Efficient thermal drift compensation in DNV vector magnetometry

• US 10,359,479 B2
• Filed: 02/20/2017
• Issued: 07/23/2019
• Est. Priority Date: 02/20/2017
• Status: Active Grant

• Current Assignee: Lockheed Martin Corporation (Martin Marietta Corporation)
• Original Assignee: Lockheed Martin Corporation (Martin Marietta Corporation)
• Inventors: Manickam, Arul, Kaup, Peter G.
• Primary Examiner(s): Vargas, Dixomara
• Application Number:
  US15/437,038
• Publication Number:
  US 20180238989A1
• Time in Patent Office: 883 Days
• CPC Class Codes: G01N 24/10 by using electron paramagnetic resonance G01N24/12 takes precedence
• CPC Class Codes: G01R 33/0029 Treating the measured signals, e.g. removing offset or noise
• CPC Class Codes: G01R 33/032 using magneto-optic devices, e.g. Faraday or Cotton-Mouton effect
• CPC Class Codes: G01R 33/26 using optical pumping

Abstract

A system for magnetic detection of an external magnetic field is described. The system includes a nitrogen vacancy (NV) diamond material having a plurality of crystallographic axes, a radio frequency (RF) excitation source, an optical excitation source, an optical detector, and a controller. The RF radio frequency excitation source is configured to provide RF excitations to the NV diamond material to excite electron spin resonances corresponding to the RF excitations. The controller determines the spectral position corresponding to some of the electron spin resonances, determines a measured four-dimensional projection of a magnetic field based on the determined spectral positions of a subset of all of the plurality of spin resonances, where the number of spin resonances in the subset is one half of a total number of the spin resonances, and determines an estimated three-dimensional magnetic field based on the measured four-dimensional magnetic field projections.

Claims

1. A system for magnetic detection of an external magnetic field, comprising:

a nitrogen vacancy (NV) diamond material comprising a plurality of NV centers, the diamond material having a plurality of crystallographic axes each directed in different directions, the NV centers each corresponding to a respective one of the plurality of crystallographic axes;

a radio frequency (RF) excitation source configured to provide RF excitations to the NV diamond material to excite electron spin resonances corresponding to the RF excitations, each crystallographic axis corresponding to a different electron spin resonance;

an optical excitation source configured to provide optical excitation to the NV diamond material;

an optical detector configured to receive an optical signal based on light emitted by the NV diamond material, the optical signal having a plurality of intensity changes corresponding respectively to electron spin resonances of the NV centers; and

a controller configured to;

receive a light detection signal from the optical detector based on the optical signal;

determine the spectral position corresponding to some of the electron spin resonances based on the light detection signal;

determine a measured four-dimensional projection of a magnetic field based on the determined spectral positions of a subset of all of the plurality of spin resonances, where the number of spin resonances in the subset is one half of a total number of the spin resonances; and

determine an estimated three-dimensional magnetic field based on the measured four-dimensional magnetic field projections.

2. The system of claim 1 where there are two different electron spin resonances for each of the crystallographic axes.

3. The system of claim 2, wherein the total number of spin resonances is eight and the number of spin resonances in the subset of spin resonances is four.

4. The system of claim 3, wherein the subset of spin resonances includes spin resonances corresponding to each of the crystallographic axes.

5. The system of claim 3, wherein the controller is configured to determine the measured four-dimensional projected field based on a least squares fit.

6. The system of claim 2, wherein spin resonances in the subset of spin resonances are selected to reduce thermal drift.

16. The system of claim 3, wherein the controller is configured to determine the measured four-dimensional projected field based on a least squares fit.

