Efficient modulated imaging

• US 10,342,432 B2
• Filed: 01/17/2018
• Issued: 07/09/2019
• Est. Priority Date: 11/07/2012
• Status: Active Grant

• Current Assignee: Modulated Imaging, Inc.
• Original Assignee: Modulated Imaging, Inc.
• Inventors: Cuccia, David, Mazhar, Amaan
• Primary Examiner(s): Hulbert, Amanda K
• Assistant Examiner(s): Edwards, Philip C
• Application Number:
  US15/873,602
• Publication Number:
  US 20180228372A1
• Time in Patent Office: 538 Days
• Field of Search: 600476
• CPC Class Codes: A61B 5/0064 Body surface scanning
• CPC Class Codes: A61B 5/0071 by measuring fluorescence emission
• CPC Class Codes: A61B 5/0077 Devices for viewing the surface of the body, e.g. camera, magnifying lens

Abstract

An apparatus for turbid sample measurement comprising a plurality of light sources for illuminating a turbid sample target area with non-spatial structured light, a projection system for illuminating the turbid sample target area with spatial structured light, a sensor for collecting light from the turbid sample target area, and a processor to analyze the data captured by the sensor to yield scattering and absorption coefficients of the turbid sample. A method comprises illuminating the sample with spatial structured light, collecting light reflected from the sample at a number of wavelengths, illuminating the sample with non-spatial structured light, collecting light reflected from the sample at a number of wavelengths, and combining the measurements of the collected light to obtain the optical properties of the sample and/or the concentration of absorbing or fluorescent molecules. The wavelengths of the spatial and non-spatial light sources are preferably different.

Claims

1. An apparatus for the measurement of a turbid sample comprising

a planar light source,

a spatially structured light source,

a sensor configured to collect light from a target area of the turbid sample illuminated by the planar light source and the spatial structure light source, and

a processor configured to analyze the data captured by the sensor to yield the scattering and absorption coefficients of the turbid sample,

wherein wavelengths of the light emitted from the planar light source are different from wavelengths of the light emitted from the spatially structured light source.

2. An apparatus as in claim 1, wherein the planar light source is configured to illuminate the sample with light not having spatial structure.

3. An apparatus as in claim 1, wherein the planar light source comprises a light ring assembly.

4. An apparatus as in claim 3, wherein the light ring assembly includes a ring body with a plurality of sockets formed about the perimeter of the ring body and a plurality of non-spatially structured light sources removably mounted within the sockets.

5. An apparatus as in claim 4, wherein individual ones of the plurality of non-spatially structured light sources comprise LED modules.

6. An apparatus as in claim 5, wherein individual ones of the plurality of non-spatially structured light sources comprise include a beam homogenizer.

7. An apparatus as in claim 6, wherein the beam homogenizer is an integrating rod.

8. An apparatus as in claim 1, wherein the sensor is a camera.

9. An apparatus as in claim 1, wherein the sensor is positioned off axis to the planar light source and the spatially structured light source.

10. An apparatus as in claim 1, wherein the spatially structured light source is a projection system.

11. An apparatus as in claim 1, wherein the spatially structured light source comprises a number of switchable light sources.

12. An apparatus as in claim 11, wherein the switchable light sources include LEDs having different wavelengths.

13. A method for the measurement of a turbid sample comprising the steps of

illuminating a target area of a turbid sample with spatially structured light,

collecting light reflected from the turbid sample to obtain the remitted light of the sample at a number of wavelengths, λ

_j,

illuminating the target area of the turbid sample with planar light,

collecting light reflected from the sample to obtain the remitted light of the sample at a number of wavelengths, λ

_k, and

combining the obtained measurements from light having spatial structure and planar light to obtain fit parameters,

wherein the fit parameters include one or more of the optical properties of the turbid sample at a number of wavelengths, λ

, and the concentration of absorbing or fluorescent molecules,

wherein wavelengths of the planar light, λ

_k, are different from wavelengths of the light having spatial structure, λ

_j.

14. The method of claim 13, wherein each wavelength of the first plurality of wavelengths, λ

_j, has a different signal to noise ratio (SNR) and wherein each wavelength of the second plurality of wavelengths, λ

_k, has a different signal to noise ratio (SNR).

15. The method of claim 13, further comprising, prior to illuminating the target area of the turbid sample with only planar light, extrapolating the measurements of the remitted light having spatial structure to calculate a scattering coefficient for the second plurality of wavelengths, μ

′

(λ

_k^P).

16. The method of claim 15, wherein the measurements of the remitted planar light are at diffuse reflectance coefficients, Rd λ

_k^P.

17. The method of claim 16, wherein μ

′

(λ

_k^P) and Rd λ

_k^P are combined to yield μ

_a(λ

_k^P).

18. The method of claim 17, wherein the signal to noise ratios (SNR) of the first plurality of wavelengths, λ

_j, are higher in relation to the signal to noise ratios (SNR) of the second plurality of wavelengths, λ

_k.