System and method for multi-parameter spectroscopy

• US 10,444,148 B2
• Filed: 12/20/2018
• Issued: 10/15/2019
• Est. Priority Date: 10/05/2015
• Status: Active Grant

• Current Assignee: Nxgen Partners Ip, LLC (NxGen Partners LLC)
• Original Assignee: Nxgen Partners Ip, LLC (NxGen Partners LLC)
• Inventors: Ashrafi, Solyman
• Primary Examiner(s): Ahmed, Jamil
• Application Number:
  US16/226,799
• Publication Number:
  US 20190128808A1
• Time in Patent Office: 299 Days
• CPC Class Codes: A61B 2503/42 for laboratory research
• CPC Class Codes: A61B 5/0075 by spectroscopy, i.e. measuring spectra, e.g. Raman spectroscopy, infrared absorption spectroscopy A61B5/0071 takes precedence
• CPC Class Codes: G01N 21/21 Polarisation-affecting properties G01N21/19 takes precedence
• CPC Class Codes: G01N 21/3581 using far infrared light; using Terahertz radiation
• CPC Class Codes: G01N 21/59 Transmissivity G01N21/25 takes precedence
• CPC Class Codes: G01N 21/636 using an arrangement of pump beam and probe beam; using the measurement of optical non-linear properties; non-linear optics per se G02F1/35
• CPC Class Codes: G01N 21/6486 Measuring fluorescence of biological material, e.g. DNA, RNA, cells G01N21/6428 takes precedence
• CPC Class Codes: G01N 21/65 Raman scattering
• CPC Class Codes: G01N 2201/0675 SLM
• CPC Class Codes: G01N 2333/4709 Amyloid plaque core protein
• CPC Class Codes: G01N 2800/2821 Alzheimer
• CPC Class Codes: G01N 33/483 Physical analysis of biological material
• CPC Class Codes: G01N 33/487 of liquid biological material
• CPC Class Codes: G01N 33/6896 Neurological disorders, e.g. Alzheimer's disease

Abstract

An apparatus for detecting a material within a sample includes a light emitting unit for directing at least one light beam through the sample. A plurality of units receive the light beam that has passed through the sample and performs a spectroscopic analysis of the sample based on the received light beam. Each of the plurality of units analyze a different parameter with respect to the sample and provide a separate output signal with respect to the analysis. A processor detects the material with respect each of the provided separate output signals.

Claims

1. An apparatus for detecting a material within a sample, comprising:

a light emitting unit for directing at least one light beam having an orbital angular momentum applied thereto through the sample, the at least one light beam having a unique signature combination associated therewith responsive to passing through the sample;

an OAM spectroscopic unit for receiving the at least one light beam that has passed though the sample and performing an orbital angular momentum (OAM) spectroscopic analysis to detect a first signature associated with the sample;

a Raman spectroscopic unit for receiving the at least one light beam that has passed through the sample and performing a Raman spectroscopic analysis to detect a second signature associated with the sample;

a database including a plurality of unique combinations of first and second, each of the plurality of unique combinations of the first signature and the second signature associated with a particular material; and

a processor for detecting the material within the sample responsive to a comparison of a unique combination of the first signature and the second signature detected by the OAM spectroscopic unit and the Raman spectroscopic unit with the plurality of unique combinations of first signature and second signature within the database and for determining of a matching unique combination of the first signature and the second signature within the database, wherein identification of the unique combination of the first signature and the second signature enables detection of the material not detectable using either the first signature or the second signature alone.

2. The apparatus of claim 1, further including:

a Rayleigh spectroscopic unit for receiving the at least one light beam that has passed through the sample and performing a Rayleigh spectroscopic analysis to detect a third signature associated with the sample;

wherein the database further includes a plurality of unique combinations of the first signature, the second signature and third signature, each of the plurality of unique combinations of the first signature, the second signature and the third signature associated with a particular material; and

wherein the processor detects the material within the sample responsive to a comparison of the unique combination of the first signature, the second signature and the third signature detected by the OAM spectroscopic unit, the Raman spectroscopic unit and the Rayleigh spectroscopic unit with the plurality of unique combinations of the first signature, the second signature and the third signature within the database and determines a matching unique combination of the first signature, the second signature and third signature within the database, wherein the identification of the unique combination of the first signature, the second signature and the third signature enables detection of the material not detectable using any of the first signature, the second signature or the third signature alone.

