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Memory apparatus for in-chip error correction

  • US 10,379,939 B2
  • Filed: 03/27/2017
  • Issued: 08/13/2019
  • Est. Priority Date: 01/04/2017
  • Status: Active Grant
First Claim
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1. A method of reducing access latency and improving data integrity by performing memory deduplication and single error correction double error detection (SEC-DED) in a computer memory, the method comprising:

  • reading, by a processor on a memory chip, data from an array of memory chips;

    calculating, by the processor, one or more hashes based on the data;

    checking, by the processor, the one or more hashes against a physical line ID hash to determine whether the one or more hashes matches the physical line ID hash;

    detecting, by the processor, an error based on the one or more hashes being different from the physical line ID hash;

    correcting, by the processor, the error by sequentially flipping a data value of each bit, for up to all bits, of the array of the memory chips by performing a write operation using error-correcting code (ECC) to generate changed data until no error is detected;

    after flipping the data value of a respective bit of the bits, calculating, by the processor, at least one hash based on the changed data, and comparing the at least one hash based on the changed data against the physical line ID hash to determine whether the at least one hash matches the physical line ID hash;

    accepting, by the processor, the changed data as corrected data when the at least one hash matches the physical line ID hash; and

    outputting, by the processor, the corrected data.

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