Non-halogen etching of silicon-containing materials
First Claim
1. An etching method comprising:
- forming a plasma consisting of an inert precursor within a processing region of a semiconductor processing chamber;
passivating, with the plasma consisting of the inert precursor, an exposed region of an oxygen-containing material, wherein the oxygen-containing material extends about a feature formed on a semiconductor substrate contained within the processing region to limit exposure of the feature to the plasma;
forming a plasma of a hydrogen-containing precursor within the processing region of the semiconductor processing chamber;
directing plasma effluents of the hydrogen-containing precursor towards an exposed silicon-containing material on the semiconductor substrate, wherein the plasma effluents of the hydrogen-containing precursor are directed with a DC bias; and
anisotropically etching the exposed silicon-containing material with the plasma effluents of the hydrogen-containing precursor, wherein the plasma effluents selectively etch silicon relative to the oxygen-containing material.
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Abstract
Processing methods may be performed to limit damage of features of a substrate, such as missing fin damage. The methods may include forming a plasma of an inert precursor within a processing region of a processing chamber. Effluents of the plasma of the inert precursor may be utilized to passivate an exposed region of an oxygen-containing material that extends about a feature formed on a semiconductor substrate. A plasma of a hydrogen-containing precursor may also be formed within the processing region. Effluents of the plasma of the hydrogen-containing precursor may be directed, with DC bias, towards an exposed silicon-containing material on the semiconductor substrate. The methods may also include anisotropically etching the exposed silicon-containing material with the plasma effluents of the hydrogen-containing precursor, where the plasma effluents of the hydrogen-containing precursor selectively etch silicon relative to silicon oxide.
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Citations
20 Claims
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1. An etching method comprising:
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forming a plasma consisting of an inert precursor within a processing region of a semiconductor processing chamber; passivating, with the plasma consisting of the inert precursor, an exposed region of an oxygen-containing material, wherein the oxygen-containing material extends about a feature formed on a semiconductor substrate contained within the processing region to limit exposure of the feature to the plasma; forming a plasma of a hydrogen-containing precursor within the processing region of the semiconductor processing chamber; directing plasma effluents of the hydrogen-containing precursor towards an exposed silicon-containing material on the semiconductor substrate, wherein the plasma effluents of the hydrogen-containing precursor are directed with a DC bias; and anisotropically etching the exposed silicon-containing material with the plasma effluents of the hydrogen-containing precursor, wherein the plasma effluents selectively etch silicon relative to the oxygen-containing material. - View Dependent Claims (2, 3, 4, 5, 6, 7, 8, 9, 10, 11)
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12. An etching method comprising:
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forming a first plasma consisting of an inert precursor, wherein forming the first plasma consisting of the inert precursor comprises applying a first DC bias to a processing region in a semiconductor processing chamber; contacting an exposed region of an oxygen-containing material with the first plasma consisting of the inert precursor, wherein the oxygen-containing material covers a feature formed on a semiconductor substrate within the processing region, wherein the first plasma consisting of the inert precursor passivates the exposed region of the oxygen-containing material and limit exposure of the feature to the first plasma; forming a second plasma of an hydrogen-containing precursor, wherein forming a second plasma comprises applying a second DC bias to the semiconductor processing chamber; and directing plasma effluents of the hydrogen-containing precursor towards an exposed silicon-containing material on the semiconductor substrate; and anisotropically etching, with the plasma effluents of the hydrogen-containing precursor, the exposed silicon-containing material, wherein the plasma effluents of the hydrogen-containing precursor selectively etch silicon relative to the oxygen-containing material. - View Dependent Claims (13, 14, 15, 16, 17, 18, 19, 20)
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Specification