7. A system for magnetic detection of an external magnetic field, comprising:

a magneto-optical defect center material comprising a plurality of magneto-optical defect centers, the magneto-optical defect center material having a plurality of crystallographic axes each directed in different directions, the magneto-optical defect centers each corresponding to a respective one of the plurality of crystallographic axes;

a radio frequency (RF) excitation source configured to provide RF excitations to the magneto-optical defect center material to excite electron spin resonances corresponding to the RF excitations, each crystallographic axis corresponding to a different spin resonance;

an optical excitation source configured to provide optical excitation to the magneto-optical defect center material;

an optical detector configured to receive an optical signal based on light emitted by the magneto-optical defect center material, the optical signal having a plurality of intensity changes corresponding respectively to electron spin resonances of the magneto-optical defect centers; and

a controller configured to;

receive a light detection signal from the optical detector based on the optical signal;

determine the spectral position corresponding to some of the electron spin resonances based on the light detection signal;

determine a measured four-dimensional projection of a magnetic field based on the determined spectral positions of a subset of all of the plurality of spin resonances, where the number of spin resonances in the subset is one half of a total number of the spin resonances; and

determine an estimated three-dimensional magnetic field based on the measured four-dimensional magnetic field projections.

8. The system of claim 7 where there are two different electron spin resonances for each of the crystallographic axes.

9. The system of claim 8, wherein the total number of spin resonances is eight and the number of spin resonances in the subset of spin resonances is four.

10. The system of claim 9, wherein the subset of spin resonances includes spin resonances corresponding to each of the crystallographic axes.

11. The system of claim 9, wherein the controller is configured to determine the measured four-dimensional field based on a least squares fit.

12. The system of claim 8, wherein spin resonances in the subset of spin resonances are selected to reduce thermal drift.

13. The system of claim 7 where the magneto-optical defect center material may comprise one of diamond, silicon carbide, or silicon.

14. A system for magnetic detection of an external magnetic field, comprising:

a nitrogen vacancy (NV) diamond material comprising a plurality of NV centers, the diamond material having a plurality of crystallographic axes each directed in different directions, the NV centers each corresponding to a respective one of the plurality of crystallographic axes;

a radio frequency (RF) excitation source configured to provide RF excitations to the NV diamond material to excite electron spin resonances corresponding to the RF excitations, each crystallographic axis corresponding to a different spin resonance;

an optical excitation source configured to provide optical excitation to the NV diamond material;

an optical detector configured to receive an optical signal based on light emitted by the NV diamond material, the optical signal having a plurality of intensity changes corresponding respectively to electron spin resonances of the NV centers; and

a controller configured to;

receive a light detection signal from the optical detector based on the optical signal;

determine the spectral position corresponding to some of the electron spin resonances based on the light detection signal;

determine a measured four-dimensional projection of a magnetic field based on some of the spectral positions of the plurality of spin resonances;

determine an estimated three-dimensional magnetic field based on the measured four-dimensional magnetic field projection; and

determine a shift in the estimated three-dimensional magnetic field due to thermal drift based on the estimated three-dimensional magnetic field and the measured four-dimensional magnetic field projection.

15. The system of claim 14 where there are two different electron spin resonances for each of the crystallographic axes.

17. A method for determining an external magnetic field, comprising:

applying RF excitations to nitrogen vacancy (NV) diamond material to excite electron spin resonances corresponding to the RF excitations, the NV diamond material comprising a plurality of NV centers, the NV diamond material having a plurality of crystallographic axes each directed in different directions, the NV centers each corresponding to a respective one of the plurality of crystallographic axes, each crystallographic axis corresponding to a different spin resonance;

applying optical excitation to the NV diamond material;

detecting an optical signal based on light emitted by the NV diamond material, the optical signal having a plurality of intensity changes corresponding respectively to electron spin resonances of the NV centers;

receiving a light detection signal based on the detected optical signal;

determining the spectral position corresponding to some of the electron spin resonances based on the light detection signal;

determining a measured four-dimensional projection of a magnetic field based on the determined spectral positions of a subset of all of the plurality of spin resonances, where the number of spin resonances in the subset is one half of a total number of the spin resonances; and

determining an estimated three-dimensional magnetic field based on the measured four-dimensional magnetic field projections.

18. The method of claim 17 where there are two different electron spin resonances for each of the crystallographic axes.

19. The method of claim 18, wherein the total number of spin resonances is eight and the number of spin resonances in the subset of spin resonances is four.

