Spectrum measurement apparatus and spectrum measurement method
First Claim
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1. A spectrum measurement apparatus comprising:
- a plurality of light sources configured to emit light having different wavelengths to an object;
a light detector configured to receive light, which is reflected or scattered from or transmitted through the object, and to measure an intensity of the received light; and
a processor configured to determine a strength of an electric signal to be applied to at least one of the plurality of light sources by using one of the plurality of light sources, and to obtain a spectrum of the object by applying the electric signal having the determined strength to the at least one of the plurality of light sources,wherein the processor is further configured to select a light source, having a largest amount of light, among the plurality of light sources, and to determine the strength of the electric signal to be applied to the at least one of the plurality of light sources by using the selected light source.
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Abstract
A spectrum measurement apparatus includes: a plurality of light sources configured to emit light having different wavelengths to an object; a light detector configured to receive light, which is reflected or scattered from or transmitted through the object, and to measure an intensity of the received light; and a processor configured to determine a strength of an electric signal to be applied to at least one of the plurality of light sources by using one of the plurality of light sources, and by applying the electric signal having the determined strength to the plurality of light sources to obtain a spectrum of the object.
21 Citations
14 Claims
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1. A spectrum measurement apparatus comprising:
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a plurality of light sources configured to emit light having different wavelengths to an object; a light detector configured to receive light, which is reflected or scattered from or transmitted through the object, and to measure an intensity of the received light; and a processor configured to determine a strength of an electric signal to be applied to at least one of the plurality of light sources by using one of the plurality of light sources, and to obtain a spectrum of the object by applying the electric signal having the determined strength to the at least one of the plurality of light sources, wherein the processor is further configured to select a light source, having a largest amount of light, among the plurality of light sources, and to determine the strength of the electric signal to be applied to the at least one of the plurality of light sources by using the selected light source. - View Dependent Claims (2, 3, 4, 5, 6, 7)
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8. A spectrum measurement method of a spectrum measurement apparatus comprising a plurality of light sources and a light detector, the spectrum measurement method comprising:
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determining a strength of an electric signal to be applied to at least one of the plurality of light sources by using one of the plurality of light sources; and obtaining a spectrum of an object by applying the electric signal having the determined strength to the at least one of the plurality of light sources, wherein the determining the strength of the electric signal to be applied to the at least one of the plurality of sources comprises selecting a light source, having a largest amount of light, among the plurality of light sources, and determining the strength of the electric signal to be applied to the at least one of the plurality of light sources by using the selected light source. - View Dependent Claims (9, 10, 11, 12, 13)
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14. A composition analysis apparatus comprising:
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a spectrum measurer configured to obtain a spectrum of an object; and a first processor configured to analyze the spectrum of the object to analyze a composition of the object, wherein the spectrum measurer comprises; a plurality of light sources configured to emit light having different wavelengths to the object; a light detector configured to receive light, which is reflected or scattered from or transmitted through the object, and to measure an intensity of the received light; and a second processor configured to determine a strength of an electric signal to be applied to at least one of the plurality of light sources by using one of the plurality of light sources, and to obtain the spectrum of the object by applying the electric signal having the determined strength to the at least one of the plurality of light sources, wherein the second processor is further configured to select a light source, having a largest amount of light, among the plurality of light sources, and to determine the strength of the electric signal to be applied to the at least one of the plurality of light sources by using the selected light source.
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Specification