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System and method of analyzing a curved surface

  • US 10,451,407 B2
  • Filed: 11/23/2015
  • Issued: 10/22/2019
  • Est. Priority Date: 11/23/2015
  • Status: Active Grant
First Claim
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1. A method of analyzing a curved surface of an object, said method implemented by a computing device including at least one processor in communication with at least one memory device, said method comprising:

  • scanning, by a light detection and ranging (LiDAR) device, the object to obtain a first data point set representative of vertical displacements of points along the curved surface from a reference axis along which the LiDAR device operates, wherein the reference axis is an axis in a Cartesian coordinate system such that the vertical displacements vary along the curved surface, and wherein scanning the object to obtain the first data point set further comprises scanning the object to obtain a three-dimensional point cloud representative of a distance between points along the curved surface and a reference plane;

    determining, by the computing device, outlier data points in the first data point set based on a noise level of the LiDAR device, wherein determining the outlier data points comprises;

    determining, for the first data point set, an initial fitted curve approximating a true curve of the curved surface, wherein determining the initial fitted curve comprises;

    applying a surface fitting function to a two-dimensional array of data points of the first data point set to create a buffer on boundaries of the array and compute a Fast Fourier transform;

    truncating frequency domain values resulting from the Fast Fourier transform using an elliptical mask, wherein the elliptical mask facilitates removing higher order Fourier coefficients such that the reference plane contains only low-frequency, smooth terms;

    determining an inverse Fast Fourier transform from the truncated frequency domain values; and

    generating a three-dimensional first fitted surface of the object based on the determined inverse Fast Fourier transform;

    computing respective differences between each data point of the first data point set and the initial fitted curve;

    determining a standard deviation of the respective differences; and

    identifying the outlier data points among the first data point set as data points corresponding to respective differences greater than the standard deviation;

    extracting, by the computing device, the outlier data points from the first data point set, leaving a second data point set;

    determining, by the computing device using a plurality of Fourier transform for the second data point set, a second fitted curve for the second data point set, wherein the second fitted curve approximates the true curve of the curved surface; and

    identifying, by the computing device, one or more anomalous portions of the object based on the second fitted curve and the second data point set, the one or more anomalous portions indicative of a potential defect in the curved surface of the object.

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