System and method for flip angle determination in magnetic resonance imaging
First Claim
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1. A magnetic resonance imaging (MRI) system comprising:
- an MRI scanner, a control unit, and a processing unit,the processing unit performing operations comprising;
a) selecting an initial condition relating to a first phase of an echo train, the initial condition including initial values of a first flip angle, a last flip angle, and a first characteristic parameter;
b) providing a first function corresponding to the first phase echo train, the first function relating to at least one of the first flip angle, the last flip angle, or the first characteristic parameter;
c) calculating, based on the first function, one or more flip angles corresponding to one or more spin echoes of the first phase;
d) assessing the one or more flip angles of the first phase according to a first criterion; and
e) if the first criterion is not satisfied,revising the first function by adjusting at least one of the first flip angle, the last flip angle, or the first characteristic parameter, and repeating (c) and (d);
wherein the first function provides a flip angle schedule corresponding to the first phase of the echo train for MRI, andthe control unit controlling the MRI scanner according to the flip angle schedule,wherein the first function includes;
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Abstract
A system and method for calculating a flip angle schedule is provided. The technique includes selecting an initial condition, providing a function for calculating flip angles, calculating flip angles, assessing the flip angles, and repeating the calculation of the flip angles by adjusting the function until a desired flip angle schedule is obtained.
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Citations
19 Claims
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1. A magnetic resonance imaging (MRI) system comprising:
- an MRI scanner, a control unit, and a processing unit,
the processing unit performing operations comprising; a) selecting an initial condition relating to a first phase of an echo train, the initial condition including initial values of a first flip angle, a last flip angle, and a first characteristic parameter; b) providing a first function corresponding to the first phase echo train, the first function relating to at least one of the first flip angle, the last flip angle, or the first characteristic parameter; c) calculating, based on the first function, one or more flip angles corresponding to one or more spin echoes of the first phase; d) assessing the one or more flip angles of the first phase according to a first criterion; and e) if the first criterion is not satisfied, revising the first function by adjusting at least one of the first flip angle, the last flip angle, or the first characteristic parameter, and repeating (c) and (d); wherein the first function provides a flip angle schedule corresponding to the first phase of the echo train for MRI, and the control unit controlling the MRI scanner according to the flip angle schedule, wherein the first function includes; - View Dependent Claims (2, 3, 4, 5, 6, 7, 8)
- an MRI scanner, a control unit, and a processing unit,
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9. A method comprising:
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a) selecting an initial condition relating to a first phase of an echo train, the initial condition including initial values of a first flip angle, a last flip angle, and a first characteristic parameter; b) providing a first function corresponding to the first phase of the echo train, the first function relating to at least one of the first flip angle, the last flip angle, or the first characteristic parameter; c) calculating, based on the first function, one or more flip angles corresponding to one or more spin echoes of the first phase; d) assessing the one or more flip angles of the first phase according to a first criterion; and e) if the first criterion is not satisfied, revising the first function by adjusting at least one of the first flip angle, the last lip angle, or the first characteristic parameter, and repeating (c) and (d); wherein the first function provides a flip angle schedule corresponding to the first phase of the echo train for MRI, wherein the first function includes; - View Dependent Claims (10, 11, 12, 13, 14, 15, 16, 17, 18, 19)
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Specification