Apparatus and methods for protection against inadvertent programming of fuse cells

• US 10,360,988 B2
• Filed: 10/31/2017
• Issued: 07/23/2019
• Est. Priority Date: 11/02/2016
• Status: Active Grant

• Current Assignee: Skyworks Solutions Incorporated
• Original Assignee: Skyworks Solutions Incorporated
• Inventors: Zhou, Bo, Blin, Guillaume Alexandre
• Primary Examiner(s): King, Douglas
• Application Number:
  US15/798,786
• Publication Number:
  US 20180158533A1
• Time in Patent Office: 630 Days
• Field of Search: None
• CPC Class Codes: G11C 17/16 using electrically-fusible links
• CPC Class Codes: G11C 17/18 Auxiliary circuits, e.g. for writing into memory
• CPC Class Codes: H01L 27/0248 for electrical or thermal protection, e.g. electrostatic discharge [ESD] protection
• CPC Class Codes: H10B 20/25 One-time programmable ROM [OTPROM] devices, e.g. using electrically-fusible links

Abstract

Apparatus and methods for protection against inadvertent programming of fuse cells are provided herein. In certain configurations, a fuse system includes a fuse protection diode, a fuse programming transistor, and a fuse cell electrically connected in series between a first pad and a second pad. The fuse system further includes a bias generator that biases a gate of the fuse programming transistor to control an amount of current provided to the fuse cell. The fuse protection diode helps prevent inadvertent programming of the fuse cell by blocking current from flowing through the fuse cell in response to a decrease in voltage of the first pad relative to the second pad.

Claims

1. A fuse system for a semiconductor die, the fuse system comprising:

a plurality of pads including a first pad and a second pad;

a fuse;

a fuse programming switch in series with the fuse;

a biasing circuit configured to bias a control input of the fuse programming switch with a fuse programming signal to thereby control a current through the fuse, the biasing circuit including a voltage regulator electrically connected between the first pad and the second pad and configured to generate a regulated voltage, and a level-shifter configured to control a voltage level of the fuse programming signal to be about equal to the regulated voltage in a first state of a control signal and to be about equal to the voltage of the first pad in a second state of the control signal; and

a fuse protection diode in series with the fuse programming switch and the fuse between the first pad and the second pad, the fuse protection diode configured to inhibit accidental programming of the fuse in response to a decrease in a voltage of the first pad relative to a voltage of the second pad, and to prevent accidental programming of the fuse arising from a delay of the voltage regulator in providing voltage regulation.

2. The fuse system of claim 1, wherein the voltage regulator is a low dropout regulator.

3. The fuse system of claim 1, further comprising a serial interface configured to provide the control signal to instruct programming of the fuse.

4. The fuse system of claim 1 wherein the first pad is a shared power supply and fuse programming pad and the second pad is a ground pad.

5. The fuse system of claim 1 further comprising a fuse sensing circuit electrically connected to the fuse and configured to detect a state of the fuse.

6. The fuse system of claim 1 wherein the fuse programming switch is a fuse programming field-effect transistor including a gate controlled by the fuse programming signal and a source electrically connected to a cathode of the fuse protection diode.

7. The fuse system of claim 6 further comprising a cascode field-effect transistor electrically connected between a drain of the fuse programming field-effect transistor and the fuse.

8. The fuse system of claim 1 wherein the fuse protection diode is implemented as a diode-connected transistor.

9. The fuse system of claim 1 wherein the fuse protection diode is implemented as a p-n junction diode.

10. A method of protecting from accidental fuse programming, the method comprising:

biasing a control input of a fuse programming switch with a fuse programming signal, including generating a regulated voltage using a voltage regulator that is electrically connected between a first pad and a second pad, and controlling a voltage level of the fuse programming signal to be about equal to the regulated voltage in a first state of a control signal using a level-shifter and to be about equal to the voltage of the first pad in a second state of the control signal;

controlling a current through the fuse based on the fuse programming signal, the fuse electrically connected in series with the fuse programming switch and a fuse protection diode between the first pad and the second pad;

inhibiting unintended programming of the fuse in response to a decrease in a voltage of the first pad relative to a voltage of the second pad using the fuse protection diode; and

inhibiting unintended programming of the fuse arising from a delay of the voltage regulator in providing voltage regulation using the fuse protection diode.

14. The method of claim 10 wherein generating the regulated voltage includes outputting the regulated voltage from a low dropout regulator.

11. A packaged module comprising:

a package substrate; and

a semiconductor die attached to the package substrate, the semiconductor die including a fuse protection diode, a fuse programming switch, and a fuse electrically connected in series with one another between a first pad and a second pad, the semiconductor die further including a biasing circuit configured to bias a control input of the fuse programming switch with a fuse programming signal to thereby control a current through the fuse, the biasing circuit including a voltage regulator electrically connected between the first pad and the second pad and configured to generate a regulated voltage, and a level-shifter configured to control a voltage level of the fuse programming signal to be about equal to the regulated voltage in a first state of a control signal and to be about equal to the voltage of the first pad in a second state of the control signal, the fuse protection diode configured to inhibit accidental programming of the fuse in response to a decrease in a voltage of the first pad relative to a voltage of the second pad, and to prevent accidental programming of the fuse arising from a delay of the voltage regulator in providing voltage regulation.

12. The packaged module of claim 11 wherein the first pad is a shared power supply and fuse programming pad and the second pad is a ground pad, the semiconductor die further including a core circuit configured to receive power from the first pad and the second pad.

13. The packaged module of claim 11 wherein the voltage regulator is a low dropout regulator.