Testing system and method
First Claim
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1. An automated test platform for testing at least one device under test, the automated test platform comprising:
- a test head configured to receive the at least one device under test;
a processing system configured to;
provide a voltage signal having a plurality of voltages to the at least one device under test, wherein the voltage signal having the plurality of voltages is a temporally-defined voltage signal having a plurality of voltages, wherein an amplitude and a duration are defined for each of the plurality of voltages,monitor a current flow into the at least one device under test during each of the plurality of voltages, thus generating a plurality of monitored current values that correspond to the plurality of voltages, andstore the plurality of monitored current values.
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Abstract
A method, computer program product, computing system, and an automated test platform for testing at least one device under test includes a test head configured to receive the at least one device under test. A processing system is configured to: provide a voltage signal having a plurality of voltages to the at least one device under test, and monitor a current flow into the at least one device under test during each of the plurality of voltages, thus generating a plurality of monitored current values that correspond to the plurality of voltages. The plurality of monitored current values are stored.
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Citations
16 Claims
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1. An automated test platform for testing at least one device under test, the automated test platform comprising:
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a test head configured to receive the at least one device under test; a processing system configured to; provide a voltage signal having a plurality of voltages to the at least one device under test, wherein the voltage signal having the plurality of voltages is a temporally-defined voltage signal having a plurality of voltages, wherein an amplitude and a duration are defined for each of the plurality of voltages, monitor a current flow into the at least one device under test during each of the plurality of voltages, thus generating a plurality of monitored current values that correspond to the plurality of voltages, and store the plurality of monitored current values. - View Dependent Claims (2, 3, 4, 5, 6, 7, 8, 9, 10)
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11. A computer-implemented method, executed on a computing device, the computer-implemented method comprising:
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providing a voltage signal having a plurality of voltages to at least one device under test, wherein the voltage signal having the plurality of voltages is a temporally-defined voltage signal having a plurality of voltages, wherein an amplitude and a duration are defined for each of the plurality of voltages, monitoring a current flow into the at least one device under test during each of the plurality of voltages, thus generating a plurality of monitored current values that correspond to the plurality of voltages, and storing the plurality of monitored current values. - View Dependent Claims (12)
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13. A computing system including a processor and memory configured to perform operations comprising:
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providing a voltage signal having a plurality of voltages to at least one device under test, wherein the voltage signal having the plurality of voltages is a temporally-defined voltage signal having a plurality of voltages, wherein an amplitude and a duration are defined for each of the plurality of voltages, monitoring a current flow into the at least one device under test during each of the plurality of voltages, thus generating a plurality of monitored current values that correspond to the plurality of voltages, and storing the plurality of monitored current values. - View Dependent Claims (14)
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15. An apparatus comprising:
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means for providing a voltage signal having a plurality of voltages to at least one device under test, wherein the voltage signal having the plurality of voltages is a temporally-defined voltage signal having a plurality of voltages, wherein an amplitude and a duration are defined for each of the plurality of voltages, means for monitoring a current flow into the at least one device under test during each of the plurality of voltages, thus generating a plurality of monitored current values that correspond to the plurality of voltages, and means for storing the plurality of monitored current values. - View Dependent Claims (16)
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Specification