Retroreflector detectors

• US 10,429,661 B2
• Filed: 08/08/2017
• Issued: 10/01/2019
• Est. Priority Date: 08/08/2017
• Status: Active Grant

• Current Assignee: Sensors Unlimited Inc. (Raytheon Technologies Corporation d/b/a RTX)
• Original Assignee: Sensors Unlimited Inc. (Raytheon Technologies Corporation d/b/a RTX)
• Inventors: Nguyen, Thuc-Uyen
• Primary Examiner(s): Bologna, Dominic J
• Application Number:
  US15/671,539
• Publication Number:
  US 20190049742A1
• Time in Patent Office: 784 Days
• CPC Class Codes: F41G 1/00 Sighting devices for indirect laying of fire F41G3/16; bombsights F41G3/24 ; structurally associated with laser telemeters F41G3/065; mounting tubular or beam shaped aiming devices on firearms F41G11/001
• CPC Class Codes: F41G 1/35 for illuminating the target , e.g. flash lights
• CPC Class Codes: F41G 1/38 Telescopic sights specially adapted for smallarms or ordnance telescopic sights in general G02B; Supports or mountings therefor
• CPC Class Codes: G01B 11/03 by measuring coordinates of points
• CPC Class Codes: G01N 21/55 Specular reflectivity
• CPC Class Codes: G01N 21/78 producing a change of colour
• CPC Class Codes: G02B 27/283 used for beam splitting or combining
• CPC Class Codes: G02B 5/3058 comprising electrically conductive elements, e.g. wire grids, conductive particles
• CPC Class Codes: G02B 6/122 Basic optical elements, e.g. light-guiding paths
• CPC Class Codes: G02B 6/126 using polarisation effects G02B6/1226 takes precedence
• CPC Class Codes: G02B 6/2706 as bulk elements, i.e. free space arrangements external to a light guide, e.g. polarising beam splitters

Abstract

An optics arrangement includes a polarized beam splitter arranged along an collection axis, a first quarter waveplate arranged along the collection axis, and a second quarter waveplate. The second quarter waveplate is arranged along the collection axis and is optically coupled to the first quarter waveplate by the polarized beam splitter to limit return of polarized illumination originating in a scene being illuminated for retroreflector detection. Retroreflector detectors and methods of imaging a scene are also described.

Claims

1. An optics arrangement, comprising:

a polarized beam splitter arranged along an collection axis;

a first quarter waveplate arranged along the collection axis;

a second quarter waveplate arranged along the collection axis, wherein the second quarter waveplate is optically coupled to the first quarter waveplate by the polarized beam splitter to limit return of polarized illumination originating in a scene being illuminated for retroreflector detection; and

a collector arranged along the collection axis, wherein the second quarter waveplate is arranged between the collector and the polarized beam splitter along the collection axis.

2. The optics arrangement as recited in claim 1, further comprising an aperture plate arranged along the collection axis, wherein the first quarter waveplate is arranged between the aperture plate and polarized beam splitter along the collection axis.

3. The optics arrangement as recited in claim 1, further comprising collection optics arranged along the collection axis, wherein the second quarter waveplate is arranged between the collection optics and the polarized beam splitter along the collection axis.

4. The optics arrangement as recited in claim 1, wherein the collector comprises at least one of a camera and a photodiode array.

5. The optics arrangement as recited in claim 1, further comprising source optics arranged along a source axis, wherein the source axis intersects the collection axis within the polarized beam splitter.

6. The optics arrangement as recited in claim 5, wherein the source axis is orthogonal relative to the collection axis.

7. The optics arrangement as recited in claim 5, wherein source optics include at least one of a collimating element and a diverging element.

8. The optics arrangement as recited in claim 1, further comprising an illuminator optically coupled to the polarized beam splitter along a source axis, wherein the source axis intersects the collection axis within the polarized beam splitter.

9. The optics arrangement as recited in claim 8, wherein the illuminator includes a polarized laser optically coupled to the beam splitter along the source axis.

10. The optics arrangement as recited in claim 8, wherein the illuminator includes an optical fiber with an endface, wherein the optical fiber endface is orthogonal or oblique relative to the source axis.

11. The optics arrangement as recited in claim 8, wherein the illuminator is arranged to provide light with a single polarization to the polarized beam splitter along the collection axis.

12. A retroreflector detector, comprising:

an optics arrangement including;

a polarized beam splitter arranged along an collection axis;

a first quarter waveplate arranged along the collection axis;

a second quarter waveplate arranged along the collection axis, wherein the second quarter waveplate is optically coupled to the first quarter waveplate by the polarized beam splitter to limit return of polarized illumination originating in a scene being illuminated for retroreflector detection;

an illuminator arranged along a source axis, wherein the source axis intersects the collection axis within the polarized beam splitter; and

a collector comprising a photodiode array arranged along the collection axis, wherein the second quarter waveplate is arranged between the collector and the polarized beam splitter.

13. The retroreflector detector as recited in claim 12, wherein the source axis is orthogonal relative to the collection axis, wherein source optics include at least one of a collimating element and a diverging element.

14. The retroreflector detector as recited in claim 12, wherein the illuminator includes an optical fiber with an endface, wherein the optical fiber endface is orthogonal or oblique relative to the source axis, and wherein the illuminator is arranged to provide light with a single polarization to the polarized beam splitter along the collection axis.

15. An imaging method, comprising:

receiving polarized illumination;

transmitting the polarized illumination along a collection axis through first and second quarter waveplates optically coupled by a polarized beam splitter, wherein the polarized illumination is received at the first quarter waveplate prior to being transmitted by the polarized beam splitter;

flipping polarization of the polarization of the received illumination during transmission through one of the first and second quarter waveplates; and

receiving broadband illumination through the first quarter waveplate at the polarized beam splitter, and attenuating the broadband illumination with the polarized beam splitter.

16. The method as recited in claim 15, wherein the polarized illumination is received at the polarized beam splitter prior to being transmitted through the first and second quarter waveplates.

17. An imaging method, comprising:

receiving polarized illumination;

transmitting the polarized illumination along a collection axis through first and second quarter waveplates optically coupled by a polarized beam splitter;

flipping polarization of the polarization of the received illumination during transmission through one of the first and second quarter waveplates, wherein the polarized illumination is received at the first quarter waveplate prior to being transmitted by the polarized beam splitter; and

reflecting polarized illumination at an angle oblique relative to the collection axis.