Diagnostic circuit test device

• US 10,444,285 B2
• Filed: 08/27/2018
• Issued: 10/15/2019
• Est. Priority Date: 12/03/2014
• Status: Active Grant

• Current Assignee: Power Probe Group Incorporated
• Original Assignee: Power Probe Tek, LLC
• Inventors: Barden, David, Carton, Joshua, Russell, Wayne
• Primary Examiner(s): Le, Thang X
• Application Number:
  US16/113,324
• Publication Number:
  US 20190011501A1
• Time in Patent Office: 414 Days
• CPC Class Codes: G01R 1/04 Housings; Supporting members; Arrangements of terminals
• CPC Class Codes: G01R 1/06788 Hand-held or hand-manipulated probes, e.g. for oscilloscopes or for portable test instruments end pieces terminating in a probe H01R11/18
• CPC Class Codes: G01R 15/125 for digital multimeters
• CPC Class Codes: G01R 31/3278 of relays, solenoids or reed switches measuring contact resistance G01R27/205; high voltage magnetic switches G01R31/3271, G01R31/333; testing electric windings G01R31/72; monitoring of fail safe circuits H01H47/002
• CPC Class Codes: G01R 31/44 Testing lamps
• CPC Class Codes: G01R 31/54 Testing for continuity

Abstract

An apparatus is provided for a diagnostic circuit test device having multi-meter functionality and being adapted to provide current sourcing to an electrical system for selective measurement of a plurality of parameters thereof in powered and unpowered states. The diagnostic circuit test device comprises a conductive probe element configured to be placed into contact with the electrical system and provide an input signal thereto. A power supply is interconnected between an internal power source and the conductive probe element. Processors are electrically connected to the conductive probe element and configured to manipulate the input signal provided to the electrical system and receive an output signal in response to the input signal. The output signal is representative of at least one of the parameters of the electrical system. A display device is configured to display a reading of the output signal which is representative of the parameter.

Claims

1. A diagnostic circuit test device having multi-meter functionality and being adapted to provide current sourcing to an electrical system for selective measurement of a plurality of parameters thereof in at least one of powered and unpowered states, the diagnostic circuit test device comprising:

a removable conductive probe element configured to be placed into contact with the electrical system and provide an input signal thereto, wherein various electrical testing accessories may be substituted for the conductive probe element via a probe jack;

a power supply interconnected between rechargeable internal power source and the conductive probe element, wherein circuitry suitable for charging the internal battery is interconnected between a charging port and the internal power source, the internal battery capable of being charged via a USB interface;

one or more processors electrically connected to the conductive probe element and configured to manipulate the input signal provided to the electrical system and receive an output signal in response to the input signal, the output signal being representative of at least one of the parameters of the electrical system;

a housing, comprising a shell that includes a relay test port;

a display device electrically connected to the one or more processors and configured to display a reading of the output signal, the reading being representative of the at least one of the parameters of the electrical system;

wherein the diagnostic circuit test device is configured to operate as a dual continuity tester, a load impedance detector, and a power output driver with over current protection; and

a speaker driver coupled to a speaker that is configured to handle the conversion of signals from the one or more processors to operate the speaker.

2. The diagnostic circuit test device of claim 1, wherein the diagnostic circuit test device is configured to be switchable between one of an active mode and a passive mode, the active mode defined by measurement of the parameters during powering of the electrical system, and the passive mode defined by measurement of the parameters without powering the electrical system.

3. The diagnostic circuit test device of claim 1, wherein the one or more processors are configured to cause a piezo element to generate an audible tone during measurement of at least one of the parameters.

4. The diagnostic circuit test device of claim 1, further comprising a pair of power leads and a ground lead, the power leads being configured to connect the test device to an external power source, and the ground lead being configured to connect to an electrical ground source.

5. The diagnostic circuit test device of claim 1, further comprising a keypad configured to allow for switching between measurement modes of the parameters.

6. The diagnostic circuit test device of claim 1, wherein the parameters measurable by the test device include at least one of circuit continuity, resistance, voltage, current, load impedance, and frequency.

7. The diagnostic circuit test device of claim 1, further comprising at least one signal lamp connected to the one or more processors and configured to illuminate in response to a continuity measurement.

8. The diagnostic circuit test device of claim 7, wherein the at least one signal lamp comprises at least one light emitting diode (LED).

9. The diagnostic circuit test device of claim 1, further comprising at least one illumination lamp connected to the one or more processors and configured to illuminate an area near the conductive probe element.

10. The diagnostic circuit test device of claim 9, wherein the at least one illumination lamp comprises at least one light emitting diode (LED).

11. The diagnostic circuit test device of claim 1, wherein the one or more processors are configured to cause a periodic energizing of the conductive probe element for powering the electrical system at predetermined intervals for testing a relay switch.

12. The diagnostic circuit test device of claim 1, further comprising a keypad configured to allow for switching between measurements of the parameters.

13. The diagnostic circuit test device of claim 1, wherein the diagnostic circuit test device is configured to enable selective powering of the electrical system upon energizing of the conductive probe element during measurement of the parameters, and the one or more processors are configured to cause periodic energizing of the conductive probe element for powering the electrical system at predetermined intervals for testing an electro-mechanical device.

14. The diagnostic circuit test device of claim 13, wherein the electro-mechanical device is a relay switch.

15. The diagnostic circuit test device of claim 1, wherein the one or more processors are configured to cause a speaker and the display device to simultaneously and respectively generate an audible signal and display a reading of the output signal.