Method and apparatus for identifying defects in a chemical sensor array
First Claim
1. An apparatus, comprising:
- an array of field effect transistors including;
a plurality of chemical sensors, each chemical sensor coupled to a corresponding reaction region for receiving at least one reactant, anda plurality of reference sensors, each reference sensor including a reference transistor with a first terminal directly coupled to a first reference select switch to bias the reference transistor and directly coupled to a second reference select switch to couple the first terminal of the reference transistor to a column line;
an access circuit for accessing the chemical sensors and the reference sensors, wherein the access circuit includes a plurality of reference lines coupled to a gate terminal of each reference transistor in a corresponding set of reference sensors;
a controller to;
apply bias voltages to the reference lines to select a corresponding set of reference sensors;
acquire output signals from the selected reference sensors; and
identify one or more defects in the access circuit based on differences between the acquired output signals and expected output signals.
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Abstract
An apparatus including an array of sensors including a plurality of chemical sensors and a plurality of reference sensors, each chemical sensor coupled to a corresponding reaction region for receiving at least one reactant, and each reference sensor comprising a field effect transistor having a gate coupled to a corresponding reference line and an access circuit for accessing the chemical sensors and the reference sensors and a controller to apply bias voltages to the reference lines to select corresponding reference sensors, acquire output signals from the selected reference sensors, and identify one or more defects in the access circuit based on differences between the acquired output signals and expected output signals.
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Citations
8 Claims
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1. An apparatus, comprising:
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an array of field effect transistors including; a plurality of chemical sensors, each chemical sensor coupled to a corresponding reaction region for receiving at least one reactant, and a plurality of reference sensors, each reference sensor including a reference transistor with a first terminal directly coupled to a first reference select switch to bias the reference transistor and directly coupled to a second reference select switch to couple the first terminal of the reference transistor to a column line; an access circuit for accessing the chemical sensors and the reference sensors, wherein the access circuit includes a plurality of reference lines coupled to a gate terminal of each reference transistor in a corresponding set of reference sensors; a controller to; apply bias voltages to the reference lines to select a corresponding set of reference sensors; acquire output signals from the selected reference sensors; and identify one or more defects in the access circuit based on differences between the acquired output signals and expected output signals. - View Dependent Claims (2, 3, 4, 5, 6, 7, 8)
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Specification