Systems and methods for testing for a gas leak through a gas flow component

• US 10,408,763 B2
• Filed: 01/29/2016
• Issued: 09/10/2019
• Est. Priority Date: 01/30/2015
• Status: Active Grant

• Current Assignee: Mécanique Analytique, Inc
• Original Assignee: Mécanique Analytique, Inc
• Inventors: Gamache, Yves
• Primary Examiner(s): Ha, Nguyen Q.
• Application Number:
  US15/545,974
• Publication Number:
  US 20180003641A1
• Time in Patent Office: 1,320 Days
• CPC Class Codes: G01M 3/20 using special tracer materials, e.g. dye, fluorescent material, radioactive material
• CPC Class Codes: G01M 3/38 by using light G01M3/02 takes precedence
• CPC Class Codes: G01N 21/73 using plasma burners or torches

Abstract

Methods and systems of testing for a gas leak between an inlet zone and an outlet zone of a gas flow component in a shut state are provided. Different tracer and carrier gases are used. The carrier gas is circulated through the outlet zone of the gas flow component to purge the tracer gas from this outlet zone. A spectroscopic emission from the carrier gas indicative of an amount of the purged tracer gas is monitored. A test flow of the tracer gas is introduced in the inlet zone of the gas flow component, and the inlet pressure is increased for successive pressure increments. The presence of a gas leak is determined upon detecting an intensity step variation in the monitored spectroscopic emission following one of the pressure increments in the inlet pressure.

Claims

1. A method of testing for a gas leak between an inlet zone and an outlet zone of a gas flow component in a shut state, the method using a tracer gas and a carrier gas different from the tracer gas, the method comprising:

circulating the carrier gas through the outlet zone of the gas flow component to purge the tracer gas from said outlet zone;

monitoring, using a plasma emission detector downstream of the outlet zone, a spectroscopic emission from the carrier gas indicative of an amount of the tracer gas purged from the outlet zone;

upon said monitoring indicating that a residual amount of said tracer gas has been purged from the outlet zone, introducing a test flow of the tracer gas in the inlet zone of the gas flow component;

increasing an inlet pressure of the gas flow component for at least one pressure increment; and

determining a presence of a gas leak between the inlet zone and outlet zone of the gas flow component upon detecting a step variation in the monitored spectroscopic emission following one of said pressure increments in the inlet pressure.

2. The method of claim 1, comprising a preliminary step of pre-purging the outlet zone of atmospheric air.

3. The method of claim 1, wherein the carrier gas consist of argon and the tracer gas consist of nitrogen.

4. The method of claim 1, wherein the carrier gas consist of helium and the tracer gas consist of argon.

5. The method of claim 1, wherein the step of monitoring the spectroscopic emission comprises displaying, as a function of time, an intensity of a spectroscopic emission signal representative of said monitored spectroscopic emission on a normalized intensity scale.

6. The method of claim 5, comprising a step of re-scaling the spectroscopic emission signal upon said monitoring indicating that the residual amount of said tracer gas has been purged from the outlet zone.

7. The method of claim 1, wherein the step of monitoring the spectroscopic emission comprises parallelly monitoring the spectroscopic emission at a first wavelength and at a second wavelength respectively sensitive to a first range and a second range of the tracer gas concentration in the outlet zone of the component.

8. The method of claim 1, comprising recycling the carrier gas to the outlet zone after monitoring the spectroscopic emission.

9. A leak testing system for testing for a gas leak between an inlet zone and an outlet zone of a gas flow component in a shut state using a tracer gas and a carrier gas different from the tracer gas, the system comprising:

a pressurizing unit connectable to the gas flow component so as to be in fluid communication with the inlet zone of the gas flow component, the pressurizing unit being configured to be fed with the tracer gas and to deliver a test flow of said tracer gas into the inlet zone of the gas flow component, the pressurizing unit being operable to increase an inlet pressure of the gas flow component for successive pressure increments;

a carrier gas flow control assembly connectable to the gas flow component so as to be in bidirectional fluid communication with the outlet zone of the gas flow component, the carrier gas flow control assembly being configured to receive an input carrier gas flow and circulate the same through the outlet zone of the gas flow component to purge the tracer gas from said outlet zone, resulting in an output carrier gas flow;

a monitoring device connectable to the carrier gas flow control assembly so as to receive the output carrier gas flow, the monitoring device comprising a plasma emission detector and being configured to monitor a spectroscopic emission from the output carrier gas flow indicative of an amount of the tracer gas purged from the outlet zone; and

a processing device in communication with the monitoring device to receive the monitored spectroscopic emission therefrom, the processing device being configured to allow a determination of a presence of a gas leak between the inlet zone and outlet zone of the gas flow component upon detecting an intensity variation pattern in the monitored spectroscopic emission following one of said pressure increments in the inlet pressure.

