Semiconductor memory device and method of operating the same
First Claim
1. A semiconductor memory device comprising:
- a plurality of pages each comprising a plurality of memory cells;
peripheral circuits configured to perform a program operation on a selected page among the plurality of pages; and
a control logic configured to control the peripheral circuits such that a main program operation is performed on the selected page, and a compensation program voltage is applied to a word line coupled to the selected page to compensate threshold voltages of memory cells to be programmed to a highest program state after the main program operation is completed,wherein the compensation program voltage is a positive voltage lower than a highest program voltage among program voltages used in the main program operation.
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Accused Products
Abstract
Provided herein may be a semiconductor memory device and a method of operating the same. The semiconductor memory device may include a plurality of pages each including a plurality of memory cells, peripheral circuits configured to perform a program operation of a selected page among the plurality of pages and a control logic configured to control the peripheral circuits such that a main program operation is performed on the selected page and, when the main program operation is completed, a compensation program operation is performed on memory cells having lower threshold voltage retention characteristics compared to remaining memory cells, among the memory cells included in the selected page.
2 Citations
17 Claims
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1. A semiconductor memory device comprising:
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a plurality of pages each comprising a plurality of memory cells; peripheral circuits configured to perform a program operation on a selected page among the plurality of pages; and a control logic configured to control the peripheral circuits such that a main program operation is performed on the selected page, and a compensation program voltage is applied to a word line coupled to the selected page to compensate threshold voltages of memory cells to be programmed to a highest program state after the main program operation is completed, wherein the compensation program voltage is a positive voltage lower than a highest program voltage among program voltages used in the main program operation. - View Dependent Claims (2, 3, 4, 5, 6, 7)
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8. A method of operating a semiconductor memory device, comprising:
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performing a main program operation on a selected page, wherein the main program operation includes a plurality of program loops comprising applying a program voltage to a word line coupled to the selected page and performing a verify operation of the selected page; and performing a compensation program operation on memory cells programmed to a most significant program state among memory cells included in the selected page, when the verify operation passes and the main program operation is completed, wherein the compensation program operation is performed by applying a compensation program voltage to the word line, and wherein the compensation program voltage is a positive voltage lower than a highest program voltage which is used when the verify operation passes. - View Dependent Claims (9, 10, 11, 12)
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13. A method of operating a semiconductor memory device, comprising:
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inputting external data to first latches of page buffers; transmitting the external data to second latches and third latches of the page buffers; performing a main program operation and a verify operation on a selected page using data transmitted to the third latches; retransmitting data stored in the second latches to the third latches if the verify operation has passed; adjusting voltages of bit lines using the data retransmitted to the third latches; and applying a compensation program voltage to a word line coupled to the selected page. - View Dependent Claims (14, 15, 16, 17)
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Specification