System and method for identifying materials using a THz spectral fingerprint in a media with high water content
First Claim
Patent Images
1. A system to detect a material, comprising:
- a pulse generator to generate a terahertz pulse to excite molecules in the material and induce coherent bleaching to allow the terahertz pulse to penetrate to depths in the material and to cause a reflected pulse having spectral components in the terahertz region to be generated, wherein the characteristics of the reflected pulse are dependent upon the properties of the material being illuminated;
an antenna/diode detector array comprising a plurality of antenna/diode detector sensors tuned to detect terahertz frequencies in the reflected pulse;
a processor to perform statistical analysis and signal processing on the detected terahertz frequencies to particularly identify the detected frequencies; and
a database of frequencies and corresponding materials to which the identified frequencies are compared to identify the material.
2 Assignments
0 Petitions
Accused Products
Abstract
A material detector includes a pulse generator to generate pulses to excite molecules in the material and a detector to detect a signal generated from excited molecules in the terahertz region. Spectral features in the material are analyzed to identify the material. Detection can be performed using a nanoantenna array structure having antennas tuned to detect the expected spectral emission. The nanoantenna array can include antennas having MIM or MIIM diodes. Signal processing and statistical analysis is use to reduce false positives and false negative in identifying the material.
-
Citations
15 Claims
-
1. A system to detect a material, comprising:
-
a pulse generator to generate a terahertz pulse to excite molecules in the material and induce coherent bleaching to allow the terahertz pulse to penetrate to depths in the material and to cause a reflected pulse having spectral components in the terahertz region to be generated, wherein the characteristics of the reflected pulse are dependent upon the properties of the material being illuminated; an antenna/diode detector array comprising a plurality of antenna/diode detector sensors tuned to detect terahertz frequencies in the reflected pulse; a processor to perform statistical analysis and signal processing on the detected terahertz frequencies to particularly identify the detected frequencies; and a database of frequencies and corresponding materials to which the identified frequencies are compared to identify the material. - View Dependent Claims (2, 3, 4, 5, 6, 7, 8, 9)
-
-
10. A method for detecting a material, comprising:
-
generating a terahertz pulse to excite molecules in the material and to induce coherent bleaching to allow the terahertz pulse to penetrate to depths in the material and to cause a reflected pulse having spectral components in the terahertz region to be generated, wherein the characteristics of the reflected pulse are dependent upon the properties of the material being illuminated; detecting the reflected pulse with an antenna/diode detector array comprising a plurality of antenna/diode detector sensors tuned to detect terahertz frequencies in the reflected pulse; performing statistical analysis and signal processing on the detected terahertz frequencies to particularly identify the detected frequencies; and comparing the identified frequencies to frequencies in a database of frequencies and corresponding materials to identify the material. - View Dependent Claims (11, 12, 13, 14, 15)
-
Specification