Method of calibrating impedance measurements of a battery
First Claim
Patent Images
1. A method, comprising:
- performing a shunt measurement with one non-inductive shunt value using an excitation signal including a root mean squared current and a frequency range;
capturing a response time record of said one non-inductive shunt under test;
transforming said response time record to a frequency domain;
normalizing said response time record transformed to said frequency domain to said one non-inductive shunt value; and
recording said response time record transformed to said frequency domain and normalized to said non-inductive shunt value as a calibration record;
exciting a device under test using said excitation signal including said at least one RMS current level and said frequency range;
capturing a response time record of said device under test;
transforming said time record of said device under test to said frequency domain;
applying said calibration record to said response time record of said device under test; and
generating a measurement of said device under test.
4 Assignments
0 Petitions
Accused Products
Abstract
A method of calibration is described that simplifies the measurement of battery impedance conducted in-situ while determining battery state-of-health. A single shunt measurement with a known Sum of Sines (SOS) current, at the desired frequency spread and known root mean squared (RMS) current is used to create a calibration archive. A calibration selected from this archive is used to calibrate an impedance measurement made on the battery.
-
Citations
8 Claims
-
1. A method, comprising:
-
performing a shunt measurement with one non-inductive shunt value using an excitation signal including a root mean squared current and a frequency range; capturing a response time record of said one non-inductive shunt under test; transforming said response time record to a frequency domain; normalizing said response time record transformed to said frequency domain to said one non-inductive shunt value; and recording said response time record transformed to said frequency domain and normalized to said non-inductive shunt value as a calibration record; exciting a device under test using said excitation signal including said at least one RMS current level and said frequency range; capturing a response time record of said device under test; transforming said time record of said device under test to said frequency domain; applying said calibration record to said response time record of said device under test; and generating a measurement of said device under test. - View Dependent Claims (2, 3, 4, 5, 6, 7, 8)
-
Specification