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Testing system and method

  • US 10,379,154 B2
  • Filed: 09/13/2017
  • Issued: 08/13/2019
  • Est. Priority Date: 09/16/2016
  • Status: Active Grant
First Claim
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1. An automated test platform for testing at least one device under test, the automated test platform comprising:

  • a test head configured to receive the at least one device under test;

    a processing system configured to;

    provide a voltage signal having a plurality of voltages to the at least one device under test, wherein the voltage signal having the plurality of voltages is a temporally-defined voltage signal having a plurality of voltages, wherein an amplitude and a duration are defined for each of the plurality of voltages,monitor a current flow into the at least one device under test during each of the plurality of voltages, thus generating a plurality of monitored current values that correspond to the plurality of voltages, andstore the plurality of monitored current values.

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