×

Systems and methods for high accuracy analyte measurement

  • US 10,371,663 B2
  • Filed: 03/13/2017
  • Issued: 08/06/2019
  • Est. Priority Date: 12/31/2010
  • Status: Active Grant
First Claim
Patent Images

1. An analyte measurement system comprising:

  • a plurality of test strips, each test strip having one or more adhesive layers, at least two electrodes spaced apart in a test chamber and a reagent disposed therebetween to receive a sample containing an analyte; and

    an analyte measurement device including;

    a strip port having connectors configured to mate with respective electrodes of each test strip; and

    a microprocessor coupled to the strip port and configured to measure current, test strip capacitance, and sample fill time with the electrodes of each test strip when a referential sample is deposited in the test chamber of each of the plurality of test strips and a corrected final concentration determined based on the current, sample fill time, and the test strip capacitance so that a percentage of the corrected final concentration value from the plurality of test strips are within 10% of a referential analyte value above a threshold analyte value, in which the microprocessor is configured so that when an analyte test strip of the plurality of test strips is coupled to the strip port with a sample deposited therein, an analyte in the sample reacts between the two electrodes to provide for a first analyte concentration value G1 based on measured output current values over discrete intervals, a second analyte concentration value G2 based on measured output current values over discrete intervals, a temperature corrected analyte concentration value G3 from the second analyte concentration value G2, a sample fill time corrected analyte concentration value G4 from the temperature corrected analyte concentration value, and a test strip capacitance corrected final concentration value G5 from the sample fill time corrected analyte concentration value G4, wherein the test strip capacitance is a function of a slow flow of the one or more adhesive layers into the test chamber.

View all claims
  • 7 Assignments
Timeline View
Assignment View
    ×
    ×