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Apparatus and methods for protection against inadvertent programming of fuse cells

  • US 10,360,988 B2
  • Filed: 10/31/2017
  • Issued: 07/23/2019
  • Est. Priority Date: 11/02/2016
  • Status: Active Grant
First Claim
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1. A fuse system for a semiconductor die, the fuse system comprising:

  • a plurality of pads including a first pad and a second pad;

    a fuse;

    a fuse programming switch in series with the fuse;

    a biasing circuit configured to bias a control input of the fuse programming switch with a fuse programming signal to thereby control a current through the fuse, the biasing circuit including a voltage regulator electrically connected between the first pad and the second pad and configured to generate a regulated voltage, and a level-shifter configured to control a voltage level of the fuse programming signal to be about equal to the regulated voltage in a first state of a control signal and to be about equal to the voltage of the first pad in a second state of the control signal; and

    a fuse protection diode in series with the fuse programming switch and the fuse between the first pad and the second pad, the fuse protection diode configured to inhibit accidental programming of the fuse in response to a decrease in a voltage of the first pad relative to a voltage of the second pad, and to prevent accidental programming of the fuse arising from a delay of the voltage regulator in providing voltage regulation.

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