Watchdog scheme for monitoring a power electronic inverter and determining a manner of operating a load
First Claim
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1. A circuit comprising:
- a first sub-circuit configured to generate first data corresponding to a frequency and a duration of overloading of a transistor in an inverter; and
a second sub-circuit configured to generate second data corresponding to a rate of rise of a voltage and a peak voltage value of the transistor in the inverter;
whereinthe first sub-circuit and the second sub-circuit are configured to respectively provide the first data and second data as outputs to a controller for analyzing a manner in which a load coupled to the inverter is driven, andthe controller is configured to analyze the manner in which the load is driven by,receiving the first data, anddetermining the frequency and the duration of overloading the transistor based on frequencies and widths of pulses included in the first data.
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Abstract
In one example embodiment, a circuit includes a first sub-circuit configured to generate first data corresponding to a frequency and a duration of overloading of a transistor in the inverter, and a second sub-circuit configured to generate second data corresponding to a rate of rise of a voltage and a peak voltage value of the transistor in the inverter. The first sub-circuit and the second sub-circuit are configured to respectively provide the first data and second data as outputs to a controller for analyzing a manner in which a load coupled to the inverter is driven.
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17 Claims
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1. A circuit comprising:
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a first sub-circuit configured to generate first data corresponding to a frequency and a duration of overloading of a transistor in an inverter; and a second sub-circuit configured to generate second data corresponding to a rate of rise of a voltage and a peak voltage value of the transistor in the inverter;
whereinthe first sub-circuit and the second sub-circuit are configured to respectively provide the first data and second data as outputs to a controller for analyzing a manner in which a load coupled to the inverter is driven, and the controller is configured to analyze the manner in which the load is driven by, receiving the first data, and determining the frequency and the duration of overloading the transistor based on frequencies and widths of pulses included in the first data. - View Dependent Claims (2, 3, 4, 5, 6, 7, 8, 9)
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10. A system comprising:
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a plurality of transistors forming an inverter; and a plurality of circuits, each of the plurality of circuits being coupled to one of the plurality of transistors, each of the plurality of circuits being configured to monitor the corresponding one of the plurality of transistors by, generating first data corresponding to a frequency and a duration of overloading of the corresponding one of the plurality of transistors, and generating second data corresponding to a rate of rise of a voltage and a peak voltage value of the corresponding one of the plurality of transistors, wherein each of the plurality of circuits is configured to provide the corresponding first data and the second data as outputs to a controller for analyzing a manner in which a load coupled to the inverter is driven, and the controller is configured to analyze the manner in which the load is driven by, receiving the first data and the second data, and analyzing, based on the first data and the second data, the manner in which the load is driven by determining the frequency and the duration of overloading the transistors based on a frequency and width of pulses included in the first data. - View Dependent Claims (11, 12, 13, 14, 15, 16)
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17. A system comprising:
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a plurality of transistors forming an inverter; and a plurality of circuits, each of the plurality of circuits being coupled to one of the plurality of transistors, each of the plurality of circuits being configured to monitor the corresponding one of the plurality of transistors by, generating first data corresponding to a frequency and a duration of overloading of the corresponding one of the plurality of transistors, and generating second data corresponding to a rate of rise of a voltage and a peak voltage value of the corresponding one of the plurality of transistors, wherein each of the plurality of circuits is configured to provide the corresponding first data and the second data as outputs to a controller for analyzing a manner in which a load coupled to the inverter is driven, and the controller is configured to analyze the manner in which the load is driven by, receiving the first data and the second data, and analyzing, based on the first data and the second data, the manner in which the load is driven by, determining, based on the second data, a temperature of the corresponding one of the plurality of transistors during a turn-off event, developing a degradation model for the corresponding one of the plurality of transistors based on the determined temperature, and determining a schedule for performing a maintenance of the corresponding one of the plurality of transistors based on the degradation model and a maintenance look-up table.
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Specification