Force sensing

• US 10,444,887 B2
• Filed: 06/29/2017
• Issued: 10/15/2019
• Est. Priority Date: 09/20/2016
• Status: Active Grant

• Current Assignee: Cypress Semiconductor Corporation (Infineon Technologies AG)
• Original Assignee: Cypress Semiconductor Corporation (Infineon Technologies AG)
• Inventors: Kravets, Igor, Kolych, Igor, Hoshtanar, Oleksandr, Weber, Jens, Karpin, Oleksandr
• Primary Examiner(s): Lu, William
• Application Number:
  US15/636,986
• Publication Number:
  US 20180081479A1
• Time in Patent Office: 838 Days
• CPC Class Codes: G01L 1/142 using capacitors
• CPC Class Codes: G06F 1/1637 Details related to the display arrangement, including those related to the mounting of the display in the housing
• CPC Class Codes: G06F 2203/04105 Pressure sensors for measuring the pressure or force exerted on the touch surface without providing the touch position
• CPC Class Codes: G06F 2203/04111 Cross over in capacitive digitiser, i.e. details of structures for connecting electrodes of the sensing pattern where the connections cross each other, e.g. bridge structures comprising an insulating layer, or vias through substrate
• CPC Class Codes: G06F 3/016 Input arrangements with force or tactile feedback as computer generated output to the user
• CPC Class Codes: G06F 3/04166 Details of scanning methods, e.g. sampling time, grouping of sub areas or time sharing with display driving Synchronisation with the driving of the display or the backlighting unit to avoid interferences generated internally G06F3/04184
• CPC Class Codes: G06F 3/044 by capacitive means

Abstract

An apparatus including a first signal generator of a force sensing circuit to output a first excitation (TX) signal on a first terminal and a second TX signal on a second terminal. The first terminal and the second terminal are configured to couple to a first force sensor and a reference sensor. The apparatus includes a first receiver channel coupled to a third terminal and a fourth terminal. The third terminal is configured to couple to the first force sensor and the fourth terminal is configured to couple to the reference sensor. The force sensing circuit is configured to measure a first receive (RX) signal from the first force sensor via the third terminal and a second RX signal from the reference sensor via the fourth terminal. The force sensing circuit is configured to measure a force value indicative of a force applied to the first force sensor.

Claims

1. An apparatus comprising:

a first signal generator of a force sensing circuit to output a first excitation (TX) signal on a first terminal and a second TX signal on a second terminal, wherein the first terminal and the second terminal are configured to couple to a first force sensor and a reference sensor, wherein the first force sensor is subject to deformation by a touch object, and wherein the reference sensor is not subject to deformation by the touch object; and

a first receiver channel of the force sensing circuit coupled to a third terminal and a fourth terminal, wherein the third terminal is configured to couple to the first force sensor and the fourth terminal is configured to couple to the reference sensor, wherein the force sensing circuit is configured to measure a first receive (RX) signal from the first force sensor via the third terminal and a second RX signal from the reference sensor via the fourth terminal, wherein the force sensing circuit is configured to measure a force value indicative of a force applied by the touch object to the first force sensor by using the second RX signal to remove noise from the first RX signal caused by vibration of the apparatus.

2. The apparatus of claim 1, wherein the force sensing circuit comprises:

a multiplexer coupled to the third terminal and the fourth terminal;

a second signal generator to output a third TX signal on a fifth terminal and a fourth TX signal on a sixth terminal, wherein the fifth terminal and the sixth terminal are configured to couple to a second force sensor and the reference sensor; and

a second receiver channel coupled to the multiplexer, wherein the multiplexer is coupled to a seventh terminal, wherein the second force sensing circuit is configured to measure a third RX signal from the second force sensor via the seventh terminal and the second RX signal from the reference sensor via the fourth terminal, wherein the second force sensing circuit is configured to measure a second force value indicative of the force applied to the second force sensor using the second RX signal and the third RX signal.

3. The apparatus of claim 1, wherein the force sensing circuit comprises:

a second signal generator to output a third TX signal on a fifth terminal and fourth TX signal on a sixth terminal, wherein the fifth terminal and the sixth terminal are configured to couple to a second force sensor and a second reference sensor; and

a second receiver channel coupled to a seventh terminal and an eighth terminal, wherein the second force sensing circuit is configured to measure a third RX signal from the second force sensor via the seventh terminal and a fourth RX signal from the second reference sensor via the eighth terminal, wherein the second force sensing circuit is configured to measure a second force value indicative of the force applied to the second force sensor using the third RX signal and the fourth RX signal.

4. The apparatus of claim 1, wherein the force sensing circuit comprises:

the first signal generator to output a third TX signal on a fifth terminal and fourth TX signal on a sixth terminal, wherein the fifth terminal and the sixth terminal are configured to couple to a second force sensor and a second reference sensor; and

a second receiver channel coupled to a seventh terminal and an eighth terminal, wherein the second force sensing circuit is configured to measure a third RX signal from the second force sensor via the seventh terminal and a fourth RX signal from the second reference sensor via the eighth terminal, wherein the second force sensing circuit is configured to measure a second force value indicative of the force applied to the second force sensor using the third RX signal and the fourth RX signal.

