System and methods for extracting correlation curves for an organic light emitting device

• US 10,395,574 B2
• Filed: 06/25/2018
• Issued: 08/27/2019
• Est. Priority Date: 02/04/2010
• Status: Active Grant

• Current Assignee: IGNIS Innovation Incorporated
• Original Assignee: IGNIS Innovation Incorporated
• Inventors: Chaji, Gholamreza, Jaffari, Javid, Nathan, Arokia
• Primary Examiner(s): Desta, Elias
• Application Number:
  US16/017,355
• Publication Number:
  US 20180308405A1
• Time in Patent Office: 428 Days
• CPC Class Codes: G09G 2300/0413 Details of dummy pixels or dummy lines in flat panels
• CPC Class Codes: G09G 2320/0285 using tables for spatial correction of display data
• CPC Class Codes: G09G 2320/029 by monitoring one or more pixels in the display panel, e.g. by monitoring a fixed reference pixel
• CPC Class Codes: G09G 2320/043 Preventing or counteracting the effects of ageing
• CPC Class Codes: G09G 2320/045 Compensation of drifts in the characteristics of light emitting or modulating elements
• CPC Class Codes: G09G 2360/145 the light originating from the display screen
• CPC Class Codes: G09G 3/006 Electronic inspection or testing of displays and display drivers, e.g. of LED or LCD displays testing individual LED's G01R31/2635; testing lamps G01R31/44; testing of optical features of LCD displays G02F1/1309
• CPC Class Codes: G09G 3/32 semiconductive, e.g. using light-emitting diodes [LED]
• CPC Class Codes: G09G 3/3258 with pixel circuitry controlling the voltage across the light-emitting element
• CPC Class Codes: G09G 3/3291 in which the data driver supplies a variable data voltage for setting the current through, or the voltage across, the light-emitting elements

Abstract

A system and method for determining and applying characterization correlation curves for aging effects on an organic light organic light emitting device (OLED) based pixel is disclosed. A first stress condition is applied to a reference pixel having a drive transistor and an OLED. An output voltage based on a reference current is measured periodically to determine an electrical characteristic of the reference pixel under the first predetermined stress condition. The luminance of the reference pixel is measured periodically to determine an optical characteristic of the reference pixel. A characterization correlation curve corresponding to the first stress condition including the determined electrical and optical characteristic of the reference pixel is stored. Characterization correlation curves for other predetermined stress conditions are also stored based on application of the predetermined stress conditions on other reference pixels. The stress condition of an active pixel is determined and a compensation voltage is determined by correlating the stress condition of the active pixel with the curves of the predetermined stress conditions.

Claims

1. A method for compensating of aging effects in a display system comprising a plurality of organic light emitting diode (OLED) based pixels configured to display images, the method comprising:

storing, in a computer-readable non-transitory memory device, a characterization correlation curve for a stress condition said characterization correlation curve obtained using a reference device;

determining a stress condition on a pixel of the OLED based pixels resulting from operation of the display system;

determining a compensation factor based on the determined stress condition and the characterization correlation curve of the stress condition; and

adjusting a programming of the pixel based on the compensation factor.

2. The method of claim 1 comprising obtaining the characterization correlation curve during normal operation of the display system.

3. The method of claim 1 wherein obtaining the characterization correlation curve comprises a use of the reference device that is not part of the plurality of OLED based pixels configured to display images.

4. The method of claim 1 comprising:

determining a baseline optical characteristic and/or a baseline electrical characteristic for the reference device for the stress condition,

repeatedly measuring at least one of;

an output voltage to determine an electrical characteristic of the reference device, and the luminance of the reference device to determine an optical characteristic of the reference device;

determining the characterization correlation curve corresponding to the stress condition based on the baseline electrical and/or optical characteristics and the determined electrical and/or optical characteristics of the reference device; and

storing the characterization correlation curve corresponding to the stress condition.

5. The method of claim 1 comprising:

performing periodic measurements on the reference device under the stress condition to determine at least one of electrical and optical characteristics thereof, and

determining the characterization correlation curve based on the determined at least one of the electrical and optical characteristics of the reference device and at least one of the baseline electrical and optical characteristics for the stress condition.

6. The method of claim 5 wherein the reference device comprises a reference pixel comprising an OLED and a drive transistor, wherein the baseline electrical characteristic is determined from measuring a property of the drive transistor and the OLED of the reference pixel.

7. The method of claim 6 further comprising:

applying the stress condition to the reference pixel;

repeatedly measuring an output voltage based on a reference current to determine an electrical characteristic of the reference pixel;

repeatedly measuring the luminance of the reference pixel to determine an optical characteristic of the reference pixel; and

determining the characterization correlation curve with use of the electrical and optical characteristic of the reference pixel.

8. The method of claim 6 comprising using the reference pixel that is not part of the plurality of OLED based pixels for displaying an image.

9. The method of claim 5 wherein the baseline optical characteristic and/or the baseline electrical characteristic for the reference device are determined from measurements of a base device.

10. The method of claim 5, wherein the baseline optical characteristic and/or the baseline electrical characteristic for the reference device are determined from measurements of the reference device soon after fabrication thereof while they do not exhibit the aging effects.

11. The method of claim 4, wherein the luminance characteristic is measured by a photo sensor disposed in proximity to the reference device.

12. A display system configured for compensating of aging effects, comprising:

a plurality of pixels configured to display images, each said pixel comprising an organic light emitting diode (OLED);

a memory configured to store a characterization correlation curve for a pixel stress condition; and

a controller coupled to the plurality of pixels, the controller configured to determine a stress condition on a pixel of the plurality of pixels, and to determine a compensation factor for a programming based on the characterization correlation curve.

13. The display system of claim 12 further comprising a reference device configured for determining the characterization correlation curve.

14. The display system of claim 13 wherein the reference device is not part of the plurality of pixels configured to display images.

15. The display system of claim 14 wherein the reference device comprises a reference pixel comprising an OLED and a drive transistor.

16. The display system of claim 15 including a photo sensor optically coupled to the OLED of the reference pixel and configured to measure the luminance thereof.

17. A method for compensating of aging effects in a display system comprising a plurality of organic light emitting diode (OLED) based pixels configured to display images, the method comprising:

performing measurements on a reference device under a reference stress condition to obtain a characterization correlation curve, wherein the reference device is not part of the plurality of OLED based pixels configured to display images;

determining a stress condition on a pixel of the OLED pixels resulting from displaying images during operation of the display system,

determining a compensation factor to apply to a programming of the pixel based on the characterization correlation curve, and

adjusting the programming of the pixel based on the compensation factor.