Spectroscopic assembly and method

• US 10,378,955 B2
• Filed: 02/08/2017
• Issued: 08/13/2019
• Est. Priority Date: 12/19/2012
• Status: Active Grant

• Current Assignee: Viavi Solutions, Inc. (Lumentum Holdings Inc.)
• Original Assignee: Viavi Solutions, Inc. (Lumentum Holdings Inc.)
• Inventors: Ockenfuss, Georg J.
• Primary Examiner(s): Alexander, William R
• Assistant Examiner(s): Parbadia, Balram T
• Application Number:
  US15/427,912
• Publication Number:
  US 20170191871A1
• Time in Patent Office: 916 Days
• CPC Class Codes: A61B 2562/0233 Special features of optical sensors or probes classified in A61B5/00
• CPC Class Codes: A61B 2562/12 Manufacturing methods specially adapted for producing sensors for in-vivo measurements
• CPC Class Codes: A61B 5/0059 using light, e.g. diagnosis by transillumination, diascopy, fluorescence A61B5/0093, A61B5/1455, A61B5/02416 and A61B5/0261 take precedence
• CPC Class Codes: A61B 5/0071 by measuring fluorescence emission
• CPC Class Codes: A61B 5/0075 by spectroscopy, i.e. measuring spectra, e.g. Raman spectroscopy, infrared absorption spectroscopy A61B5/0071 takes precedence
• CPC Class Codes: A61B 5/14532 for measuring glucose, e.g. by tissue impedance measurement
• CPC Class Codes: A61B 5/1455 using optical sensors, e.g. spectral photometrical oximeters
• CPC Class Codes: A61B 5/1459 invasive, e.g. introduced into the body by a catheter A61B5/1464 takes precedence
• CPC Class Codes: G01J 1/0488 with spectral filtering
• CPC Class Codes: G01J 1/42 using electric radiation detectors optical or mechanical part G01J1/04; by comparison with a reference light or electric value G01J1/10
• CPC Class Codes: G01J 2003/1226 Interference filters
• CPC Class Codes: G01J 3/0229 using masks, aperture plates, spatial light modulators or spatial filters, e.g. reflective filters
• CPC Class Codes: G01J 3/0256 Compact construction
• CPC Class Codes: G01J 3/4406 Fluorescence spectrometry
• CPC Class Codes: G01N 21/645 Specially adapted constructive features of fluorimeters
• CPC Class Codes: G02B 5/285 comprising deposited thin solid films G02B5/281 - G02B5/289 take precedence; multilayered film filters for fibre optic multiplexing G02B6/29361

Abstract

A spectrometer assembly is provided having an optical transmission filter including a stack of continuous, non-patterned alternating dielectric and metal layers. Angle-dependent transmission wavelength shift of the optical transmission filter with continuous metal layers is small e.g. in comparison with multilayer dielectric filters, facilitating size reduction of the spectrometer assembly.

Claims

1. A sensor comprising:

a first signal filter for transmitting a first portion of a signal light at a first signal transmission wavelength, while blocking excitation light,

wherein the first signal filter includes;

a first area including first continuous, non-micro-structured metal layers and first dielectric layers stacked in alternation, and

a second area consisting of a stack of additional dielectric layers, and

wherein an angular sensitivity of the first signal transmission wavelength is less, for the first signal filter, as compared to a signal filter including micro-structured metal layers.

2. The sensor of claim 1, further comprising:

a second signal filter for transmitting a second portion of the signal light at a second signal transmission wavelength, while blocking excitation light,

wherein the second signal filter includes second continuous, non-micro-structured metal layers and second dielectric layers stacked in alternation.

3. The sensor of claim 2, wherein an angular sensitivity of the second signal transmission wavelength is less, for the second signal filter, as compared to the signal filter including micro-structured metal layers.

4. The sensor of claim 1, further comprising:

a scattering filter for transmitting scattered excitation light at a scattering transmission wavelength, while blocking the signal light.

5. The sensor of claim 4, wherein the scattering filter includes second continuous, non-micro-structured metal layers and dielectric layers stacked in alternation.

6. The sensor of claim 1, wherein a total thickness of the first continuous, non-micro-structured metal layers and the first dielectric layers of the first signal filter is less than 5 mm.

7. The sensor of claim 1, wherein a total thickness of the first continuous, non-micro-structured metal layers and the first dielectric layers of the first signal filter is less than 1 mm.

8. The sensor of claim 1, wherein the first continuous, non-micro-structured metal layers are absent a pattern of features smaller than 2 mm.

9. The sensor of claim 1,

wherein each of the first continuous, non-micro-structured metal layers has a tapered edge at a periphery of the first signal filter, and

wherein each tapered edge is protectively covered by one or more of the first dielectric layers.

10. The sensor of claim 1, wherein the signal light comprises a single-photon fluorescence, a multiphoton fluorescence, or an optical harmonic scattering of the excitation light.

11. The sensor of claim 1, wherein the stack of additional dielectric layers increases attenuation of the first signal transmission wavelength.

12. The sensor of claim 1, wherein the non-micro-structured metal layers are sized to exhibit a plasmon resonance effect.

13. A method comprising:

transmitting, using a signal filter, a portion of signal light, emitted from a sample, at a signal transmission wavelength,

wherein the signal filter includes;

a first area including continuous, non-micro-structured metal layers and dielectric layers stacked in alternation, and

a second area consisting of a stack of additional dielectric layers.

14. The method of claim 13, wherein the stack of additional dielectric layers increases attenuation of the signal transmission wavelength.

15. The method of claim 13, wherein the non-micro-structured metal layers do not include a pattern of features.

16. The method of claim 13, wherein the continuous, non-micro-structured metal layers are sized to exhibit a plasmon resonance effect.

17. The method of claim 13, wherein an angular sensitivity of the signal transmission wavelength is less, for the signal filter, as compared to another signal filter that includes micro-structured metal layers.

18. The method of claim 13, further comprising:

collecting the portion of the signal light at a collection angle of at least 60 degrees; and

detecting an electrical signal, based on the portion of the signal light, provided by a photodetector.

19. The method of claim 18, wherein the collection angle is at least 150 degrees.

20. A sensor comprising:

a transmission optical filter including;

a first area including continuous, non-microstructured metal layers and dielectric layers stacked in alternation, and

a second area consisting of a stack of additional dielectric layers,

wherein the transmission optical filter discriminates between an excitation wavelength and a signal wavelength, and

wherein an angular dependence of a transmission wavelength of the transmission optical filter is less than another angular dependence of another transmission wavelength of another transmission optical filter that includes micro-structured metal layers.