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Light field display metrology

  • US 10,378,882 B2
  • Filed: 11/02/2016
  • Issued: 08/13/2019
  • Est. Priority Date: 11/04/2015
  • Status: Active Grant
First Claim
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1. An optical metrology system for measuring imperfections in a light field generated by a display, the optical metrology system comprising:

  • a display configured to project a target light field comprising a virtual object having an intended focus position;

    a camera configured to obtain images of the target light field;

    a hardware processor programmed with executable instructions to;

    access one or more images corresponding to a portion of the light field;

    apply a display-to-camera pixel mapping to transfer pixel values of the display to pixel values of the camera, wherein the display-to-camera pixel mapping comprises;

    a first gamma correction that maps color levels of the display to a first intermediate color representation;

    a pixel-dependent coupling function that maps the first intermediate color representation to a second intermediate color representation; and

    a second gamma correction that maps the second intermediate color representation to color levels registered by the camera;

    analyze the one or more images to identify a measured focus position corresponding to a position at which the virtual object is in focus; and

    determine imperfections in the light field based at least in part on a comparison of the measured focus position and the intended focus position.

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