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Integrated circuit comprising at least an integrated antenna

  • US 10,424,633 B2
  • Filed: 08/02/2018
  • Issued: 09/24/2019
  • Est. Priority Date: 07/28/2011
  • Status: Active Grant
First Claim
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1. A probe card for integrated circuit testing, comprising:

  • a printed circuit support;

    a probe head having a first surface mounted to a surface of the printed circuit support;

    a flexible substrate positioned adjacent to a second surface of the probe head which is opposite the first surface, said flexible substrate including at least one flexible extension which extends beyond an edge of the probe head and includes a bend to make contact with the surface of the printed circuit support;

    wherein the flexible substrate further includes a test antenna configured to support a wireless communications channel with an integrated circuit under test.

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