Method for configuring a tester equipped for testing a control unit

• US 10,444,745 B2
• Filed: 01/26/2017
• Issued: 10/15/2019
• Est. Priority Date: 01/26/2016
• Status: Active Grant

• Current Assignee: Dspace GmbH
• Original Assignee: Dspace Digital Signal Processing And Control Engineering Gmbh
• Inventors: Juhasz, Laszlo, Lakemeier, Jesse
• Primary Examiner(s): Louis, Andre Pierre
• Assistant Examiner(s): Ayoub, Faraj
• Application Number:
  US15/415,942
• Publication Number:
  US 20170212509A1
• Time in Patent Office: 992 Days
• Field of Search: 703 14
• CPC Class Codes: G01R 31/31908 Tester set-up, e.g. configuring the tester to the device under test [DUT], down loading test patterns
• CPC Class Codes: G05B 17/02 electric
• CPC Class Codes: G05B 2219/23446 HIL hardware in the loop, simulates equipment to which a control module is fixed
• CPC Class Codes: G05B 23/0243 model based detection method, e.g. first-principles knowledge model

Abstract

A method for automated configuration of a tester equipped for testing a control unit. A first and second model of technical systems being executed in the tester. The execution of the models taking place periodically with defined sampling rates. An FPGA executes the first and/or the second model and a CPU executes the first or the second model. A first individual sampling rate is allocated for the first model and a second individual sampling rate is allocated for the second model. The first model is assigned for execution on either the CPU or the FPGA and the second model is assigned for execution on either the CPU or the FPGA. The tester is automatically configured for execution of the first model with the first allocated sampling rate on the FPGA or the CPU and of the second model with the second allocated sampling rate on the FPGA or the CPU.

Claims

1. A method for automated configuration of a tester equipped for testing a control unit, the method comprising:

executing in the tester a first model of a technical system and a second model of the technical system, said executing the first model and the second model taking place periodically with defined sampling rates, the first model and the second model each representing a model of the technical system to be controlled or a model of a control unit under test, the first model and second model being present as source code in a high-level programming language;

providing in the tester an FPGA (Field Programmable Gate Array) for executing the first model and/or the second model and a CPU for executing the first model or the second model;

connecting the control unit under test to the tester during said executing the first model and the second model and a data exchange takes place between the control unit and/or the first model and/or the second model;

allocating a first individual sampling rate for the first model and allocating a second individual sampling rate for the second model;

automatically assigning the first model for execution on either the CPU or the FPGA based on a rule and automatically assigning the second model for execution on either the CPU or the FPGA based on the rule; and

configuring the tester for execution of the first model with the first allocated sampling rate on the FPGA or the CPU and of the second model with the second allocated sampling rate on the FPGA or the CPU.

2. The method according to claim 1, wherein said configuring the tester includes:

generating at least one netlist from the first model and/or the second model if execution on the FPGA was assigned to the first and/or the second model;

generating communication interfaces to permit the data exchange between the first model, the second model, and/or the control unit;

configuring at least one partition of the FPGA by the at least one netlist and the communication interfaces; and

configuring a multiple clock rate component on the FPGA to provide at least one individual clock rate signal for execution of the first model and/or the second model on the FPGA at the first individual sampling rate and/or second individual sampling rate.

3. The method according to claim 2, wherein said configuring the tester includes:

generating machine language source code from the first model and/or the second model if execution on the CPU was assigned to the first model and/or the second model; and

linking a generated machine language source code to a configured FPGA via the generated communication interfaces.

4. The method according to claim 1, wherein said automatically assigning the first model and the second model takes place with the first allocated sampling rate and the second allocated sampling rate being taken into account.

5. The method according to claim 1, wherein a complexity of the first model and the second model and/or free computing capacity on the CPU and/or the FPGA are taken into account during the assignment of the models.

6. The method according to claim 1, wherein the high-level programming language is a graphical programming language.

7. The method according to claim 2, wherein said generating the at least one netlist includes an intermediate step of generating a hardware description language.

8. The method according to claim 1, wherein the tester is a hardware-in-the-loop simulator or a rapid control prototyping system.

9. The method according to claim 1, wherein the tester has an input/output interface for connecting the control unit to the tester.

10. The method according to claim 2, wherein said configuring the tester and said allocating the first individual sampling rate and the second individual sampling rate are done via an RCP/HIL hybrid configuration device, wherein the RCP/HIL hybrid configuration device is constituted such that it has a first serial arrangement of configuration elements for configuring an input/output interface and a second serial arrangement of configuration elements for configuring interfaces of the first and the second model, the configuration elements being assigned to one another, and the communication interfaces being generated while taking into account the configuration elements that are assigned to one another.

