Apparatus and method for sensing a parameter
First Claim
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1. An apparatus comprising:
- a plurality of sensor elements wherein the sensor elements are configured to be actuated in response to exposure to a parameter and the apparatus is configured to record when each of the sensor elements are actuated wherein;
the plurality of sensor elements comprises at least a first subset of one or more sensor elements and at least a second subset of one or more sensor elements where the first subset of one or more sensor elements is actuated in response to a first level of exposure to a parameter and the second subset of one or more sensor elements is actuated in response to a second level of exposure to a parameter,wherein at least one of the plurality of sensor elements comprise a portion of sensing material and an irreversible memory portion, wherein the portion of sensing material and the irreversible memory portion are connected in a circuit;
wherein the plurality of sensor elements are arranged such that when the exposure to the parameter sensed by the sensing material exceeds a threshold value, a reversible change in conductivity of the sensing material caused by the exposure to the parameter causes an irreversible change in an electrical characteristic of the irreversible memory portion, thereby causing an irreversible change in an electrical characteristic in the circuit.
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Abstract
An apparatus and method comprising: a plurality of sensor elements wherein the sensor elements are configured to be actuated in response to exposure to a parameter and the apparatus is configured to record when each of the sensor elements are actuated wherein: the plurality of sensor elements comprises at least a first subset of sensor elements and at least a second subset of sensor elements where the first subset of sensor elements are actuated in response to a first level of exposure to a parameter and the second subset of sensor elements are actuated in response to a second level of exposure to a parameter.
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Citations
20 Claims
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1. An apparatus comprising:
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a plurality of sensor elements wherein the sensor elements are configured to be actuated in response to exposure to a parameter and the apparatus is configured to record when each of the sensor elements are actuated wherein; the plurality of sensor elements comprises at least a first subset of one or more sensor elements and at least a second subset of one or more sensor elements where the first subset of one or more sensor elements is actuated in response to a first level of exposure to a parameter and the second subset of one or more sensor elements is actuated in response to a second level of exposure to a parameter, wherein at least one of the plurality of sensor elements comprise a portion of sensing material and an irreversible memory portion, wherein the portion of sensing material and the irreversible memory portion are connected in a circuit; wherein the plurality of sensor elements are arranged such that when the exposure to the parameter sensed by the sensing material exceeds a threshold value, a reversible change in conductivity of the sensing material caused by the exposure to the parameter causes an irreversible change in an electrical characteristic of the irreversible memory portion, thereby causing an irreversible change in an electrical characteristic in the circuit. - View Dependent Claims (2, 3, 4, 5, 6, 7, 8, 9, 10, 11)
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12. An identification tag comprising an apparatus, the apparatus comprising:
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a plurality of sensor elements wherein the sensor elements are configured to be actuated in response to exposure to a parameter and the apparatus is configured to record when each of the sensor elements are actuated wherein; the plurality of sensor elements comprises at least a first subset of one or more sensor elements and at least a second subset of one or more sensor elements where the first subset of one or more sensor elements is actuated in response to a first level of exposure to a parameter and the second subset of one or more sensor elements is actuated in response to a second level of exposure to a parameter, wherein at least one of the plurality of sensor elements comprise a portion of sensing material and an irreversible memory portion, wherein the portion of sensing material and the irreversible memory portion are connected in a circuit, wherein the plurality of sensor elements are arranged such that when the exposure to the parameter sensed by the sensing material exceeds a threshold value, a reversible change in conductivity of the sensing material caused by the exposure to the parameter causes an irreversible change in an electrical characteristic of the irreversible memory portion, thereby causing an irreversible change in an electrical characteristic in the circuit. - View Dependent Claims (13, 14, 15, 16)
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17. A method comprising:
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with at least a processor of an electronic device, causing detection of at least one electrical characteristic in a respective circuit of a plurality of circuits, each circuit comprising a respective portion of sensing material coupled to a respective irreversible memory portion; wherein each respective portion of sensing material is comprised by a respective sensor element of a plurality of sensor elements, wherein a reversible change to conductivity of a respective portion of sensing material occurs in response to an exposure to at least a threshold of a parameter, thereby causing a respective irreversible change in the electrical characteristic in the respective circuit. - View Dependent Claims (18, 19, 20)
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Specification