Current sensing probe incorporating a current-to-voltage conversion circuit

• US 10,359,450 B1
• Filed: 01/10/2017
• Issued: 07/23/2019
• Est. Priority Date: 01/10/2017
• Status: Active Grant

• Current Assignee: Keysight Technologies, Inc.
• Original Assignee: Keysight Technologies, Inc.
• Inventors: Oliva, Alexander, Brush, IV, Edward Vernon
• Primary Examiner(s): Le, Son T
• Application Number:
  US15/402,324
• Time in Patent Office: 924 Days
• CPC Class Codes: G01R 1/06766 Input circuits therefor
• CPC Class Codes: G01R 1/06772 High frequency probes
• CPC Class Codes: G01R 1/06788 Hand-held or hand-manipulated probes, e.g. for oscilloscopes or for portable test instruments end pieces terminating in a probe H01R11/18
• CPC Class Codes: G01R 1/30 Structural combination of electric measuring instruments with basic electronic circuits, e.g. with amplifier
• CPC Class Codes: G01R 13/22 Circuits therefor
• CPC Class Codes: G01R 15/186 using current transformers with a core consisting of two or more parts, e.g. clamp-on type G01R15/142 - G01R15/16 take precedence; tong testers G01R1/22
• CPC Class Codes: G01R 19/0092 measuring current only all subgroups of G01R19/00 take precedence
• CPC Class Codes: G01R 19/2506 Arrangements for conditioning or analysing measured signals, e.g. for indicating peak values G01R19/003 takes precedence; Details concerning sampling, digitizing or waveform capturing displaying waveforms G01R13/00; analog sampling G01R19/0053
• CPC Class Codes: G01R 19/28 adapted for measuring in circuits having distributed constants

Abstract

Generally, in accordance with the various illustrative embodiments disclosed herein, a current sensing probe includes a current-to-voltage conversion circuit that not only presents a desirable impedance into an inductive current sensing element of the current sensing probe, but also remains operationally stable over a wide range of frequencies when measuring a current flowing through a device-under-test. The wide frequency range can extend down to some low frequencies that can prove challenging to conventional current sensing probe circuits.

Claims

1. A current sensing probe comprising:

an inductive current sensing element; and

a current-to-voltage conversion circuit connected to the inductive current sensing element, the current-to-voltage conversion circuit comprising;

an operational amplifier;

a coupling capacitor disposed between the inductive current sensing element and a negative input terminal of the operational amplifier;

a first resistor coupled between the negative input terminal of the operational amplifier and an output node of the operational amplifier, the first resistor providing stability to the operational amplifier when the coupling capacitor blocks a first signal frequency that is below a threshold frequency; and

a second resistor coupled between a junction node, located between the inductive current sensing element and the coupling capacitor, and the output node of the operational amplifier, the second resistor operating in parallel with the first resistor to provide a transimpedance gain to a second signal frequency that is above the threshold frequency.

2. The current sensing probe of claim 1, wherein a resistance value of the second resistor provides a predetermined gain-bandwidth product in the current-to-voltage conversion circuit.

3. The current sensing probe of claim 1, wherein the inductive current sensing element comprises a coil of wire housed in one of a clip-on current probe or a solid core current probe.

4. The current sensing probe of claim 1, wherein each of the first signal frequency and the second signal frequency is associated with an AC current coupled into the inductive current sensing element from a device-under-test.

5. The current sensing probe of claim 1, wherein the threshold frequency corresponds to a minimum frequency of operation of the inductive current sensing element.

6. The current sensing probe of claim 5, wherein the coupling capacitor is selected in accordance with the minimum frequency of operation of the inductive current sensing element.

7. The current sensing probe of claim 6, wherein the coupling capacitor is further selected in accordance with an operational bandwidth of the inductive current sensing element.

8. The current sensing probe of claim 1, further comprising a cable assembly for connecting the current sensing probe to a measurement instrument.

9. The current sensing probe of claim 8, wherein the measurement instrument is at least one of an oscilloscope and a voltmeter.

10. A current sensing probe comprising:

an inductive current sensing element; and

a current-to-voltage conversion circuit connected to the inductive current sensing element, the current-to-voltage conversion circuit comprising;

an operational amplifier;

a coupling capacitor disposed between the inductive current sensing element and a negative input terminal of the operational amplifier;

a first resistor coupled between the negative input terminal of the operational amplifier and an output node of the operational amplifier, the first resistor providing stability to the operational amplifier when no current is coupled into the inductive current sensing element; and

a second resistor connected at one end between the inductive current sensing element and coupling capacitor, and coupled to the output node of the operational amplifier, the second resistor operating in parallel with the first resistor when impedance presented by the coupling capacitor is low in response to an AC current having a signal frequency above a threshold frequency being coupled into the inductive current sensing element.

11. The current sensing probe of claim 10, further comprising:

a compensation resistor that couples a positive input terminal of the operational amplifier to ground.

12. A current sensing probe comprising:

an inductive current sensing element; and

a current-to-voltage conversion circuit connected to the inductive current sensing element, the current-to-voltage conversion circuit comprising;

an operational amplifier; and

a current buffer circuit disposed between the inductive current sensing element and an input terminal of the operational amplifier, the current buffer circuit configured to couple into the operational amplifier an AC current sensed by the inductive current sensing element, the current buffer circuit comprising;

a transistor arranged in a common-base configuration, wherein an emitter of the transistor is AC-coupled to the inductive current sensing element and a collector of the transistor is connected to the input terminal of the operational amplifier;

a biasing resistor, connected between the emitter of the transistor and a negative biasing voltage, configured to provide a bias that places the transistor in a linear mode of operation; and

a resistor connected between the base of the transistor and ground.

13. The current sensing probe of claim 12, wherein the inductive current sensing element is adapted for coupling the current sensing probe to a current carrying element in a device-under-test.

14. The current sensing probe of claim 12, further comprising a coupling capacitor disposed between the inductive current sensing element and a junction node connected to the biasing resistor, wherein the current buffer circuit is further configured to maintain the input terminal of the operational amplifier at a voltage potential that provides stability to the operational amplifier when the coupling capacitor blocks a first signal frequency associated with an AC current coupled into the inductive current sensing element.

15. The current sensing probe of claim 12, wherein the input terminal of the operational amplifier is a positive input terminal of the operational amplifier.

16. The current sensing probe of claim 12, wherein the input terminal of the operational amplifier is a negative input terminal of the operational amplifier.

17. The current sensing probe of claim 12, wherein the current-to-voltage conversion circuit further includes a coupling capacitor disposed between the inductive current sensing element and the emitter lead of the transistor.