3. The apparatus of claim 1, wherein the first signature comprises a rotational signature caused by the material within the sample.

4. The apparatus of claim 2, wherein the second signature comprises a vibrational signature relating to molecular vibrations caused by the material within the sample.

5. The apparatus of claim 1, wherein the light emitting unit further applies an orbital angular momentum to the at least one light beam that is directed through the sample.

6. An apparatus for detecting a material within a sample, comprising:

a light emitting unit for directing at least one light beam having an orbital angular momentum applied thereto through the sample, the at least one light beam having a unique signature combination associated therewith responsive to passing through the sample;

a first Raman spectroscopic unit for receiving the at least one light beam that has passed through the sample and performing a first Raman spectroscopic analysis to detect a first signature associated with the sample;

a polarizer for polarizing the at least one light beam prior to passing through the sample;

a second Raman spectroscopic unit for receiving the polarized at least one light beam that has passed through the sample and performing a second Raman spectroscopic analysis to detect a second signature associated with the sample;

first circuitry for applying vortices to the at least one light beam prior to passing though the sample;

a third Raman spectroscopic unit for receiving the at least one light beam having vortices applied thereto that has passed through the sample and performing a third Raman spectroscopic analysis to detect a third signature associated with the sample;

a database including a plurality of unique combinations of first signature, second signature and third signature, each of the plurality of unique combinations of the first signature, the second signature and the third signature associated with a particular material; and

a processor for detecting the material within the sample responsive to a comparison of a unique combination of the first signature, the second signature and the third signature detected by the first Raman spectroscopic unit, the second Raman spectroscopic unit and the third Raman spectroscopic unit with the plurality of unique combinations of the first signature, the second signature and the third signature within the database and for determining a matching unique combination of the first signature, the second signature and the third signature within the database, wherein identification of the unique combination of the first signature, the second signature and the third signature enables detection of the material not detectable using any of the first signature, the second signature or the third signature alone.

7. The apparatus of claim 6 further comprising:

an OAM spectroscopic unit for receiving the at least one light beam that has passed though the sample and performing an orbital angular momentum (OAM) spectroscopic analysis to detect a fourth signature associated with the sample;

wherein the database further includes a plurality of unique combinations of first signature, second signature, third signature and fourth signature, each of the plurality of unique combinations of the first signature, the second signature, the third signature and fourth signature associated with a particular material; and

wherein the processor detects the material within the sample responsive to a comparison of the unique combination of the first signature, the second signature, the third signature and the fourth signature detected by the first Raman spectroscopic unit, the second Raman spectroscopic unit, the third Raman spectroscopic unit and the OAM spectroscopic unit with the plurality of unique combinations of the first signature, the second signature, the third signature and the fourth signature within the database and the determination of a matching unique combination of the first signature, the second signature, the third signature and the fourth signature within the database, wherein the identification of the unique combination of the first signature, the second signature, third signature and the fourth signature enables detection of the material not detectable using any of the first signature, the second signature, the third signature or the fourth signature alone.

8. The apparatus of claim 6, wherein the fourth signature comprises rotational signature caused by the material within the sample.

9. The apparatus of claim 6, wherein the first signature, the second signature, and the third signature comprises vibrational relating to molecular vibrations caused by the material within the sample.

10. The apparatus of claim 7, wherein the light emitting unit further applies an orbital angular momentum to the at least one light beam that is directed through the sample.