10. The system of claim 9, comprising a sieving assembly operable to sieve the output carrier gas flow upstream of the monitoring device, the sieving assembly comprising at least one of a moisture trap and a hydrocarbon trap.

11. The system of claim 9, further comprising a moisture doping device operable to provide a doping amount of water to the output carrier gas flow upstream of the monitoring device.

12. The system of claim 9, wherein the pressurizing unit comprises a pressure transducer for measuring the inlet pressure and a high pressure electronic pressure controller for varying the inlet pressure.

13. The system of claim 9, wherein the carrier gas flow control assembly is switchable between:

an open position for venting the output carrier gas flow to the atmosphere, and

a closed position for guiding the output carrier gas flow to the monitoring device.

14. The system of claim 9, wherein the processing device comprises a first signal processing channel and a second signal processing channel, respectively configured to monitor the spectroscopic emission at a first wavelength and at a second wavelength respectively sensitive to a first range and a second range of the tracer gas concentration in the outlet zone of the component.

15. The system of claim 9, further comprising a gas recycling assembly downstream of the monitoring device, to recycle at least a part of the carrier gas from the monitoring device to the outlet zone of the gas flow component.

16. The system of claim 9, wherein the monitoring device further comprises a photodiode transforming light emitted by a plasma within the Plasma Emission Detector into a proportional analog or digital signal.

17. A method of testing for a gas leak between an inlet zone and an outlet zone of a gas flow component in a shut state, the method using a tracer gas and a carrier gas different from the tracer gas, the method comprising:

exposing the inlet zone of the gas flow component to the tracer gas;

circulating the carrier gas through the outlet zone of the gas flow component to purge the tracer gas from said outlet zone according to a constant volume flow rate;

monitoring, using a plasma emission detector downstream of the outlet zone, a spectroscopic emission from the carrier gas indicative of an amount of the tracer gas purged from the outlet zone;

upon said monitoring indicating that a residual amount of said tracer gas has been purged from the outlet zone, decreasing the volume flow rate of the carrier gas for at least one flow rate decrement; and

determining a presence of a gas leak between the inlet zone and outlet zone of the gas flow component upon detecting a step in the monitored spectroscopic emission following one of said volume flow rate decrement.

18. The method of claim 17, comprising a preliminary step of pre-purging the outlet zone of atmospheric air.

19. The method of claim 17, wherein the tracer gas consist of nitrogen and the step of exposing the inlet zone of the gas flow component to the tracer gas comprises exposing said inlet zone to ambient air.

20. The method of claim 19, wherein the carrier gas consists of argon.

21. The method of claim 17, wherein the step of monitoring the spectroscopic emission comprises displaying, as a function of time, an intensity of a spectroscopic emission signal representative of said monitored spectroscopic emission on a normalized intensity scale.

22. The method of claim 21, comprising a step of re-scaling the spectroscopic emission signal prior to said at least one flow rate decrement.

23. The method of claim 17, wherein the step of monitoring the spectroscopic emission comprises parallelly monitoring the spectroscopic emission at a first wavelength and at a second wavelength respectively sensitive to a first range and a second range of the tracer gas concentration in the outlet zone of the component.

24. The method of claim 17, comprising recycling the carrier gas to the outlet zone after monitoring the spectroscopic emission.

25. A method of testing for a gas leak between an inlet zone and an outlet zone of a gas flow component in a shut state, the method using a tracer gas and a carrier gas different from the tracer gas, the method comprising:

circulating the carrier gas through the outlet zone of the gas flow component to purge the tracer gas from said outlet zone;

exposing the inlet zone of the gas flow component to the tracer gas;

parallelly monitoring, using a plasma emission detector downstream of the outlet zone, a spectroscopic emission from the carrier gas indicative of an amount of the tracer gas purged from the outlet zone at a first wavelength and at a second wavelength respectively sensitive to a first range and a second range of the tracer gas concentration in the outlet zone of the component.

26. The method of claim 25, wherein the carrier gas consists of argon and the tracer gas consists of nitrogen.

27. The method of claim 25, wherein the tracer gas is nitrogen, and wherein the first and second wavelengths are selected from nitrogen spectroscopic lines at 337.1 nm, 391.0 nm.

28. The method of claim 25, wherein the carrier gas consists of helium and the tracer gas consists of argon.

29. The method of claim 25, wherein the step of monitoring the spectroscopic emission comprises displaying, as a function of time, an intensity of a spectroscopic emission signal representative of said monitored spectroscopic emission at each of the first and second wavelengths on a corresponding normalized intensity scale.