11. The method according to claim 1, wherein the rule comprises a performance level of the CPU or the FPGA.

12. The method according to claim 1, wherein the rule comprises determining a length of time required for said executing the first model or the second model in the CPU or the FPGA.

13. The method according to claim 1, wherein said automatically assigning the first model and the second model to the CPU or the FPGA comprises analyzing a complexity of the first model and the second model by determining whether a fixed-point arithmetic operation or a floating point arithmetic operation can be performed on the first model and the second model.

14. The method according to claim 1, wherein the FPGA or the CPU is externally connected to the tester in a form of an embedded system or a plug-in card.

15. The method according to claim 1, further comprising simultaneously executing the first model and the second model of the technical system on the FPGA.

16. The method according to claim 1, further comprising executing sub-models of the technical system with different sampling rates on the FPGA.

17. The method according to claim 1, wherein the multiple clock component enables debugging functions.

18. A tester for testing a control unit, the tester comprising:

a first model of a technical system;

a second model of the technical system, the first and second models being executed in the tester, said executing the first model and the second model being performed periodically with defined sampling rates, the first model and the second model each representing a model of the technical system to be controlled or a model of a control unit under test, the first model and the second model being source code in a high-level programming language;

an FPGA (Field Programmable Gate Array) for executing the first and/or the second model; and

a CPU for executing the first and/or the second model,

wherein the tester is configured to connect the control unit under test to the tester during execution of the first model and the second model and configured for a data exchange between the control unit and/or the first model and/or the second model, and

wherein the tester is configured to execute a method comprising;

executing in the tester the first model of a technical system and the second model of the technical system, said executing the first model and the second model taking place periodically with the defined sampling rates;

providing in the tester the FPGA for executing the first model and/or the second model and the CPU for executing the first model or the second model;

connecting the control unit under test to the tester during said executing the first model and the second model and the data exchange takes place between the control unit and/or the first model and/or the second model;

allocating a first individual sampling rate for the first model and allocating a second individual sampling rate for the second model;

automatically assigning the first model for execution on either the CPU or the FPGA based on a rule and automatically assigning the second model for execution on either the CPU or the FPGA based on the rule; and

configuring the tester for execution of the first model with the first allocated sampling rate on the FPGA or the CPU and of the second model with the second allocated sampling rate on the FPGA or the CPU.

19. A method for automated configuration of a tester equipped for testing a control unit, the method comprising:

executing a first model of a technical system and a second model of the technical system in the tester, said executing the first model or the second model being performed periodically with defined sampling rates, the first model and the second model each representing a model of the technical system to be controlled or a model of a control unit under test, the first model and the second model being source code in a high-level programming language;

providing an FPGA (Field Programmable Gate Array) in the tester for executing the first model and the second model;

automatically assigning the first model and the second model on the FPGA based on a rule;

connecting the control unit under test to the tester during said executing the first model and the second model such that a data exchange takes place between the control unit and/or the first model and/or the second model;

allocating a first individual sampling rate for the first model;

allocating a second individual sampling rate for the second model;

configuring the tester for execution of the first model with the first allocated sampling rate and the second model with the second allocated sampling rate on the FPGA;

generating at least one netlist from the first model and the second model;

generating communication interfaces to permit data exchange between the first model, the second model, and/or the control unit;

configuring a first partition and a second partition of the FPGA by the at least one netlist and the communication interfaces; and

configuring a multiple clock rate component on the FPGA to provide at least one of a first individual clock rate signal for execution of the first model with the first individual sampling rate and of a second individual clock rate signal for execution of the second model on the FPGA with the second individual sampling rate.

20. A method for automated configuration of a tester equipped for testing a control unit, the method comprising:

executing a first model of a technical system and a second model of the technical system in the tester, said executing the first model and the second model being performed periodically with defined sampling rates, the first model and the second model each representing a model of the technical system to be controlled or a model of a control unit under test, the first model and the second model being source code in a high-level programming language;

providing in the tester a first FPGA (Field Programmable Gate Array) and a second FPGA for said executing the first and/or the second model;

connecting the control unit under test to the tester during said executing the first model and the second model such that a data exchange takes place between the control unit and/or the first model and/or the second model;

allocating a first individual sampling rate for the first model;

allocating a second individual sampling rate for the second model;

automatically assigning the first model for execution on either the first FPGA or the second FPGA based on a rule;

assigning the second model for execution on either the first FPGA or the second FPGA with the allocated sampling rates being taken into account; and

configuring the tester for execution of the first model with the first allocated sampling rate and of the second model with the second allocated sampling rate.