Distributed run-time auto-calculation of measurement uncertainty

• US 10,394,643 B2
• Filed: 08/16/2017
• Issued: 08/27/2019
• Est. Priority Date: 08/16/2017
• Status: Active Grant

• Current Assignee: National Instruments Corporation (Emerson Electric Company)
• Original Assignee: National Instruments Corporation (Emerson Electric Company)
• Inventors: Hamner, Robert W.
• Primary Examiner(s): Lottich, Joshua P
• Application Number:
  US15/678,929
• Publication Number:
  US 20190056982A1
• Time in Patent Office: 741 Days
• CPC Class Codes: G06F 11/0769 Readable error formats, e.g. cross-platform generic formats, human understandable formats
• CPC Class Codes: G06F 11/079 Root cause analysis, i.e. error or fault diagnosis in a hardware test environment G06F11/22; in a software test environment G06F11/36
• CPC Class Codes: G06F 11/0793 Remedial or corrective actions recovery from an exception in an instruction pipeline G06F9/3861; by retry G06F11/1402; for recovering from a failure of a protocol instance or entity H04L69/40

Abstract

System and method for auto-calculating uncertainty of a measurement performed by a measurement device. The measurement device initiates a measurement or measurements. In response to the measurement initiation, a driver of the measurement device sends an error specification request to each of a plurality of hardware modules involved in the measurement. Each of the plurality of hardware modules determines the requested error specifications based on a current configuration of the respective hardware module. The measurement device then calculates an uncertainty associated with the measurement or measurements based on the error specifications.

Claims

1. A measurement device comprising:

a plurality of hardware modules coupled to a measurement controller; and

a processor coupled to the plurality of hardware modules, wherein the processor is configured to execute program instructions of a driver;

wherein the measurement controller is configured to initiate a measurement by the plurality of hardware modules;

wherein execution of the program instructions cause the processor to request one or more error specifications from each of the plurality of hardware modules;

wherein each of the plurality of hardware modules are configured to;

determine the respective one or more error specifications based on a current configuration of the respective hardware module; and

transmit the determined error specifications to the processor; and

wherein execution of the program instructions further cause the processor to determine an uncertainty in the measurement based on the error specifications.

2. The measurement device of claim 1,

wherein the requests for one or more error specifications specify at least one of a type of error and a unit of error.

3. The measurement device of claim 1,

wherein the plurality of hardware modules are configured to utilize a look-up table to determine the respective one or more error specifications based on their current configuration.

4. The measurement device of claim 1,

wherein the error specifications comprise one or more of:

instrument specifications;

or

combinations of two or more instrument specifications.

5. The measurement device of claim 4,

wherein the instrument specifications comprise one or more of an accuracy specification, a precision specification, a voltage standing wave ratio (VSWR) specification, or an attenuation specification;

and

wherein the combinations of two or more error specifications comprise a mismatch uncertainty.

6. The measurement device of claim 1,

wherein one or more of the plurality of hardware modules is a composite hardware module comprising a plurality of electronic devices.

7. The measurement device of claim 1,

wherein the processor requests one or more error specifications from the plurality of hardware modules by sending request messages, wherein the processor is configured to send the same type of request message to each of the plurality of hardware modules.

8. The measurement device of claim 1, wherein the measurement device comprises one or more of:

a standalone instrument;

a hardware module in a chassis;

a chassis with a plurality of hardware modules;

or

a device comprising;

a software component, executable on a host computer; and

a hardware component, coupled to the host computer.

9. A computer-implemented method for calculating uncertainty in a measurement device, the method comprising:

initiating, by the measurement device, a measurement;

in response to initiating the measurement, automatically requesting one or more error specifications from each of a plurality of hardware modules of the measurement device that are involved in the measurement;

determining, by each of the plurality of hardware modules, the respective one or more error specifications based on a current configuration of the respective hardware module;

determining an uncertainty in the measurement based on the error specifications.

10. The computer-implemented method of claim 9,

wherein the one or more error specifications are requested from the plurality of hardware modules by utilizing a respective plurality of request messages, wherein the same type of request message is utilized for each of the plurality of hardware modules.

11. The computer-implemented method of claim 9,

wherein the requests for one or more error specifications specify at least one of a type of error and a unit of error.

12. The computer-implemented method of claim 9,

wherein the error specifications comprise one or more of:

instrument specifications;

or

combinations of two or more instrument specifications.

13. The computer-implemented method of claim 12,

wherein the instrument specifications comprise one or more of an accuracy specification, a precision specification, a voltage standing wave ratio (VSWR) specification, or an attenuation specification;

and

wherein the combinations of two or more error specifications comprise a mismatch uncertainty.

14. The computer-implemented method of claim 9,

wherein the determining the uncertainty is further based on one or more of:

an uncertainty distribution;

a number of degrees of freedom of the measurement;

or

a sensitivity of the measurement.

15. The computer-implemented method of claim 9, wherein the measurement device comprises one or more of:

a standalone instrument;

a chassis comprising the plurality of hardware modules;

or

a device comprising;

a software component, executable on a host computer; and

a hardware component, coupled to the host computer.

16. A non-transitory computer accessible memory medium that stores program instructions executable by a processor included in a measurement device to:

receive a notification that a measurement has been initiated;

in response to receiving the notification, automatically request one or more error specifications from each of a plurality of hardware modules of the measurement device, wherein the plurality of hardware modules are involved in the measurement;

receive the one or more error specifications from each of the plurality of hardware modules, wherein each one or more error specification is based on a current configuration of the respective hardware module; and

determine an uncertainty in the measurement based on the error specifications.

17. The non-transitory computer accessible memory medium of claim 16,

wherein the program instructions are further executable to request one or more error specifications from the plurality of hardware modules by sending request messages, wherein the same type of request message is sent to each of the plurality of hardware modules, and wherein the request message specifies at least one of a type of error and a unit of error.

18. The non-transitory computer accessible memory medium of claim 16,

wherein the notification that the measurement has been initiated specifies the type of measurement that has been initiated;

wherein the program instructions are further executable to cause the processor to identify, based on the notification, the plurality of hardware modules from which to request the error specifications.

19. The non-transitory computer accessible memory medium of claim 16,

wherein the error specifications comprise one or more of:

instrument specifications;

or

combinations of two or more instrument specifications.

20. The non-transitory computer accessible memory medium of claim 16, wherein the measurement device comprises one or more of:

a standalone instrument;

a chassis comprising the plurality of hardware modules;

or

a device comprising;

a software component, executable on a host computer; and

a hardware component, coupled to the host computer.