, 13, 14, 15, 16, 17, 18)
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19. A manufacturing test system for a computing apparatus, comprising:
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a deployment platform configured to deploy and initiate a voltage test process to a computing apparatus over a communication link, the voltage test process configured to determine at least one operating voltage for a processing device of the computing apparatus lower than a manufacturer specified operating voltage; for each incremental application of supply voltages in the voltage test process, the computing apparatus is configured to apply an incrementally adjusted voltage level to the processing device, boot the computing apparatus into an operating system using at least the processing device, operate the processing device according to a functional test comprising an application or script executed in at least the operating system on the processing device that exercises the processing device in context with associated system elements of the computing apparatus external to the processing device that share at least the selected voltage domain, and monitor for operational failures of at least the processing device during application of the incrementally adjusted voltage level; responsive to the operational failures during the functional test, the computing apparatus configured to provide an indication of the operational failures to the deployment platform and responsively receive, over the communication link, an indication of at least one supply voltage determined based at least in part on a corresponding value of the incrementally adjusted voltage level applied during the operational failures. - View Dependent Claims (20)
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Specification