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Tool to provide integrated circuit masks with accurate dimensional compensation of patterns

  • US 10,394,984 B2
  • Filed: 11/04/2016
  • Issued: 08/27/2019
  • Est. Priority Date: 11/25/2015
  • Status: Active Grant
First Claim
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1. A tool configured to process input data, comprising:

  • an input to receive input data representing integrated circuit shapes within separate mask regions of a semiconductor fabrication mask for use in optical lithography; and

    an output to provide output data representing a mask in which dimensions of mask shapes are compensated on the basis of image content in the vicinity of each mask shape when the mask is projected during optical lithography;

    the tool being configured to match a partially coherent lithographic image by superposing a sum of images from a set of coherent systems and a sum of images from a set of loxicoherent systems, where the loxicoherent systems include a compound system comprised of a paired coherent system and an incoherent system that act in sequence, with an output of the coherent system being input as a self-luminous quantity to the incoherent system of the pair, and with the output of the incoherent system being an output of the loxicoherent system.

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