5. The apparatus of claim 1, further comprising:

a third signal generator to output a third TX signal on a ninth terminal, wherein the ninth terminal is configured to couple to a first sense unit; and

a capacitance measurement circuit coupled to a tenth terminal, wherein the capacitance measurement circuit is configured to measure a capacitance of the first sense unit via the ninth terminal, wherein the capacitance measurement circuit is configured to determine a location of the touch object using the capacitance of the first sense unit.

6. The apparatus of claim 5, wherein the first sense unit comprises a first electrode and a second electrode, wherein the capacitance is a mutual capacitance between the first electrode and the second electrode.

7. The apparatus of claim 5, further comprising a processing component coupled to a first output from the force sensing circuit and a second output from the capacitance measurement circuit, wherein the processing component is configured to correlate the force value indicative of the force to the location of the touch object.

8. The apparatus of claim 1, wherein the first signal generator comprises:

an alternating current (AC) power source coupled to the first terminal, the AC power source to generate the first TX signal; and

an inverter coupled to the AC power source and coupled to second terminal, the inverter to generate an inverted copy of the first TX signal as the second TX signal.

9. The apparatus of claim 1, wherein the force sensing circuit comprises an analog-to-digital converter (ADC) coupled to the first receiver channel.

10. The apparatus of claim 2, wherein the force sensing circuit comprises an analog-to-digital converter (ADC) coupled to an output of the first receiver channel and an output of the second receiver channel.

11. A method comprising:

generating a first excitation (TX) signal and a second TX signal;

measuring, by a force sensing circuit, a first capacitance of a first force sensor that is subject to deformation by a touch object;

measuring, by the force sensing circuit, a second capacitance of a reference sensor that is not subject to deformation by the touch object; and

determining a force applied by the touch object to the first force sensor by using the second capacitance to remove noise from the first capacitance caused by vibration.

12. The method of claim 11, wherein the second capacitance of the reference sensor is substantially similar to the first capacitance of the first force sensor at a steady state.

13. The method of claim 11, wherein a change in the first capacitance of the first force sensor corresponds to a change in distance between two electrodes of the first force sensor, the change in distance being indicative of the force applied to the first force sensor.

14. The method of claim 11, wherein change in the second capacitance of the reference sensor corresponds to vibrations in the reference sensor, and wherein the reference sensor is not subject to the force applied to the first force sensor.

15. A system comprising:

a force touch panel comprising a first force sensor and a reference sensor; and

a processing device operatively coupled to the force touch panel, the processing device comprising;

a first signal generator of a force sensing circuit to output a first excitation (TX) signal and a second TX signal, wherein the first TX signal is configured to couple to the first force sensor and the reference sensor, wherein the first force sensor is subject to a force applied to the force touch panel by a touch object and the reference sensor is not subject to the force applied to the force touch panel by the touch object; and

a first receiver channel of the force sensing circuit coupled to the first force sensor and the reference sensor, wherein the force sensing circuit is configured to measure a first receive (RX) signal from the first force sensor and a second RX signal from the reference sensor, wherein the force sensing circuit is configured to measure a force value indicative of the force applied by the touch object to the first force sensor by using the second RX signal to remove noise from the first RX signal caused by vibration of the system.

16. The system of claim 15, wherein the force sensing circuit comprises:

a multiplexer coupled to the first force sensor, the reference sensor and the force sensing circuit;

a second signal generator to output a third TX signal and a fourth TX signal, wherein the third TX signal is configured to couple to a second force sensor and the fourth TX signal is configured to couple to the reference sensor; and

a second force sensing circuit coupled to the multiplexer, wherein the second force sensing circuit is configured to measure a third RX signal from the second force sensor and the second RX signal from the reference sensor, wherein the second force sensing circuit is configured to measure a second force value indicative of the force applied to the second force sensor using the second RX signal and the third RX signal.

17. The system of claim 15, the processing device further comprising:

a second signal generator to output a third TX signal and a fourth TX signal, wherein the third TX signal is configured to couple to a second force sensor and the fourth TX signal is configured to couple to a second reference sensor; and

a second force sensing circuit coupled to the second force sensor and the second reference sensor, wherein the second force sensing circuit is configured to measure a third RX signal from the second force sensor and a fourth RX signal from the second reference sensor, wherein the second force sensing circuit is configured to measure a second force value indicative of the force applied to the second force sensor using the third RX signal and the fourth RX signal.

18. The system of claim 15, wherein the force touch panel has a plurality of electrodes to determine a location of the touch object on the force touch panel based on a change of capacitance received from the plurality of electrodes.

19. The system of claim 15, wherein the first force sensor comprises:

a first electrode disposed in a first plane; and

a second electrode disposed in a second plane, wherein the first electrode and the second electrode vary in capacitance between the first electrode and the second electrode in response to a change in distance between the first electrode and the second electrode caused by force applied to the first force sensor.

20. The system of claim 15, wherein the first force sensor comprises:

a first electrode disposed in a plane; and

a second electrode disposed in the plane, wherein the first electrode and the second electrode vary in capacitance between the first electrode and the second electrode in response to a change in distance between the first electrode and the second electrode caused by force applied to the first force sensor.

21. The system of claim 15, further comprising:

an alternating current (AC) power source coupled to the first force sensor and the reference sensor, the AC power source to generate the first TX signal; and

an inverter coupled to the AC power source, the first force sensor and the reference sensor, the inverter to generate an inverted copy of the first TX signal as the second TX signal.