Fast scan detection method

• US 10,408,938 B2
• Filed: 06/12/2017
• Issued: 09/10/2019
• Est. Priority Date: 08/29/2016
• Status: Active Grant

• Current Assignee: Benewake (Beijing) Tech. Co.,Ltd.
• Original Assignee: Benewake (Beijing) Tech. Co.,Ltd.
• Inventors: Zheng, Kai, Wang, Rui, Li, Yuan
• Primary Examiner(s): Bryant, Michael C
• Application Number:
  US15/620,691
• Publication Number:
  US 20180059244A1
• Time in Patent Office: 820 Days
• CPC Class Codes: G01S 17/08 for measuring distance only indirect measurement G01S17/46; active triangulation systems G01S17/48
• CPC Class Codes: G01S 17/42 Simultaneous measurement of distance and other co-ordinates indirect measurement G01S17/46
• CPC Class Codes: G01S 17/89 for mapping or imaging
• CPC Class Codes: G01S 7/4813 Housing arrangements
• CPC Class Codes: G01S 7/4817 relating to scanning

Abstract

A fast scan detection method is provided. The fast scan detection method is applied to a rotatable scan detection device where two or more detection samplings are performed for calculating each scan detection distance value, where each of the detection samplings includes: emitting, by an emission light source, infrared detection light, where the infrared detection light propagates through a surrounding space and is reflected by a detected object when the infrared detection light encounters the detected object; and receiving, by a photoelectric sensor in a reception unit, the infrared detection light reflected by the detected object, where the rotatable scan detection device performs one detection sampling at each detection angular position at which the rotatable scan detection device is positioned.

Claims

1. A scan detection method applied to a rotatable scan detection device, wherein the rotatable scan detection device comprises a plurality of photoelectric sensors which are arranged in M rows and N columns, M being greater than or equal to 1, N being greater than or equal to 2, the N columns constitute F groups, F being greater than or equal to 2, and each group comprises at least one column,

wherein the method comprises:

performing one infrared light detection sampling to a same region of a detected object by each of the F groups of the plurality of photoelectric sensors in sequence by rotating the rotatable scan detection device to F different detection angular positions, to acquire infrared light detection sampling data of the same region of the detected object, wherein at each of the F detection angular positions, the one infrared light detection sampling is performed, and the infrared light detection sampling data comprise magnitudes of F detection sampling signals respectively having F different phases and respectively received by the F groups of the plurality of photoelectric sensors, wherein the F detection sampling signals are in one-to-one correspondence with the F detection angular positions; and

calculating a scan detection distance value between the rotatable scan detection device and the detected object with the magnitudes of the F detection sampling signals.

2. The scan detection method according to claim 1, comprising:

providing at least one photoelectric sensor in each of the F groups of the plurality of photoelectric sensors.

3. The scan detection method according to claim 1, wherein the performing one infrared light detection sampling to a same region of a detected object by each of the F groups of the plurality of photoelectric sensors in sequence by rotating the rotatable scan detection device to different detection angular positions comprises:

performing one infrared light detection sampling to the same region of the detected object by each of one group of the plurality of photoelectric sensors and another group of the plurality of photoelectric sensors neighboring to the one group of the plurality of photoelectric sensors by rotating the rotatable scan detection device from one detection angular position to another detection angular position neighboring to the one detection angular position in a data processing period between the infrared light detection sampling of the one group and the another group of the plurality of photoelectric sensors, wherein the plurality of photoelectric sensors do not operate in the data processing period.

4. The scan detection method according to claim 1, further comprising:

stitching, by a signal processing unit, scan detection distance values acquired at detection angular positions within 360 degrees, to acquire a three-dimensional data image which covers horizontally 360 degrees and comprises scan detection distance values at M different positions in a vertical direction.

5. The scan detection method according to claim 1, wherein the infrared light detection sampling is based on a Time of Flight method, and F is equal to 4, wherein the step of calculating a scan detection distance value between the rotatable scan detection device and the detected object with the magnitudes of the F detection sampling signals comprises calculating the scan detection distance value according to the following formula:

6. The scan detection method according to claim 5, further comprising:

stitching, by a signal processing unit, scan detection distance values acquired at detection angular positions within 360 degrees, to acquire a three-dimensional data image which covers horizontally 360 degrees and comprises scan detection distance values at M different positions in a vertical direction.

7. The scan detection method according to claim 1, wherein before the performing one infrared light detection sampling to a same region of a detected object by each of the F groups of the plurality of photoelectric sensors by rotating the rotatable scan detection device to different detection angular positions, the method comprises:

arranging photoelectric sensors in each of the N columns in a direction vertical to a horizontal direction in which the rotatable scan detection device rotates.

8. The scan detection method according to claim 1, wherein:

when one of the F groups of the plurality of photoelectric sensors is performing the infrared light detection sampling to the region of the detected object at one detection angular position of the rotatable scan detection device, the other F-1 groups of the plurality of photoelectric sensors at the same time perform infrared light detection samplings on F-1 other regions at the same detection angular position, respectively, and detection sampling signals respectively received by the F groups of the plurality of photoelectric sensors have F mutually different phases.