20. The method of claim 19, wherein the subset of spin resonances includes spin resonances corresponding to each of the crystallographic axes.

21. The method of claim 19, wherein the measured four-dimensional projected field is based on a least squares fit.

22. The method of claim 18, wherein spin resonances in the subset of spin resonances are selected to reduce thermal drift.

23. A method for determining an external magnetic field, comprising:

applying RF excitations to magneto-optical defect center material to excite electron spin resonances corresponding to the RF excitations, the magneto-optical defect center material comprising a plurality of magneto-optical defect centers, the magneto-optical defect center material having a plurality of crystallographic axes each directed in different directions, the magneto-optical defect centers each corresponding to a respective one of the plurality of crystallographic axes, each crystallographic axis corresponding to a different spin resonance;

applying optical excitation to the magneto-optical defect center material;

detecting an optical signal based on light emitted by the magneto-optical defect center material, the optical signal having a plurality of intensity changes corresponding respectively to electron spin resonances of the magneto-optical defect centers;

receiving a light detection signal based on the detected optical signal;

determining the spectral position corresponding to some of the electron spin resonances based on the light detection signal;

determining a measured four-dimensional projection of a magnetic field based on the determined spectral positions of a subset of all of the plurality of spin resonances, where the number of spin resonances in the subset is one half of a total number of the spin resonances; and

determining an estimated three-dimensional magnetic field based on the measured four-dimensional magnetic field projections.

24. The method of claim 23 where the magneto-optical defect center material may comprise one of diamond, silicon carbide, or silicon.

25. A method for determining an external magnetic field, comprising:

applying RF excitations to nitrogen vacancy (NV) diamond material to excite electron spin resonances corresponding to the RF excitations, the NV diamond material comprising a plurality of NV centers, the NV diamond material having a plurality of crystallographic axes each directed in different directions, the NV centers each corresponding to a respective one of the plurality of crystallographic axes, each crystallographic axis corresponding to a different spin resonance;

applying optical excitation to the NV diamond material;

detecting an optical signal based on light emitted by the NV diamond material, the optical signal having a plurality of intensity changes corresponding respectively to electron spin resonances of the NV centers;

receiving a light detection signal based on the detected optical signal;

determining the spectral position corresponding to some of the electron spin resonances based on the light detection signal;

determining a measured four-dimensional projection of a magnetic field based on some of the spectral positions of the plurality of spin resonances;

determining an estimated three-dimensional magnetic field based on the measured four-dimensional magnetic field projections; and

determining a shift in the estimated three-dimensional magnetic field due to thermal drift based on the estimated three-dimensional magnetic field and the measured four-dimensional magnetic field projections.

26. The method of claim 25, wherein the determining the measured multi-dimensional field is based on a least squares fit.

27. A method for determining an external magnetic field, comprising:

applying RF excitations to magneto-optical defect center material to excite electron spin resonances corresponding to the RF excitations, the magneto-optical defect center material comprising a plurality of magneto-optical defect centers, the magneto-optical defect center material having a plurality of crystallographic axes each directed in different directions, the magneto-optical defect centers each corresponding to a respective one of the plurality of crystallographic axes, each crystallographic axis corresponding to a different spin resonance;

applying optical excitation to the magneto-optical defect center material;

detecting an optical signal based on light emitted by the magneto-optical defect center material, the optical signal having a plurality of intensity changes corresponding respectively to electron spin resonances of the magneto-optical defect centers;

receiving a light detection signal based on the detected optical signal;

determining the spectral position corresponding to some of the electron spin resonances based on the light detection signal;

determining a measured four-dimensional projection of a magnetic field based on some of the spectral positions of the plurality of spin resonances;

determining an estimated three-dimensional magnetic field based on the measured four-dimensional magnetic field projections; and

determining a shift in the estimated three-dimensional magnetic field due to thermal drift based on the estimated three-dimensional magnetic field and the measured four-dimensional magnetic field projections.

28. The method of claim 27, wherein where the magneto-optical defect center material may comprise one of diamond, silicon carbide, or silicon.