Closed loop feedback control of integrated circuits
First Claim
Patent Images
1. A method, comprising:
- adjusting a body bias voltage applied to a body of an integrated circuit to cause a measured value of an operating indicator of the integrated circuit to approach a desired value of the operating indicator;
wherein the body is electrically isolated from one or more electrical components disposed within the body.
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Accused Products
Abstract
Systems and methods for closed loop feedback control of integrated circuits. In one embodiment, a plurality of controllable inputs to an integrated circuit is adjusted to achieve a predetermined value of a dynamic operating indicator of the integrated circuit. An operating condition of an integrated circuit is controlled via closed loop feedback based on dynamic operating indicators of the integrated circuit'"'"'s behavior.
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Citations
20 Claims
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1. A method, comprising:
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adjusting a body bias voltage applied to a body of an integrated circuit to cause a measured value of an operating indicator of the integrated circuit to approach a desired value of the operating indicator; wherein the body is electrically isolated from one or more electrical components disposed within the body. - View Dependent Claims (2, 3, 4, 5, 11)
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6. An integrated circuit comprising:
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circuitry configured to adjust a controllable input to the integrated circuit to cause a measured value of a characteristic of the integrated circuit to approach a desired value of the characteristic; wherein the controllable input includes a body bias voltage applied to a body of the integrated circuit; and wherein the body is electrically isolated from one or more electrical components disposed within the body. - View Dependent Claims (7, 8, 9, 10)
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12. An article of manufacture including a computer readable medium having instructions stored thereon that, if executed by a computing device, cause the computing device to perform operations comprising:
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adjusting a controllable input of an integrated circuit to cause a measured value of an operating indicator of the integrated circuit to approach a desired value of the operating indicator; wherein the controllable input includes a body bias voltage applied to a body of the integrated circuit; and wherein the body is configured to have a bias relative to one or more electrical components disposed within the body. - View Dependent Claims (13, 14, 15, 16)
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17. A method, comprising:
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adjusting a controllable input of an integrated circuit to cause a measured value of an operating indicator of the integrated circuit to approach a desired value of the operating indicator; wherein the operating indicator comprises a ring oscillator.
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18. An integrated circuit, comprising:
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circuitry configured to adjust a controllable input to the integrated circuit to cause a measured value of a characteristic of the integrated circuit to approach a desired value of the characteristic; wherein the controllable input includes a body bias voltage applied to a body of the integrated circuit; wherein the body is electrically isolated from a source terminal of a field effect transistor in the body; and wherein the characteristic corresponds to a gate delay of the integrated circuit.
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19. An integrated circuit, comprising:
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circuitry configured to adjust a controllable input to the integrated circuit to cause a measured value of a characteristic of the integrated circuit to approach a desired value of the characteristic; wherein the controllable input includes a body bias voltage applied to a body of the integrated circuit; wherein the body is electrically isolated from a source terminal of a field effect transistor in the body; and wherein the characteristic corresponds to a leakage current of the integrated circuit.
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20. An integrated circuit, comprising:
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circuitry configured to adjust a controllable input to the integrated circuit to cause a measured value of a characteristic of the integrated circuit to approach a desired value of the characteristic; wherein the controllable input includes a body bias voltage applied to a body of the integrated circuit; wherein the body is electrically isolated from a source terminal of a field effect transistor in the body; and wherein the characteristic corresponds to only one type of device from the set of P-FETs and N-FETs.
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Specification