11. An apparatus for detecting a material within a sample, comprising:

a light emitting unit for directing at least one light beam having an orbital angular momentum applied thereto through the sample, the at least one light beam having a unique signature combination associated therewith responsive to passing through the sample;

a polarizer for polarizing the at least one light beam;

an first Raman spectroscopic unit for receiving the polarized at least one light beam that has passed though the sample and performing a first Raman spectroscopic analysis to detect a first signature associated with the sample;

a second Raman spectroscopic unit for receiving the at least one light beam that has passed through the sample and performing a second Raman spectroscopic analysis to detect a second signature associated with the sample;

a database including a plurality of unique combinations of the first signature and the second signature, each of the plurality of unique combinations of the first signature and the second signature associated with a particular material; and

a processor for detecting the material within the sample responsive to a comparison of a unique combination of the first signature and the second signature detected by the first Raman spectroscopic unit and the second Raman spectroscopic unit with the plurality of unique combinations of the first signature and the second signature within the database and for determining of a matching unique combination of the first signature and the second signature within the database, wherein identification of the unique combination of the first signature and the second signature enables detection of the material not detectable using either the first signature or the second signature alone.

12. The apparatus of claim 11, wherein the first signature and the second signature comprise vibrational relating to molecular vibrations caused by the material within the sample.

13. The apparatus of claim 11 further comprising:

an OAM spectroscopic unit for receiving the at least one light beam that has passed though the sample and performing an orbital angular momentum (OAM) spectroscopic analysis to detect a fourth signature associated with the sample;

wherein the database further includes a plurality of unique combinations of the first signature, the second signature and third signature, each of the plurality of unique combinations of the first signature, the second signature and the third signature associated with a particular material; and

wherein the processor detects the material within the sample responsive to a comparison of the unique combination of the first signature, the second signature and the third signature detected by the first Raman spectroscopic unit, the second Raman spectroscopic unit and the OAM spectroscopic unit with the plurality of unique combinations of the first signature, the second signature and the third signature within the database and determining of a matching unique combination of the first signature, the second signature and third signature within the database, wherein the identification of the unique combination of the first signature, the second signature and the third signature enables detection of the material not detectable using any of the first signature, the second signature or the third signature alone.

14. The apparatus of claim 13, wherein the light emitting unit further applies an orbital angular momentum to the at least one light beam that is directed through the sample.

15. An apparatus for detecting a material within a sample, comprising:

a light emitting unit for directing at least one light beam having an orbital angular momentum applied thereto through the sample, the at least one light beam having a unique signature combination associated therewith responsive to passing through the sample;

an Ince-Gaussian spectroscopic unit for receiving the at least one light beam that has passed though the sample and performing an Ince-Gaussian spectroscopic analysis to detect a first signature associated with the sample;

a second spectroscopic unit for receiving the at least one light beam that has passed through the sample and performing a second spectroscopic analysis to detect a second signature associated with the sample;

a database including a plurality of unique combinations of first signature and second signature, each of the plurality of unique combinations of the first signature and the second signature associated with a particular material; and

a processor for detecting the material within the sample responsive to a comparison of a unique combination of the first signature and the second signature detected by the Ince-Gaussian spectroscopic unit and the second spectroscopic unit with the plurality of unique combinations of the first signature and the second signature within the database and for determining of a matching unique combination of the first signature and the second signature within the database, wherein identification of the unique combination of the first signature and the second signature enables detection of the material not detectable using either the first signature or the second signature alone.

16. The apparatus of claim 15, wherein the second spectroscopic unit comprises at least one of a Raman spectroscopic unit for performing Raman spectroscopic analysis, a Rayleigh spectroscopic unit for performing Rayleigh spectroscopic analysis, and infrared spectroscopic unit for performing infrared spectroscopic analysis, a spontaneous Raman spectroscopic unit for performing spontaneous Raman spectroscopic analysis, a simulated Raman spectroscopic unit for performing simulated Raman spectroscopic analysis, a resonance Raman spectroscopic unit for performing resonance Raman spectroscopic analysis, polarized Ramen spectroscopic unit for performing polarized Raman spectroscopic analysis, a fluorescence spectroscopic unit for performing fluorescence spectroscopic analysis, pump-probe spectroscopic unit for performing pump-probe spectroscopic analysis, and a terahertz spectroscopic unit for performing terahertz spectroscopic analysis.

17. The apparatus of claim 15, wherein the first signature comprises a rotational signature caused by the material within the sample.

18. The apparatus of claim 17, wherein the second signature comprises a vibrational signature relating to molecular vibrations caused by the material within the sample.

19. The apparatus of claim 15, wherein the light emitting unit further applies an orbital angular momentum to the at least one light beam that is directed through the sample.