Method of estimating remaining life of solid state drive device

• US 10,430,308 B2
• Filed: 09/18/2017
• Issued: 10/01/2019
• Est. Priority Date: 12/20/2016
• Status: Active Grant

• Current Assignee: Samsung Electronics Co. Ltd.
• Original Assignee: Samsung Electronics Co. Ltd.
• Inventors: Cinar, Yusuf
• Primary Examiner(s): Lottich, Joshua P
• Application Number:
  US15/706,923
• Publication Number:
  US 20180173602A1
• Time in Patent Office: Days
• CPC Class Codes: G06F 11/008 Reliability or availability analysis
• CPC Class Codes: G06F 11/2205 using arrangements specific to the hardware being tested
• CPC Class Codes: G06F 11/24 Marginal checking or other specified testing methods not covered by G06F11/26, e.g. race tests
• CPC Class Codes: G06F 11/3034 where the computing system component is a storage system, e.g. DASD based or network based digital input from or digital output to record carriers G06F3/06; digital recording or reproducing G11B20/18; for distributed storage of data in networks, e.g. transport arrangements for network file system [NFS], storage area networks [SAN] or network attached storage [NAS], H04L67/1097
• CPC Class Codes: G06F 11/3058 Monitoring arrangements for monitoring environmental properties or parameters of the computing system or of the computing system component, e.g. monitoring of power, currents, temperature, humidity, position, vibrations thermal management in cooling arrangements of a computing system G06F1/206
• CPC Class Codes: G06F 11/34 Recording or statistical evaluation of computer activity, e.g. of down time, of input/output operation ; Recording or statistical evaluation of user activity, e.g. usability assessment
• CPC Class Codes: G06F 2201/81 Threshold

Abstract

A method for estimating the remaining life of a solid state drive (SSD) device includes generating a sensing value by periodically measuring an environmental variable, generating a load value associated with the SSD device based on the sensing value and a distance between the sensor and the SSD device, calculating stress applied to the SSD device based on the load value, calculating damage of the SSD device based on a stress-life curve and the stress, and determining the remaining life of the SSD device based on a difference between a threshold value and the damage. The stress-life curve may represent a relationship between the stress and life of the SSD device.

Claims

1. A method for estimating a remaining life of a solid state drive (SSD) device in a system which includes a sensor, the method comprising:

generating, by the sensor, a sensing value by periodically measuring an environmental variable;

generating, by the SSD device, a load value associated with the SSD device based on the sensing value and a distance between the sensor and the SSD device;

calculating, by the SSD device, stress applied to the SSD device based on the load value;

calculating, by the SSD device, damage of the SSD device based on a stress-life curve and the stress, the stress-life curve representing a relationship between the stress and life of the SSD device; and

determining, by the SSD device, the remaining life of the SSD device based on a difference between a threshold value and the damage.

2. The method as claimed in claim 1, wherein the environmental variable corresponds to at least one of temperature, humidity, pressure, acceleration, vibration, mechanical stress, shock, radiation, dust, or electrical stress.

3. The method as claimed in claim 1, wherein the sensor is inside the SSD device.

4. The method as claimed in claim 3, further comprising:

providing, by the SSD device, the sensing value as the load value without converting the sensing value.

5. The method as claimed in claim 1, wherein the sensor is outside the SSD device.

6. The method as claimed in claim 5, wherein:

generating, by the SSD device, the load value corresponding to the sensing value is based on a load curve, and

the load curve is based on the distance between the sensor and the SSD device.

7. The method as claimed in claim 1, wherein:

calculating, by the SSD device, the stress corresponding to the load value is based on a predefined load-stress conversion curve.

8. The method as claimed in claim 1, wherein:

calculating, by the SSD device, the damage corresponding to the stress is based on cumulative damage law.

9. The method as claimed in claim 1, wherein calculating the damage includes:

calculating a number of cycles for each of stress values for the stress, the stress being periodically generated and having one of the stress values;

obtaining, based on the stress-life curve, a maximum number of cycles for each of the stress values for the stress until an error occurs on the SSD device; and

obtaining the damage by calculating a sum of a plurality of division results, each of the division results being obtained by dividing the number of cycles for each of stress values by the maximum number of cycles for each of the stress values.

10. The method as claimed in claim 1, wherein:

determining, by the SSD device, the remaining life corresponding to the damage is based on a remaining life conversion curve,

the remaining life conversion curve represents a relationship between the remaining life and the difference between the threshold value and the damage.

11. The method as claimed in claim 1, further comprising:

calculating, by the SSD device, an increasing rate of the damage per unit time; and

generating, by the SSD device, a notification signal when the increasing rate of the damage per unit time is greater than a threshold increasing rate.

12. A method for estimating a remaining life of a solid state drive (SSD) device in a system which includes first through n-th sensors, where n is a positive integer greater than or equal to two, the method comprising:

generating, by the first through n-th sensors, first through n-th sensing values by periodically measuring first through n-th environmental variables;

generating, by the SSD device, first through n-th load values associated with the SSD device based on the first through n-th sensing values and distances between the first through n-th sensors and the SSD device;

calculating, by the SSD device, first through n-th stresses applied to the SSD device based on the first through n-th load values;

calculating, by the SSD device, damage of the SSD device based on first through n-th stress-life curves and the first through n-th stresses, each of the first through n-th stress-life curves representing a relationship between a respective one of the first through n-th stresses and life of the SSD device; and

determining, by the SSD device, the remaining life of the SSD device based on a difference between a threshold value and the damage.

13. The method as claimed in claim 12, wherein:

each of the first through n-th environmental variables correspond to at least one of temperature, humidity, pressure, acceleration, vibration, mechanical stress, shock, radiation, dust, or electrical stress.

14. The method as claimed in claim 12, wherein:

the first through k-th sensors are outside the SSD device, where k is a positive integer less than n,

the (k+1)-th through n-th sensors are inside the SSD device.

15. The method as claimed in claim 14, wherein:

the SSD device is to generate the first through k-th load values corresponding to the first through k-th sensing values based on first through k-th load curves,

each of the first through k-th load curves is defined based on the distance between a respective one of the first through k-th sensors and the SSD device,

the SSD device is to provide the (k+1)-th through n-th sensing values as the (k+1)-th through n-th load values without converting the (k+1)-th through n-th sensing values.

16. The method as claimed in claim 12, wherein calculating the damage includes:

calculating a number of cycles for each of stress values for a stress, the stress being periodically generated and having one of the stress values;

obtaining, based on one of the n-th stress-life curves, a maximum number of cycles for each of the stress values for the stress until an error occurs on the SSD device;

obtaining a sub-damage by calculating a sum of a plurality of division results, each of the division results being obtained by dividing the number of cycles for each of stress values by the maximum number of cycles for each of the stress values; and

obtaining the damage by calculating a sum of first through n-th sub-damages.

17. A method for estimating a remaining life of a solid state drive (SSD) device in a system which includes a sensor, the SSD device including first through m-th components, where m is a positive integer greater than or equal to two, the method comprising:

generating, by the sensor, a sensing value by periodically measuring an environmental variable;

generating, by the SSD device, a load value associated with the SSD device based on the sensing value and a distance between the sensor and the SSD device;

calculating, by the SSD device, first through m-th stresses applied to the first through m-th components based on the load value;

calculating, by the SSD device, first through m-th damages of the first through m-th components based on first through m-th stress-life curves and the first through m-th stresses, each of the first through m-th stress-life curves representing a relationship between a respective one of the first through m-th stresses and life of the SSD device;

determining, by the SSD device, first through m-th candidate remaining lives of the SSD device based on differences between first through m-th threshold values and the first through m-th damages; and

determining, by the SSD device, a minimum remaining life among the first through m-th candidate remaining lives as the remaining life of the SSD device.

18. The method as claimed in claim 17, wherein each of the first through m-th components corresponds to at least one of a semiconductor package, a semiconductor chip, a solder joint, a printed circuit board, or solder.

19. The method as claimed in claim 17, wherein:

calculating, by the SSD device, the first through m-th stresses corresponding to the load value is based on predefined first through m-th load-stress conversion curves,

each of the first through m-th load-stress conversion curves correspond to a respective one of the first through m-th components.

20. The method as claimed in claim 17, wherein:

the SSD device is to determine the first through m-th candidate remaining lives corresponding to the first through m-th damages based on first through m-th remaining life conversion curves, and

each of the first through m-th remaining life conversion curves represents a relationship between the remaining life and the difference between a respective one of the first through m-th threshold values and a respective one of the first through m-th damages.